Pith. sign in

REVIEW 4 major objections 5 minor 44 references

How does picosecond structural deformation of (Ba,Sr)TiO$_{3}$ relate to the pyroelectric effect?

T0 review · 4 major / 5 minor · reviewed 2026-08-07 · deepseek-v4-flash

Challenge this review Re-run · record.json Download PDF Read on arXiv ↗

Pith's one-line read Picosecond x-ray diffraction shows a (Ba,Sr)TiO3 film expanding less than heat diffusion predicts, a deficit the authors attribute to charge injection across the SrRuO3/(Ba,Sr)TiO3 Schottky barrier.

desk verdict Solid, honest TR-XRD study of BST/SRO with a fluence-dependent expansion anomaly, but the Schottky explanation is under-supported and the heat diffusion calibration needs scrutiny. read the letter →

arxiv 2506.05054 v2 pith:WTUMHR5Q submitted 2025-06-05 cond-mat.mtrl-sci

D. Schmidt , J. Wawra , D. Hensel , M.Brede , R. Hühne , P. Gaal This is my paper
classification cond-mat.mtrl-sci PACS 77.70.-a
keywords ferroelectricthinfilmtime-resolvedx-raydiffractionpyroelectriceffectultrafastlatticedynamicsSchottkybarrierheatdiffusionsimulationbariumstrontiumtitanatepump-probe
verification ladder T0 review T1 audit T2 compute T3 formal

The pith

A machine-rendered reading of the paper's core claim, the machinery that carries it, and where it could break.

The reading

This paper is trying to establish that picosecond x-ray diffraction can separate the thermal from the non-thermal parts of the pyroelectric response in a ferroelectric thin film. The authors heat a (Ba,Sr)TiO3 film through an underlying SrRuO3 electrode with femtosecond laser pulses and watch the lattice expand on a picosecond timescale. At low pump fluence the expansion matches a heat diffusion simulation; at higher fluence the film expands less than the model predicts, and the paper attributes that 'frustrated thermal expansion' to electrons injected across the Schottky barrier at the SrRuO3/(Ba,Sr)TiO3 interface, whose screening field opposes the expansion through the inverse piezoelectric effect. If correct, this gives a contactless way to access pyroelectric contributions that ordinary hysteresis measurements average together.

What carries the argument

The central object is the Schottky barrier at the SrRuO3/(Ba,Sr)TiO3 interface, a contact barrier formed because the metal and ferroelectric work functions differ, with a space-charge region of width $d_n = \sqrt{2\epsilon_r\epsilon_0(\phi_M-\phi_S)/(e n_D)}$ extending into the ferroelectric film. The argument is carried by comparing measured transient Bragg-peak shifts to a one-dimensional heat diffusion simulation of the heterostructure. At low fluence the simulation matches both layers and serves as a calibration; at high fluence the SrRuO3 sensor is matched only after rescaling the input fluence, while the (Ba,Sr)TiO3 film still falls short of the predicted thermal expansion. The shortfall is then interpreted as an inverse piezoelectric strain generated by the transient electric field of an electron-screened, extended space-charge region.

What would settle it

Repeat the high-fluence pump-probe measurement on an identical (Ba,Sr)TiO3 stack with a non-Schottky bottom electrode (or with a DC bias applied to suppress charge injection) and check whether the expansion deficit disappears; if it does not disappear, the charge-screening mechanism is not the cause.

Watch

Extended reading notes

Core claim

The paper's central claim is that the picosecond deformation of (Ba,Sr)TiO3 after femtosecond heating of the SrRuO3 electrode is not purely thermal: at excitation fluences of 10 and 15 mJ/cm2, the ferroelectric film expands less than a heat diffusion simulation predicts, even though the same simulation reproduces the SrRuO3 temperature sensor after scaling the fluence to 65% and 45%. The authors propose that this 'frustrated thermal expansion' arises because hot electrons from the laser-heated SrRuO3 cross the Schottky barrier, screen the positive space charge, and thereby change the electric field in the space-charge region. The field change produces an inverse piezoelectric strain that counteracts thermal expansion, and the injected carriers also alter the permittivity and polarization. The mechanism is explicitly tentative: the paper states that a quantitative separation of pyroelectric contributions requires temperature-dependent piezoelectric and elastic constants and better characterization of the interface, for example by deep-level transient spectroscopy.

