Enhancement of the decay rate of nonequilibrium carrier distributions due to scattering-in processes

We show that, for some semiconductor devices and physical experiments, processes which scatter electrons {\em into} a state $|{\bf k}\rangle$ can contribute strongly to the decay of a nonequilibrium electron occupation of $|{\bf k}\rangle$. For electrons, the decay rate $\gamma({\bf k})$ is given by the sum of the total scattering-out {\em and scattering-in} rates of state $|{\bf k}\rangle$. The scattering-in term, which is often neglected in calculations, increases $\gamma({\bf k})$ of low energy electrons injected into semidegenerate systems, which includes many doped semiconductor structures at nonzero temperatures, particularly those of reduced dimensions.