Pith. sign in

REVIEW 2 cited by

Low-Loss Silicon Directional Coupler with Arbitrary Coupling Ratios for Broadband Wavelength Operation Based on Bent Waveguides

Not yet reviewed by Pith; the record is open.

This paper has not been read by Pith yet. Machine review is queued; the pith claim, tier, and objections will appear here once it completes.

SPECIMEN: schema-true, not a live event

T0 review · schema-true

One-sentence machine reading of the paper's core claim.

pith:XXXXXXXX · record.json · timestamp

arxiv 2404.06117 v1 pith:IZRIH4RW submitted 2024-04-09 physics.optics

Low-Loss Silicon Directional Coupler with Arbitrary Coupling Ratios for Broadband Wavelength Operation Based on Bent Waveguides

classification physics.optics
keywords couplingvariationbroadbanddesignlow-losswavelengthproposedsplitter
verification ladder T0 review T1 audit T2 compute T3 formal T4 reserved
0 comments
read the original abstract

We demonstrate a design for a high-performance $2 \times 2$ splitter meeting the essential requirements of broadband coupling, support for arbitrary coupling ratio, ultra low-loss, high fabrication tolerance, and a compact footprint. This is achieved based on a rigorous coupled mode theory analysis of the broadband response of the bent directional coupler (DC) and by demonstrating a full coupling model, with measured broadband values of 0.4, 0.5, 0.6, and 0.7. As a benchmark, we demonstrate a 0.5:0.5 splitter that significantly reduces coupling variation from 0.391 in the traditional DC to just 0.051 over an 80 nm wavelength span. This represents a remarkable 7.67 times reduction in coupling variation. Further, newly-invented low-loss bends were used in the proposed design leading to an ultra low-loss design with negligible excess loss ($\mathrm{0.003 \pm 0.013 \ dB}$). The proposed 0.5:0.5 silicon strip waveguide-based design is tolerant and shows consistently low coupling variation over a full 300 mm wafer showcasing a maximum cross coupling variation of 0.112 over 80 nm wavelength range, at the extreme edge of the wafer. Futhermore, we augmented the wafer mapping with a waveguide width fabrication tolerance study, confirming the tolerance of the device with a mere 0.061 maximum coupling variation with a waveguide width deviation of $\pm 20$ nm over 80 nm wavelength range. These specs make the proposed splitter an attractive component for practical applications with mass production.

discussion (0)

Sign in with ORCID, Apple, or X to comment. Anyone can read and Pith papers without signing in.

Forward citations

Cited by 2 Pith papers

Reviewed papers in the Pith corpus that reference this work. Sorted by Pith novelty score.

  1. Configuration Over Selection: Hyperparameter Sensitivity Exceeds Model Differences in Open-Source LLMs for RTL Generation

    cs.AR 2026-04 unverdicted novelty 6.0

    Hyperparameter configuration in open-source LLMs for RTL generation produces up to 25.5% intra-model pass-rate variation on VerilogEval and RTLLM, exceeding inter-model spreads by 5x with near-zero correlation in opti...

  2. An LLM-Orchestrated Agent for Directional-Coupler Design with Self-Consistent Eigenmode and FDTD Validation

    physics.optics 2026-06 unverdicted novelty 4.0

    LLM-orchestrated agent designs SOI 2x2 directional coupler achieving 0.498 cross fraction via self-consistent eigenmode/FDTD validation with invariant excess coupling length correction of 2.837 um.