Load-bearing premise

The interpretation stands or falls on the assumption that the heat diffusion simulation, after scaling the laser fluence to match the SrRuO3 temperature transient, correctly predicts the temperature inside the (Ba,Sr)TiO3 layer, so the expansion shortfall must come from a non-thermal process rather than from an error in the model or in the temperature-dependent material parameters.

Editorial extensions

If this is right

  • At low fluence the heat diffusion model reproduces both layers, so the experiment supplies a calibrated thermal baseline; any strain shortfall at higher fluence is a direct signature of non-thermal response.
  • Static hysteresis measurements give only the sum of all pyroelectric contributions, whereas the transient strain data isolate the strain-related secondary channel, even though a quantitative value is not yet reached.
  • The frustration appears only above a threshold fluence and is absent in static measurements, implying the extra dissipation channel is a transient non-equilibrium process.
  • A quantitative separation would require temperature-dependent piezoelectric and elastic stiffness constants plus a characterization of the Schottky barrier, which the paper identifies as the necessary next step.

Reading between the lines

Editorial extensions of the paper, not claims the author makes directly.

  • If the charge-injection picture is right, the strain deficit is a direct time-resolved measure of hot-electron transfer across an oxide interface, so the same experiment could probe Schottky-barrier dynamics in other metal/ferroelectric stacks without electrical contacts.
  • The empirical fluence rescaling (65% and 45%) could also be explained by reduced optical absorption at high intensity; measuring the pump reflectivity and absorbed energy at each fluence would discriminate between a real charge effect and an absorption artifact.
  • Because the inverse piezoelectric strain should be proportional to the space-charge field, applying an external bias across the stack in a future experiment would modulate the magnitude or sign of the frustrated expansion if the mechanism is correct.
Share X Bluesky LinkedIn Reddit HN

Editorial analysis

A structured set of objections, weighed in public.

Desk editor's note, referee report, and a circularity audit.

Referee Report

4 major / 5 minor

Summary. The manuscript reports static pyroelectric measurements of epitaxial (Ba,Sr)TiO3 films on NdScO3 with a SrRuO3 bottom electrode, deriving the pyroelectric coefficient from temperature-dependent polarization hysteresis loops and an indirect electrocaloric temperature change. The authors then perform time-resolved x-ray diffraction after femtosecond laser excitation of the SrRuO3 layer and compare the transient lattice expansion of BST and SrRuO3 to one-dimensional heat diffusion simulations. At low fluence (6 mJ/cm2) the simulation matches the BST expansion after scaling the effective fluence to 4.5 mJ/cm2, whereas at higher fluences (10 and 15 mJ/cm2, scaled to 65% and 45% respectively) the BST expands less than the constant-parameter heat diffusion model predicts. This 'frustrated thermal expansion' is tentatively attributed to charge injection across the SrRuO3/BST Schottky barrier, which would counteract thermal expansion via the inverse piezoelectric effect. The authors explicitly note that quantitative assessment of the secondary pyroelectric effect is currently impossible due to unknown temperature dependence of material parameters.

Significance. If the central claim were fully supported, the paper would be significant because it proposes a non-contact, time-resolved route to disentangle secondary pyroelectric contributions in clamped ferroelectric films, and it identifies a possible transient charge-screening mechanism at the electrode/ferroelectric interface. The static pyroelectric and electrocaloric characterization of Ba0.7Sr0.3TiO3 is useful and follows standard procedures. The time-resolved methodology, including the use of SrRuO3 as an embedded temperature sensor, is also of interest. However, the load-bearing 'frustration' claim rests on a constant-parameter heat diffusion model whose quantitative accuracy over the ~100 K temperature rise is explicitly conceded in Section 5 to be inadequate, and the Schottky mechanism is proposed without measured barrier heights or injected charge densities. The paper is honest about these limitations, but as it stands the main new finding is not yet established beyond a plausible alternative (temperature-dependent thermal expansion coefficients).

