Pith. sign in

REVIEW 1 cited by

Bootstrapping Smooth Conformal Defects in Chern-Simons-Matter Theories

Not yet reviewed by Pith; the record is open.

This paper has not been read by Pith yet. Machine review is queued; the pith claim, tier, and objections will appear here once it completes.

SPECIMEN: schema-true, not a live event

T0 review · schema-true

One-sentence machine reading of the paper's core claim.

pith:XXXXXXXX · record.json · timestamp

arxiv 2312.17132 v2 pith:HPGHHTBF submitted 2023-12-28 hep-th

classification hep-th
keywords lineconformaldefectbootstraptheoriesassumptionsconstraintdefects
verification ladder T0 review T1 audit T2 compute T3 formal
0 comments
abstract

The expectation value of a smooth conformal line defect in a CFT is a conformal invariant functional of its path in space-time. For example, in large $N$ holographic theories, these fundamental observables are dual to the open string partition function in AdS. In this paper, we develop a bootstrap method for studying them and apply it to conformal line defects in Chern-Simons matter theories. In these cases, the line bootstrap is based on three minimal assumptions -- conformal invariance of the line defect, large $N$ factorization, and the spectrum of the two lowest-lying operators at the end of the line. On the basis of these assumptions, we solve the one-dimensional CFT on the line and systematically compute the defect expectation value in an expansion around the straight line. We find that the conformal symmetry of a straight defect is insufficient to fix the answer. Instead, imposing the conformal symmetry of the defect along an arbitrary curved line leads to a functional bootstrap constraint. The solution to this constraint is found to be unique.

Discussion (0). Continue with ORCID to comment.

Forward citations

Cited by 1 Pith paper

Reviewed papers in the Pith corpus that reference this work. Sorted by Pith novelty score. Full citation record

  1. Universal Constraints for Conformal Line Defects

    hep-th 2025-01 conditional novelty 7.0 of 10

    Any conformal line defect satisfies new integrated consistency conditions from shape deformation symmetry, verified against known data and used to predict new OPE coefficients.

Pith tools