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Characterising higher-order phase correlations in gain-switched laser sources with application to quantum key distribution

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arxiv 2412.03738 v1 pith:ANEW7X63 submitted 2024-12-04 quant-ph

classification quant-ph
keywords correlationsdistributionlaserphasepulsessecurityemittedgain-switched
verification ladder T0 review T1 audit T2 compute T3 formal
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Multi-photon emissions in laser sources represent a serious threat for the security of quantum key distribution (QKD). While the decoy-state technique allows to solve this problem, it requires uniform phase randomisation of the emitted pulses. However, gain-switched lasers operating at high repetition rates do not fully satisfy this requirement, as residual photons in the laser cavity introduce correlations between the phases of consecutive pulses. Here, we introduce experimental schemes to characterise the phase probability distribution of the emitted pulses, and demonstrate that an optimisation task over interferometric measures suffices in determining the impact of arbitrary order correlations, which ultimately establishes the security level of the implementation according to recent security proofs. We expect that our findings may find usages beyond QKD as well.

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Cited by 2 Pith papers

Reviewed papers in the Pith corpus that reference this work. Sorted by Pith novelty score. Full citation record

  1. Secure quantum key distribution against correlated leakage source

    quant-ph 2025-07 conditional novelty 8.0 of 10

    A new QKD security framework uses round rearrangement and the generalized chain rule to give the first finite-key analysis for correlated sources, and a two-state SNS protocol tolerant to large correlation ranges.

  2. Security of quantum key distribution with source and detector imperfections through phase-error estimation

    quant-ph 2025-07 conditional novelty 6.0 of 10

    A modular proof technique extends phase-error-estimation security bounds from basis-independent to mismatched detector efficiencies, enabling finite-key QKD security with simultaneous source and detector imperfections.

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