major comments (4)
  1. [Section 3, Fig. 3 and Section 5] The 'frustrated thermal expansion' claim is defined as a deviation of the measured BST strain from a heat diffusion simulation that uses constant (or literature single-temperature) values of the thermal expansion coefficient, specific heat, and thermal conductivity. Section 5 explicitly states that for the ~100 K temperature rise in the experiment 'the temperature dependence cannot be neglected' for the relevant material parameters. If the true thermal expansion coefficient of BST decreases with temperature over this range (as is common near a diffuse transition), the constant-parameter model will overpredict the expansion and produce exactly the reported frustration without any charge mechanism. To make the central claim load-bearing, the authors must either implement temperature-dependent parameters in the simulation, or quantitatively bound the effect of their temperature dependence and show that the observed deviation exceeds this bound.
  2. [Section 3, fluence scaling] The effective fluence is separately tuned to 65% (for 10 mJ/cm2) and 45% (for 15 mJ/cm2) so that the simulated SrRuO3 sensor response matches the measurement. The same calibrated model is then used to predict the BST expansion. This introduces a two-parameter fit that can absorb not only the stated reduction in energy transfer but also any systematic error in the thermal model (e.g., incorrect absorption, interface resistance, or parameter temperature dependence). No physical mechanism is given for why the scaling factor changes with fluence, and no independent constraint is provided for the BST temperature prediction. Please provide an uncertainty analysis that propagates the fluence scaling uncertainty into the predicted BST strain, or an alternative validation (e.g., a second sensor layer or independent temperature probe).
  3. [Section 3, Figs. 3a-c] The measured transient qz shifts are shown without error bars, and the simulated curves are presented as deterministic. The magnitude of the claimed BST deviation at 10 and 15 mJ/cm2 is not quantified relative to experimental precision (e.g., peak position uncertainty from the reciprocal space map fits, laser fluence stability, x-ray time jitter). Please provide error bars or confidence intervals on at least the final plateau values of the BST shift at each fluence, and state whether the deviation is statistically significant.
  4. [Section 4, Eq. (4) and proposed mechanism] The Schottky-barrier charge injection mechanism is presented as an explanation for the frustrated expansion, but no quantitative estimate is given of the space charge density, barrier height, or injected charge required to produce the observed strain compensation. The manuscript even notes that no quantitative values for the relevant (Ba,Sr)TiO3/SrRuO3 barrier parameters are reported in the literature. Without an order-of-magnitude demonstration that plausible charge injection can generate the required counteracting strain (via inverse piezoelectric coupling), the mechanism remains only a speculation. A quantitative estimate, even with wide uncertainty ranges, is needed to support the interpretation over the thermal nonlinearity alternative.
minor comments (5)
  1. [Abstract and Conclusion] The abstract and conclusion use 'frustration of the thermal expansion' whereas the body text in Section 3 and 6 sometimes says 'reduced thermal expansion.' Please adopt a single term for consistency, preferably one that does not presume a non-thermal origin.
  2. [Eq. (3)] Equation (3) reads '∆qz = qz,0 (α∆T + 1)', which is dimensionally inconsistent because ∆qz and qz,0 have the same units but the right-hand side is qz,0 times a dimensionless factor plus qz,0. This should presumably be qz = qz,0(1 + α∆T) or ∆qz/qz,0 = α∆T. Please correct.
  3. [Section 3, Fig. 3 caption] The text for the 6 mJ/cm2 measurement states the simulation reproduces the data with an excitation fluence of 4.5 mJ/cm2, while the Figure 3d caption says the simulation was performed for 6.5 mJ/cm2. These numbers are inconsistent; please clarify which fluence values correspond to which curves and why they differ from the nominal experimental fluences.
  4. [Figure 1 caption] The caption defines the substrate as NdGaO3 (NGO) while the text consistently uses NdScO3 (NSO). Please correct the figure caption or the text so the substrate material is reported consistently.
  5. [Section 4] There is a typo in the text: 'SrRu03' should be 'SrRuO3' in the sentence on work functions. Also, in the same section the phrase 'permeability in (Ba,Sr)TiO3' likely means 'permittivity' or 'dielectric properties'; please revise the wording.

