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DiAD: A Diffusion-based Framework for Multi-class Anomaly Detection

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arxiv 2312.06607 v1 pith:PPYWZKTP submitted 2023-12-11 cs.CV

classification cs.CV
keywords anomalydetectionmulti-classdiadfeatureimagenetworkreconstruction
verification ladder T0 review T1 audit T2 compute T3 formal
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Reconstruction-based approaches have achieved remarkable outcomes in anomaly detection. The exceptional image reconstruction capabilities of recently popular diffusion models have sparked research efforts to utilize them for enhanced reconstruction of anomalous images. Nonetheless, these methods might face challenges related to the preservation of image categories and pixel-wise structural integrity in the more practical multi-class setting. To solve the above problems, we propose a Difusion-based Anomaly Detection (DiAD) framework for multi-class anomaly detection, which consists of a pixel-space autoencoder, a latent-space Semantic-Guided (SG) network with a connection to the stable diffusion's denoising network, and a feature-space pre-trained feature extractor. Firstly, The SG network is proposed for reconstructing anomalous regions while preserving the original image's semantic information. Secondly, we introduce Spatial-aware Feature Fusion (SFF) block to maximize reconstruction accuracy when dealing with extensively reconstructed areas. Thirdly, the input and reconstructed images are processed by a pre-trained feature extractor to generate anomaly maps based on features extracted at different scales. Experiments on MVTec-AD and VisA datasets demonstrate the effectiveness of our approach which surpasses the state-of-the-art methods, e.g., achieving 96.8/52.6 and 97.2/99.0 (AUROC/AP) for localization and detection respectively on multi-class MVTec-AD dataset. Code will be available at https://lewandofskee.github.io/projects/diad.

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  1. FastRef:Fast Prototype Refinement for Few-Shot Industrial Anomaly Detection

    cs.CV 2025-06 conditional novelty 4.0 of 10

    A test-time prototype refinement framework using optimal transport improves few-shot industrial anomaly detection accuracy on MVTec, VisA, MPDD, and RealIAD.

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