Pith. sign in

REVIEW 3 major objections 6 minor 1 cited by

A Comprehensive Survey for Real-World Industrial Defect Detection: Challenges, Approaches, and Prospects

T0 review · 3 major / 6 minor · reviewed 2026-08-06 · deepseek-v4-flash

Pith's one-line read This survey claims to be the first systematic account of industrial defect detection's transition from closed-set to open-set methods across both 2D and 3D data.

desk verdict Useful 2D/3D survey with an overstated 'first' claim and no documented selection methodology; worth citing with caveats, but needs revision before it can be the field's reference. read the letter →

arxiv 2507.13378 v1 pith:IHQHSXOV submitted 2025-07-15 cs.CV

classification cs.CV
keywords industrialdefectdetectionanomalyclosed-setopen-set2Dand3Dmodalitiespointcloudinspectiondeeplearningsurveymulti-modal
verification ladder T0 review T1 audit T2 compute T3 formal

The pith

A machine-rendered reading of the paper's core claim, the machinery that carries it, and where it could break.

The reading

The survey argues that industrial defect detection has undergone a fundamental shift: older closed-set systems, trained on labeled examples of every defect category they will ever see, are giving way to open-set systems that flag anomalies never encountered in training. It claims to be the first review to examine this transition systematically across both 2D image-based and 3D point-cloud-based inspection. The main contribution is an organizing taxonomy that pairs the closed-set/open-set distinction with data modality, together with a synthesis of recent methods, datasets, and open challenges. If the survey's account is right, the field's center of gravity is moving toward detection pipelines that need few or no defect annotations.

What carries the argument

The load-bearing organization is a two-axis taxonomy: closed-set versus open-set detection crossed with 2D versus 3D data. Closed-set means supervised recognition of predefined defect classes; open-set means identifying previously unseen anomalies, typically by modeling normality. The taxonomy does the argument's work by turning a scattered method literature into a single narrative: as industrial production shifts to small batches and varied products, defect annotations become scarce, and the field pivots from closed-set to open-set, with 3D and multi-modal methods added to catch defects invisible to 2D texture analysis.

What would settle it

A reproducible, documented literature search that turns up an earlier survey covering the same closed-set-to-open-set span across 2D and 3D would refute the 'first' claim; re-reading a random sample of the cited papers for mischaracterization would test the accuracy premise.

Watch

Extended reading notes

Core claim

On the paper's own terms, the central discovery is that a single conceptual axis, closed-set versus open-set defect detection, now structures how the field should be understood. Closed-set methods assume all defect classes are known at training time and rely on supervised object detection or segmentation; open-set methods, often called industrial anomaly detection, learn normality from defect-free data and flag deviations, which removes the need for extensive anomaly annotations. The survey maps this axis onto two modalities: 2D detection, which captures textural defects through RGB and multi-spectral imaging, and 3D detection, which captures geometric defects through point clouds, depth sensors, and reference-model registration. It subdivides open-set 2D methods into unsupervised, semi-supervised, and zero/few-shot families, and 3D open-set methods into reference-based, point-cloud-based, and multi-modal-based approaches. It also compiles a table of public benchmarks and identifies future directions toward unified, controllable, configurable, high-resolution, and explainable systems.

Load-bearing premise

The load-bearing premise is that the set of papers this survey chose to review is representative of the field and is characterized accurately, since the survey does not document its literature search or inclusion criteria.

Editorial extensions

If this is right

  • Open-set detection, rather than further refinement of closed-set detection, is the direction the survey sees as dominant, so research effort and benchmark design should follow that trend.
  • Because open-set methods learn from normal samples, adopting them reduces dependence on costly defect annotations, which the survey identifies as a major industrial bottleneck.
  • The survey's dataset table gives practitioners a single entry point for choosing benchmarks by modality, task type, and realism, including recent multi-view and multi-illumination sets.
  • From the survey's analysis, a unified framework that can slide between closed-set and open-set regimes as defect data accumulate is a concrete next target.
  • For 3D inspection, reference-based methods work only when high-fidelity CAD models and accurate registration are available, so point-cloud and multi-modal methods are the more robust open-set route.

Reading between the lines

Editorial extensions of the paper, not claims the author makes directly.