Circularity Check

0 steps flagged · score 0.0 of 10

No significant circularity: the static pyroelectric measurement and the time-resolved deformation experiment are independent, and the high-fluence 'frustrated expansion' is an out-of-sample model prediction rather than a refitted quantity, though its interpretation is limited by acknowledged temperature-dependent parameter uncertainties.

full rationale

The paper's derivation chain is not circular. The static pyroelectric coefficient (Section 2) is obtained directly from measured P(E,T) hysteresis loops, and the electrocaloric estimate is an indirect Maxwell-relation conversion (Eqs. 1-2) using literature heat capacity; neither is fitted to the time-resolved target. In the time-resolved experiment (Section 3), the heat-diffusion simulation is a forward model based on literature material parameters and a separately measured thermal-expansion coefficient. The only adjusted parameter is the effective laser fluence, fixed to reproduce the independently measured SrRuO3 sensor transient; the subsequent (Ba,Sr)TiO3 lattice shift is a genuine out-of-sample prediction from the same model. The observed high-fluence deviation is therefore not statistically forced by the SrRuO3 fit, and the difference is a new observable. The paper itself flags the key limitation in Section 5: 'As the temperature change is in the order of 100 K ... the temperature dependence cannot be neglected' and 'no quantitative assessment of the secondary pyroelectric effect can be made currently'. This undermines the confidence of the charge-screening interpretation and is a correctness/model-uncertainty concern, not circular reasoning. Self-citations to earlier ultrafast-XRD work and the udkm1dsim toolbox support the methodology but are not load-bearing in a way that makes the central claim true by definition; the model is externally documented and the low-fluence agreement provides an internal check.

Assumptions & free parameters 2 free parameters · 5 assumptions · 0 invented entities

The central claim relies on a heat diffusion model calibrated with two fitted fluence scaling factors, standard thermodynamic relations, and a proposed but unmeasured Schottky barrier charge dynamics. No new physical entities are introduced.

free parameters (2)
  • effective fluence scaling factor (10 mJ/cm2 measurement) = 0.65 (simulation uses 65% of measured fluence)
    Tuned so that the simulated SrRuO3 deformation matches the measured SrRuO3 response; then used to predict BST deformation. Section 3, Figure 3b.
  • effective fluence scaling factor (15 mJ/cm2 measurement) = 0.45 (simulation uses 45% of measured fluence)
    Same procedure for the 15 mJ/cm2 dataset. Section 3, Figure 3c.
assumptions (5)
  • domain assumption Heat diffusion model with literature material parameters accurately describes the temperature profile in the BST/SRO/NSO stack for the first nanoseconds.
    Central to converting measured deformation to temperature; invoked throughout Section 3.
  • domain assumption Thermal expansion of SrRuO3 is purely thermal and linear over the probed temperature range, allowing its use as a temperature sensor.
    Section 3: 'We employ the SrRuO3 film as a temperature sensor by converting the deformation to a temperature via the thermal expansion coefficient.'
  • domain assumption The pyroelectric coefficient is decomposable into primary, secondary, tertiary, and quaternary contributions as described by Jachalke et al.
    Used in Sections 2 and 5 to interpret measured p and to relate strain to the secondary pyroelectric effect.
  • standard math The Maxwell relation (∂S/∂E)_T = (∂P/∂T)_E is valid for this ferroelectric system.
    Used in the indirect electrocaloric calculation in Section 2, Equation (1).
  • domain assumption A Schottky barrier with the given band picture forms at the SrRuO3/(Ba,Sr)TiO3 interface.
    Invoked in Section 4 to explain the frustrated expansion; not directly measured in this work.

how reviews work

0 comments
Cite this review

Pith. "Pith review of How does picosecond structural deformation of (Ba,Sr)TiO$_{3}$ relate to the pyroelectric effect?." pith.science (2026). https://pith.science/paper/WTUMHR5Q

@misc{pith2026250605054,
  author       = {Pith},
  title        = {Pith review of: How does picosecond structural deformation of (Ba,Sr)TiO$_3$ relate to the pyroelectric effect?},
  year         = {2026},
  howpublished = {\url{https://pith.science/paper/WTUMHR5Q}},
  note         = {Machine review of arXiv:2506.05054}
}
abstract

The pyroelectric effect in ferroelectric thin films is typically composed of different contributions, which are difficult to disentangle. In addition, clamping to the substrate interface plays an important role. We studied epitaxial (Ba,Sr)TiO$_3$ thin films grown on NdScO$_3$ to see if time-resolved measurements can shed more light on the complex interaction. In particular, we compare standard measurements of the pyroelectric coefficient by temperature-dependent hysteresis loops to transient deformation measurements on picosecond timescales in the same material. The advantage of the time-resolved approach lies in its increased sensitivity in thin films compared to that of polarization hysteresis measurements. Whereas a fast thermal expansion of the ferroelectric thin film was observed after femtosecond laser excitation of the intermediate SrRuO$_3$ layer, heat diffusion simulations reveal frustration of the thermal expansion, which might be explained with the charge dynamics at the Schottky barrier formed at the SrRuO$_3$/(Ba,Sr)TiO$_3$. More studies are required to quantitatively assess the individual contributions to the pyroelectric coefficient of the materials used in our layer architecture.

