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Critical-Current Reduction in Thin Superconducting Wires Due to Current Crowding

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arxiv 1203.4253 v3 pith:WZFFCMNP submitted 2012-03-19 cond-mat.supr-con

classification cond-mat.supr-con
keywords criticalcurrentreductionsuperconductingwiresamplifierscornerscritical-current
verification ladder T0 review T1 audit T2 compute T3 formal
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We demonstrate experimentally that the critical current in superconducting NbTiN wires is dependent on their geometrical shape, due to current-crowding effects. Geometric patterns such as 90 degree corners and sudden expansions of wire width are shown to result in the reduction of critical currents. The results are relevant for single-photon detectors as well as parametric amplifiers.

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