Two dimensional scaling of resistance in flux flow region in Tl₂Ba₂CaCu₂O₈ thin films

The resistance of $Tl_2Ba_2CaCu_2O_8$ thin films has been measured when the angle between the applied fields and $ab$-plane of the film is changed continuously at various temperatures. Under various magnetic fields, the resistance can be well scaled in terms of the c-axis component of the applied fields at the same temperature in the whole angle range. Meanwhile, we show that the measurement of resistance in this way is a complementary method to determine the growth orientation of the anisotropic high-$T_c$ superconductors.