Figures

Figures reproduced from arXiv: 2506.05054 by the authors.

Figure 1
Figure 1. Experimental Method: a) Experimental setup for measuring po￾larization hysteresis loops to derive the pyroelectric and EC effect. b) Optical excitation and subsequent XRD probing of the out-of-plane lattice expansion in symmetric Bragg geometry. BST, SRO and NGO denote the film materials (Ba,Sr)TiO3, SrRuO3 and the NdGaO3 substrate. c) Experimental setup for optical x-ray pump-probe measurements. For details see the… view at source ↗
Figure 2
Figure 2. Characterization of the pyroelectric effect from polarization mea￾surements: a) Full dataset depicting the dependence of the pyroelectric coeffi￾cient on external electric field and temperature. b) Dependence of pyroelectric coefficient on temperature for selected electric fields extracted from the data shown in a). The coefficient increases with increasing electric field. c) Field￾dependent pyroelectric effect at 0… view at source ↗
Figure 3
Figure 3. Results of time-resolved measurements: a)-c) Measured (symbols) and simulated (solid lines) shift of the symmetric (002) Bragg reflex of the (Ba,Sr)TiO3 (upper, red) and SrRuO3 (lower, blue) layer. The simulation result is convoluted with a gaussian function of full width at half maximum of 120 ps to account for the limited time resolution of the experiment. d) Transient sam￾ple temperature plotted along the surface… view at source ↗
Figures from the paper (1 more)
Figure 4
Figure 4. Figure 4: Electronic properties of the (Ba,Sr)TiO3/SrRuO3 interface: a) Band structure of (Ba,Sr)TiO3 and SrRuO3 showing an offset in the Fermi en￾ergy of µ in both materials. b) Band structure of (Ba,Sr)TiO3 grown on an SrRuO3 electrode. The sketch depicts the formation of a Sc…

Discussion (0). Sign in to comment.

Reference graph

Works this paper leans on

44 extracted references · 40 canonical work pages

  1. [1]

    Damjanovic, Ferroelectric, dielectric and piezoelectric properties of ferroelectric thin films and ceramics, Reports on Progress in Physics 61 (9) (1998) 1267

    D. Damjanovic, Ferroelectric, dielectric and piezoelectric properties of ferroelectric thin films and ceramics, Reports on Progress in Physics 61 (9) (1998) 1267. doi:10.1088/0034-4885/61/9/002

    work page doi:10.1088/0034-4885/61/9/002 1998

  2. [2]

    Setter, D

    N. Setter, D. Damjanovic, L. Eng, G. Fox, S. Gevorgian, S. Hong, A. Kingon, H. Kohlstedt, N. Y . Park, G. B. Stephenson, I. Stolitchnov, A. K. Taganstev, D. V . Taylor, T. Yamada, S. Streiffer, Ferroelectric thin films: review of materials, properties, and applications, Journal of Ap- plied Physics 100 (5) (2006) 051606. doi:10.1063/1.2336999

    work page doi:10.1063/1.2336999 2006

  3. [3]

    L. W. Martin, A. M. Rappe, Thin-film ferroelectric materials and their applications, Nature Review Materials 2 (2) (2016) 16087. doi:10.1038/natrevmats.2016.87

    work page doi:10.1038/natrevmats.2016.87 2016

  4. [4]

    S. B. Lang, Sourcebook of Pyroelectricity, CRC Press, Boca Raton, FL, 1974

    work page 1974

  5. [5]

    Jachalke, E

    S. Jachalke, E. Mehner, H. St ¨ocker, J. Hanzig, M. Sonntag, T. Weigel, T. Leisegang, D. C. Meyer, How to measure the pyroelectric coefficient?, Applied Physics Reviews 4 (2) (2017) 021303. doi:10.1063/1.4983118

    doi:10.1063/1.4983118 2017

  6. [6]

