Typed states for the displayed outbound observations.
Source: paper_references, paper_reference_links
Paper Citation Record · LEDGER
Measuring thickness in thin NbN films for superconducting devices
As of 4 August 2026, this Paper Citation Record lists 0 of 0 outbound references and 2 inbound Pith citation observations for arXiv:1812.05559.
A citation records a reference. It does not transfer a finding from one paper to another.
Coverage vector
One-hop event checks from named stored sources.
Source: scholarly_work_events, retraction_status_cache, observed 2026-08-04T06:34:03.388597+00:00
Pith citing papers itemized under the disclosed page cap.
Source: paper_references, paper_reference_links, observed 2026-08-02T08:03:53.650270Z
A source-named dated measurement, never combined with another source.
Source: cited_works
Reference resolution
0 of 0 outbound references displayed
- verified exact0
- verified fuzzy0
- unresolved0
- parse uncertain0
- malformed identifier0
- metadata mismatch0
External citation measurements
No source-named external measurement is stored.
Outbound references
No outbound reference observations are available for this paper version.
Pith citing papers
Observation db69379b-8843-41db-b942-0e9e1048c328 · inbound
Seesaw reheating cites this paper.
Seesaw reheating Measuring thickness in thin NbN films for superconducting devices
Reference 19
- Resolution
- unresolved
- no resolver link, observed 2026-07-13T06:23:40.037423Z
Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 0f751893-db61-4d8e-bf31-5c5a39a7a946 · inbound
Seesaw reheating cites this paper.
Seesaw reheating Measuring thickness in thin NbN films for superconducting devices
Reference 19
- Resolution
- unresolved
- no resolver link, observed 2026-08-02T08:03:53.650270Z
Source-reported events for the cited work
Unavailable: canonical work link unavailable.