Typed states for the displayed outbound observations.
Source: paper_references, paper_reference_links
Paper Citation Record · LEDGER
Interface-sensitive microwave loss in superconducting tantalum films sputtered on c-plane sapphire
As of 4 August 2026, this Paper Citation Record lists 0 of 0 outbound references and 2 inbound Pith citation observations for arXiv:2412.16730.
A citation records a reference. It does not transfer a finding from one paper to another.
Coverage vector
One-hop event checks from named stored sources.
Source: scholarly_work_events, retraction_status_cache, observed 2026-08-04T06:34:03.388597+00:00
Pith citing papers itemized under the disclosed page cap.
Source: paper_references, paper_reference_links, observed 2026-05-18T09:59:20.885285Z
A source-named dated measurement, never combined with another source.
Source: arxiv_reference, observed 2026-07-10T06:15:00.866473Z
Reference resolution
0 of 0 outbound references displayed
- verified exact0
- verified fuzzy0
- unresolved0
- parse uncertain0
- malformed identifier0
- metadata mismatch0
External citation measurements
No source-named external measurement is stored.
Outbound references
No outbound reference observations are available for this paper version.
Pith citing papers
Observation 921eac46-bf82-464f-93fe-52b6ce6434ec · inbound
Cryogenic growth of aluminum: structural morphology, optical properties, superconductivity and microwave dielectric loss cites this paper.
Cryogenic growth of aluminum: structural morphology, optical properties, superconductivity and microwave dielectric loss Interface-sensitive microwave loss in superconducting tantalum films sputtered on c-plane sapphire
Reference 30
- Resolution
- verified exact
- arxiv_id, observed 2026-05-18T10:01:13.439714Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-04T06:34:03.388597+00:00.
Observation 8131e01a-f10e-4cb7-8aff-cb8630b49789 · inbound
Investigation of coherence of niobium-based resonators enabled by a fast-sealing microwave cavity cites this paper.
Investigation of coherence of niobium-based resonators enabled by a fast-sealing microwave cavity Interface-sensitive microwave loss in superconducting tantalum films sputtered on c-plane sapphire
Reference 14
- Resolution
- metadata mismatch
- arxiv_id, observed 2026-05-10T16:55:37.145608Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-04T06:34:03.388597+00:00.