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arxiv: cond-mat/9802293 · v2 · pith:BAIPR7PEnew · submitted 1998-02-27 · ❄️ cond-mat.mtrl-sci

Near-Field Scanning Microwave Microscopy: Measuring Local Microwave Properties and Electric Field Distributions

B. J. Feenstra , C. P. Vlahacos , Ashfaq S. Thanawalla , D. E. Steinhauer , S. K. Dutta , F. C. Wellstood , Steven M. Anlage (University of Maryland , USA) This is my paper
classification ❄️ cond-mat.mtrl-sci
keywords microwaveelectriclocalmicroscopynear-fieldpropertiesallowingconfigurations
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We describe the near-field microwave microscopy of microwave devices on a length scale much smaller than the wavelength used for imaging. Our microscope can be operated in two possible configurations, allowing a quantitative study of either material properties or local electric fields.

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