    Lubomirsky, O

    I. Lubomirsky, O. Stafsudd, Invited review article: Practical guide for py- roelectric measurements, Review of Scientific Instruments 83 (5) (2012) 051101. doi:10.1063/1.4709621

    work page doi:10.1063/1.4709621 2012

  7. [7]

    Magalhaes, S

    B. Magalhaes, S. Engelhardt, C. Molin, S. Gebhardt, K. Nielsch, R. H¨uhne, Electrocaloric temperature changes in epitaxial Ba1−xSrxTiO3 films, Journal of Alloys and Compounds 891 (2021) 162041. doi:10.1016/j.jallcom.2021.162041

    work page arXiv 2021

  8. [8]

    Shayduk, P

    R. Shayduk, P. Gaal, Transition regime in the ultrafast laser heat- ing of solids, Journal of Applied Physics 127 (7) (2020) 073101. doi:10.1063/1.5143717

    doi:10.1063/1.5143717 2020

Show all 44 references
  1. [9]

    H. A. Navirian, D. Schick, P. Gaal, W. Leitenberger, R. Shayduk, M. Bargheer, Thermoelastic study of nanolayered structures using time- resolved x-ray diffraction at high repetition rate, Applied Physics Letters 104 (2) (2014) 021906. doi:10.1063/1.4861873

    2014 doi

  2. [10]

    Shayduk, H

    R. Shayduk, H. Navirian, W. Leitenberger, J. Goldshteyn, I. Vrejoiu, M. Weinelt, P. Gaal, M. Herzog, C. V . K. Schmising, M. Bargheer, Nanoscale heat transport studied by high-resolution time-resolved x-ray diffraction, New J. Phys. 13 (9) (2011) 093032. doi:10.1088 /1367- 263...

    2011

  3. [11]

    A. G. Chynoweth, Dynamic method for measuring the pyroelectric ef- fect with special reference to barium titanate, Journal of Applied Physics 27 (1) (1956) 78–84. doi:10.1063/1.1722201

    1956 doi

  4. [12]

    Wawra, K

    J. Wawra, K. Nielsch, R. H ¨uhne, Influence of lattice mismatch on struc- tural and functional properties of epitaxial Ba0.7Sr0.3TiO3 thin films, Ma- terials 16 (2023) 6036. doi:10.3390/ma16176036

    2023 doi

  5. [13]

    Bowen, J

    C. Bowen, J. Taylor, E. LeBoulbar, D. Zabek, A. Chauhan, R. Vaish, Pyroelectric materials and devvicesfor energy harvesting applications, Energy & Enviromental Science 7 (2014) 3836–3856. doi:10.1039/c4ee01759e

    2014 doi

  6. [14]

    T. Tong, J. Karthik, L. W. Martin, D. G. Cahill, Secondary e ffects in wide frequency range measurements of the pyroelectric coe fficient of Ba0.6Sr0.4TiO3 and PbZr 0.2Ti0.8O3 epitaxial layers, Physical Review B 90 (2014) 155423. doi:10.1103/PhysRevB.90.155423

    2014 doi

  7. [15]

    Acosta, N

    M. Acosta, N. Novak, V . Rojas, S. Patel, R. Vaish, J. Koruza, G. Ros- setti, J. R ¨odel, BaTiO 3-based piezoelectrics: Fundamentals, current status, and perspectives, Applied Physics Reviews 4 (2017) 041305. doi:10.1063/1.4990046

    2017 doi

  8. [16]

    Vendik, S

    O. Vendik, S. Zubko, Ferroelectric phase transition and maximum di- electric permittivity of displacement type ferroelectrics (BaxSr1 − xTiO3), Jounal of Applied Physics 88 (2000) 5343–5350. doi:10.1063/1.1317243

    2000 doi

  9. [17]

    D. G. Schlom, L.-Q. Chen, C. J. Fennie, V . Gopalan, D. A. Muller, X. Pan, R. Ramesh, R. Uecker, Elastic strain engineering of ferroic oxides, MRS Bulletin 39 (2) (2014) 118–130. doi:10.1557/mrs.2014.1

    2014 doi

  10. [18]

    Schmidbauer, D

    M. Schmidbauer, D. Braun, T. Markurt, M. Hanke, J. Schwarzkopf, Strain engineering of monoclinic domains in K xNa1−xNbO3 epitaxial layers: a pathway to enhanced piezoelectric properties, Nanotechnology 28 (24) (2017) 24LT02. doi:10.1088/1361-6528/aa715a

