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Point defects in CdTe and CdTeSe alloy: a first principles investigation with DFT+U

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arxiv 2404.07796 v3 pith:ADTO6AMC submitted 2024-04-11 cond-mat.mtrl-sci

classification cond-mat.mtrl-sci
keywords defectsalloycdtecdtesepropertiescalculationsdefectelectrical
verification ladder T0 review T1 audit T2 compute T3 formal

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CdTe and its alloy CdTeSe are widely used in optoelectronic devices, such as radiation detectors and solar cells, due to their superior electrical properties. However, the formation of defects and defect complexes in these materials can significantly affect their performance. As a result, understanding the defect formation and recombination processes in CdTe and CdTeSe alloy is of great importance. In recent years, density functional theory (DFT) calculations have emerged as a powerful tool for investigating the properties of defects in semiconductors. In this paper, we use DFT+U calculations to comprehensively study the properties of intrinsic defects as well as extrinsic defects induced by commonly used dopants, such as Cu and group V elements, in CdTe and CdTeSe alloy. This work provides insights into the effects of these defects on the electrical and optical properties of the material.

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