Frequency Following Imaging of Electric Fields from Resonant Superconducting Devices using a Scanning Near-Field Microwave Microscope

Ashfaq S. Thanawalla; B. J. Feenstra; D. E. Steinhauer; F. C. Wellstood (University of Maryland); Robert B. Hammond (STI Inc.); S. K. Dutta; Steven M. Anlage; Wensheng Hu

arxiv: cond-mat/9811141 · v1 · pith:KWKYJHKNnew · submitted 1998-11-10 · ❄️ cond-mat.supr-con

Frequency Following Imaging of Electric Fields from Resonant Superconducting Devices using a Scanning Near-Field Microwave Microscope

Ashfaq S. Thanawalla , B. J. Feenstra , Wensheng Hu , D. E. Steinhauer , S. K. Dutta , Steven M. Anlage , F. C. Wellstood (University of Maryland) , Robert B. Hammond (STI Inc.) This is my paper

classification ❄️ cond-mat.supr-con

keywords frequencymicrowaveelectricmicroscopenear-fieldoperatesproberesonant

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We have developed a scanning near-field microwave microscope that operates at cryogenic temperatures. Our system uses an open-ended coaxial probe with a 200 mm inner conductor diameter and operates from 77 to 300 K in the 0.01-20 GHz frequency range. In this paper, we present microwave images of the electric field distribution above a Tl2Ba2CaCu2O8 microstrip resonator at 77 K, measured at several heights. In addition, we describe the use of a frequency-following circuit to study the influence of the probe on the resonant frequency of the device.

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Frequency Following Imaging of Electric Fields from Resonant Superconducting Devices using a Scanning Near-Field Microwave Microscope

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