    2017 doi

  11. [19]

    Schwarzkopf, D

    J. Schwarzkopf, D. Braun, M. Hanke, R. Uecker, M. Schmidbauer, Strain engineering of ferroelectric domains in K xNa1−xNbO3 epitaxial layers, Frontiers in Materials 4. doi:10.3389/fmats.2017.00026

    2017

  12. [20]

    Z.-G. Ban, S. Alpay, Phase diagrams and dielectric response of epitaxial barium strontium titanate films: A theoretical analysis, Jounal of Applied Physics 91 (2002) 9288–9296. doi:10.1063/1.1473675

    2002 doi

  13. [21]

    Y . Liu, J. F. Scott, B. Dkhil, Direct and indirect measurements on elec- trocaloric effect: Recent developments and perspectives, Applied Physics Reviews 3 (2016) 031102. doi:10.1063/1.4958327

    2016 doi

  14. [22]

    Kutnjak, B

    Z. Kutnjak, B. Ro ˇziˇc, R. Pirc, Electrocaloric E ffect: Theory, Measure- ments, and Applications, John Wiley & Sons, Ltd, 2015, pp. 1–19. doi:10.1002/047134608X.W8244

    2015 doi

  15. [23]

    Strukov, S

    B. Strukov, S. Davitadze, S. Kravchun, S. Taraskin, M. Goltzman, V . Lemanov, S. Shulman, Specific heat and heat conductivity of BaTiO3polycrystalline films in the thickness range 20–1100 nm, Journal of Physics: Condensed Matter 15 (25) (2003) 4331. doi:10.1088 /0953- 8984/15/25/304

    2003

  16. [24]

    Kriegner, E

    D. Kriegner, E. Wintersberger, xrayutilities: A python package for x-ray diffraction data analysis and simulation, available at PyPI and GitHub: https://github.com/dkriegner/xrayutilities (2025). URL https://pypi.org/project/xrayutilities/

    2025

  17. [25]

    Schick, R

    D. Schick, R. Shayduk, A. Bojahr, M. Herzog, C. von Kor ff Schmising, P. Gaal, M. Bargheer, Ultrafast reciprocal-space mapping with a conver- gent beam, Journal of Applied Crystallography 46 (5) (2013) 1372–1377. doi:10.1107/S0021889813020013

    2013 doi

  18. [26]

    Schick, udkm1dsim – a python toolbox for simulating 1d ultrafast dynamics in condensed matter, Computer Physics Communications 266 (2021) 108031

    D. Schick, udkm1dsim – a python toolbox for simulating 1d ultrafast dynamics in condensed matter, Computer Physics Communications 266 (2021) 108031. doi:10.1016/j.cpc.2021.108031

    2021

  19. [27]

    Kostic, Y

    P. Kostic, Y . Okada, N. C. Collins, Z. Schlesinger, J. W. Reiner, L. Klein, A. Kapitulnik, T. H. Geballe, M. R. Beasley, Non-fermi-liquid behavior of SrRuO3: Evidence from infrared conductivity, Phys. Rev. Lett. 81 (1998) 2498–2501. doi:10.1103/PhysRevLett.81.2498

    1998 doi

  20. [28]

    P. Gaal, D. Schmidt, M. Khosla, C. Richter, P. Boesecke, D. Novikov, M. Schmidbauer, J. Schwarzkopf, Self-stabilization of the equilibrium state in ferroelectric thin films, Applied Surface Science 613 (2023) 155891. doi:10.1016/j.apsusc.2022.155891. URL https://doi.org/10.101...

    2023

  21. [29]

    B. E. Warren, X-Ray Di ffraction, Dover Publications, New York, 1990

    1990

  22. [30]

    Mattern, J.-E

    M. Mattern, J.-E. Pudell, G. Laskin, A. von Reppert, M. Bargheer, Analysis of the temperature- and fluence-dependent magnetic stress in laser-excited SrRuO 3, Structural Dynamics 8 (2) (2021) 024302. doi:10.1063/4.0000072

    2021 doi

  23. [31]

    Bojahr, D

    A. Bojahr, D. Schick, L. Maerten, M. Herzog, I. Vrejoiu, C. von Ko- rff Schmising, C. Milne, S. L. Johnson, M. Bargheer, Comparing the os- cillation phase in optical pump-probe spectra to ultrafast x-ray di ffrac- tion in the metal-dielectric SrRuO 3/SrTiO3 superlattice, Phys....

