darfix: Data analysis for dark-field X-ray microscopy

Can Y{\i}ld{\i}r{\i}m; Carsten Detlefs; Henri Payno; J\'ulia Garriga Ferrer; Phil Cook; Raquel Rodr\'iguez-Lamas; Vicente Armando Sol\'e Jover; Vincent Favre-Nicolin; Wout De Nolf

darfix: Data analysis for dark-field X-ray microscopy

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arxiv 2205.05494 v1 pith:IB4KUJ75 submitted 2022-05-11 cond-mat.mtrl-sci

Júlia Garriga Ferrer , Raquel Rodríguez-Lamas , Henri Payno , Wout De Nolf , Phil Cook , Vicente Armando Solé Jover , Vincent Favre-Nicolin , Can Y{i}ld{i}r{i}m

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Carsten Detlefs

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classification cond-mat.mtrl-sci

keywords dataanalysisdarfixdark-fieldinputmicroscopyprocessingx-ray

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A Python package for the analysis of dark-field X-ray microscopy (DFXM) and rocking curve imaging (RCI) data is presented. \textit{darfix} provides a set of data processing and visualization tools that can be either imported as library components or accessed through a graphical user interface (GUI) as an Orange add-on. In the latter case, the different analysis modules can be easily chained to define computational workflows. Operations on larger-than-memory image sets are supported through the implementation of online versions of the data processing algorithms, effectively trading performance for feasibility when the computing resources are limited. The software can automatically extract the relevant instrument angle settings from the input files metadata. The currently available input file format is EDF and in future releases HDF5 will be incorporated.

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A transferable open-source workflow links grain mapping and dark-field X-ray microscopy, enabling targeted, non-destructive imaging from millimeter polycrystal structure to dislocations in iron.

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