Enhanced critical current density of YBa2Cu3Ox films grown on Nd1/3Eu1/3Gd1/3Ba2Cu3Ox with nano-undulated surface morphology

R. L. Meng (1) , T. H. Johansen (1 , 2) , I. A. Rusakova (1) , A. Baikalov (1) , D. Pham (1) , F. Chen (1) , Z. Y. Zuo (1)

show 17 more authors

C. W. Chu (1 3 4) ((1) Department of Physics TCSUH University of Houston Houston Texas (2) Department of Physics University of Oslo Oslo Norway (3) Lawrence Berkeley National Laboratory Berkeley California (4) Hong Kong University of Science Technology Hong Kong)

Authors on Pith no claims yet

classification ❄️ cond-mat.supr-con

keywords filmsdensityba2cu3oxcriticalcurrentenhancedmorphologynano-undulated

0 comments

read the original abstract

We report a simple and easily controllable method where a nano-undulated surface morphology of Nd1/3Eu1/3Gd1/3Ba2Cu3Ox (NEG) films leads to a substantial increase in the critical current density in superconducting YBa2Cu3Ox (YBCO) films deposited by pulsed laser deposition on such NEG layers. The enhancement is observed over a wide range of fields and temperatures. Transmission electron microscopy shows that such YBCO films possess a high density of localized areas, typically 20 x 20 nm2 in size, where distortion of atomic planes give rotational (2 to 5 degrees) moire patterns. Their distribution is random and uniform, and expected to be the origin of the enhanced flux pinning. Magneto-optical imaging shows that these films have excellent macroscopic magnetic uniformity.

This paper has not been read by Pith yet.

Enhanced critical current density of YBa2Cu3Ox films grown on Nd1/3Eu1/3Gd1/3Ba2Cu3Ox with nano-undulated surface morphology

discussion (0)