    2012 doi

  24. [32]

    A. H. Hubmann, S. Li, S. Zhukov, H. von Seggern, A. Klein, Polarisation dependence of schottky barrier heights at ferroelectric BaTiO 3/RuO2 in- terfaces: influence of substrate orientation and quality, Journal of Physics D: Applied Physics 49 (29) (2016) 295304

    2016

  25. [33]

    Gross, A

    R. Gross, A. Marx, Festk ¨orperphysik, De Gruyter, Berlin, 2014

    2014

  26. [34]

    A. J. Hartmann, M. Neilson, R. N. Lamb, K. Watanabe, J. F. Scott, Ruthenium oxide and strontium ruthenate electrodes for ferroelec- tric thin-films capacitors, Applied Physics A 70 (2) (2000) 239–242. 7 doi:10.1007/s003390050041

    2000 doi

  27. [35]

    C. R. Freeze, S. Stemmer, Role of film stoichiometry and interface quality in the performance of (Ba,Sr)TiO 3 tunable capacitors with high figures of merit, Applied Physics Letters 109 (19) (2016) 192904. doi:10.1063/1.4967374

    2016 doi

  28. [36]

    Lee, Y .-J

    C.-H. Lee, Y .-J. Oh, D. Y . Lee, D.-J. Choi, Influence of annealing temper- ature on the dielectric properties of (Ba,Sr)TiO 3 thin films deposited on various substrates, Journal of the Korean Physical Society 69 (10) (2016) 1571–1574. doi:10.3938/jkps.69.1571

    2016 doi

  29. [37]

    Z. Xi, J. Ruan, C. Li, C. Zheng, Z. Wen, J. Dai, A. Li, D. Wu, Giant tunnelling electroresistance in metal /ferroelectric/semiconductor tunnel junctions by engineering the schottky barrier, Nature Communications 8 (1) (2017) 15217. doi:10.1038/ncomms15217

    2017 doi

  30. [38]

    Wei, H.-P

    T.-C. Wei, H.-P. Wang, H.-J. Liu, D.-S. Tsai, J.-J. Ke, C.-L. Wu, Y .-P. Yin, Q. Zhan, G.-R. Lin, Y .-H. Chu, J.-H. He, Photostriction of strontium ruthenate, Nature Communications 8 (1) (2017) 15018. doi:10.1038/ncomms15108

    2017 doi

  31. [39]

    J. Guo, W. Chen, H. Chen, Y . Zhao, F. Dong, W. Liu, Y . Zhang, Recent progress in optical control of ferroelectric po- larization, Advanced Optical Materials 9 (23) (2021) 2002146. doi:https://doi.org/10.1002/adom.202002146

    2021 doi

  32. [40]

    Plech, P

    A. Plech, P. Gaal, D. Schmidt, M. Levantino, M. Daniel, S. Stankov, G. Buth, M. Albrecht, Laser-initiated electron and heat transport in gold-skutterudite CoSb 3 bilayers resolved by pulsed x-ray scattering, New Journal of Physics 26 (10) (2024) 103024. doi:10.1088 /1367- 2630/ad8674

    2024

  33. [41]

    Herzog, A

    M. Herzog, A. von Reppert, J.-E. Pudell, C. Henkel, M. Kronseder, C. H. Back, A. A. Maznev, M. Bargheer, Phonon-dominated energy transport in purely metallic heterostructures, Advanced Functional Materials 32 (41) (2022) 2206179. doi:10.1002/adfm.202206179

    2022 doi

  34. [42]

    D. V . Lang, Deep-level transient spectroscopy: A new method to charac- terize traps in semiconductors, Journal of Applied Physics 45 (7) (1974) 3023–3032. doi:10.1063/1.1663719

    1974 doi

  35. [43]

    Stolt, K

    L. Stolt, K. Bohlin, Deep-level transient spectroscopy measurements us- ing high schottky barriers, Solid-State Electronics 28 (12) (1985) 1215–

    1985

  36. [1221]

    doi:10.1016/0038-1101(85)90045-0. 8

    doi

Pith tools

Reviewed August 7, 2026 · model on record in the stance chip above.