REVIEW
Metrology and Manufacturing-Integrated Digital Twin (MM-DT) for Advanced Manufacturing: Insights from CMM and FARO Arm Measurements
Not yet reviewed by Pith; the record is open.
This paper has not been read by Pith yet. Machine review is queued; the pith claim, tier, and objections will appear here once it completes.
SPECIMEN: schema-true, not a live event
T0 review · schema-true
One-sentence machine reading of the paper's core claim.
pith:XXXXXXXX · record.json · timestamp
Metrology and Manufacturing-Integrated Digital Twin (MM-DT) for Advanced Manufacturing: Insights from CMM and FARO Arm Measurements
read the original abstract
Metrology, the science of measurement, plays a key role in Advanced Manufacturing (AM) to ensure quality control, process optimization, and predictive maintenance. However, it has often been overlooked in AM domains due to the current focus on automation and the complexity of integrated precise measurement systems. Over the years, Digital Twin (DT) technology in AM has gained much attention due to its potential to address these challenges through physical data integration and real-time monitoring, though its use in metrology remains limited. Taking this into account, this study proposes a novel framework, the Metrology and Manufacturing-Integrated Digital Twin (MM-DT), which focuses on data from two metrology tools, collected from Coordinate Measuring Machines (CMM) and FARO Arm devices. Throughout this process, we measured 20 manufacturing parts, with each part assessed twice under different temperature conditions. Using Ensemble Machine Learning methods, our proposed approach predicts measurement deviations accurately, achieving an R2 score of 0.91 and reducing the Root Mean Square Error (RMSE) to 1.59 micrometers. Our MM-DT framework demonstrates its efficiency by improving metrology processes and offers valuable insights for researchers and practitioners who aim to increase manufacturing precision and quality.
discussion (0)
Sign in with ORCID, Apple, or X to comment. Anyone can read and Pith papers without signing in.