  • Editorial: if the taxonomy becomes standard, benchmark suites could be redesigned to test the closed-set-to-open-set continuum explicitly, for instance evaluating one model as labeled defect data accumulate over a product's life cycle.
  • Editorial: the 'first systematic examination' claim is time-sensitive; an earlier survey with the same scope would undercut it, which makes the absence of a documented search protocol worth checking.
  • Editorial: the survey's own distinction suggests a testable prediction: open-set methods that combine 2D texture cues with 3D geometry should outperform single-modality methods on defects that are subtle in both modalities, such as faint dents on reflective surfaces.
  • Editorial: if controllable defect generation matures, the closed-set/open-set boundary itself may blur, because synthetic anomalies could populate training sets that were previously annotation-starved.
Share X Bluesky LinkedIn Reddit HN

Editorial analysis

A structured set of objections, weighed in public.

Desk editor's note, referee report, and a circularity audit.

Referee Report

3 major / 6 minor

Summary. This manuscript presents a survey of industrial defect detection (DD) spanning 2D and 3D modalities and organized around the transition from closed-set to open-set paradigms. It introduces a generic DD system framework, compiles 23 public datasets in Table 3, reviews close-set 2D and 3D methods, and then surveys unsupervised, semi-supervised, few-shot, zero-shot, VLM/MLLM-based open-set methods for 2D and reference-based, point-cloud-based, and multimodal methods for 3D. The paper closes with future directions toward unified frameworks, controllable defect generation, configurable systems, larger datasets, high-resolution detection, high-semantic detection, and explainability. The central contribution claimed is being the first survey to systematically examine the closed-set-to-open-set transition across both 2D and 3D modalities.

Significance. If the coverage and novelty claims are substantiated, this survey would be a valuable reference for the industrial anomaly detection community. The organization around closed-set versus open-set is a sensible lens, and Table 3's dataset compilation is genuinely useful. The taxonomy of 2D open-set methods (regression-, memory-bank-, flow-, discrimination-, semi-supervised, zero/few-shot, VLM/MLLM-based) is broad and mostly consistent with the literature, and the 3D section usefully separates reference-based, point-cloud-based, and multimodal approaches. However, the survey's value as a 'comprehensive' reference depends on the representativeness and accuracy of its 322 cited works, and on a sharp differentiation from prior surveys, neither of which is currently documented.

major comments (3)
  1. [Section 1] The central claim that this is 'the first to systematically examine the transition from closed-set to open-set DD, synthesizing insights across both 2D and 3D modalities' is not adequately differentiated from prior survey [10] (Lin et al., Information Fusion 2025), whose declared scope already covers RGB, 3D, and multimodal unsupervised anomaly detection. The manuscript dismisses [10] in a list of sub-field-specific reviews without specifying what [10] actually covers or what the present survey adds beyond it. Please provide an explicit comparison of scope, taxonomy, and covered tasks that supports the 'first' claim.
  2. [Section 1 (methodology)] Nowhere in the paper is the literature selection process documented: there is no search strategy, database list, time span, inclusion/exclusion criteria, or quality assessment protocol. For a survey whose stated value is comprehensiveness and whose method and dataset coverage are drawn from 322 references, this omission makes the representativeness claim unverifiable. A methodology paragraph should be added (e.g., at the end of Section 1) before the 'comprehensive' claim can be assessed.
  3. [Section 4.1] Section 4.1 ('Close-Set 3D Defect Detection') does not actually survey defect-detection-specific methods: most of the subsection enumerates general point cloud architectures (PointNet [222], PointNet++ [223], RandLA-Net [224], DGCNN [233], Point Transformer [237], etc.) without an industrial defect dataset, task formulation, or evaluation that ties them to DD. If these are intended as background backbone material, the text should say so explicitly; otherwise the survey's coverage of close-set 3D DD is materially overstated and should be rewritten around works that perform defect detection on point clouds.
minor comments (6)
  1. [Section 3.2.4] The method name 'AnomalyAny [220]' does not match the cited reference, which is titled 'Anomaly Anything: Promptable Unseen Visual Anomaly Generation.' Please use a consistent name, and either support the phrase 'a notable first in the field' with comparison to prior generation works (e.g., AnomalyDiffusion, Defect-Gen, AnomalyPainter) or soften it.
  2. [Section 3.1] In 'Addressing Subtle Defects,' the method named 'DWWA-Net [47]' does not match reference [47], which is titled 'DMPDD-Net: An effective defect detection method for aluminum profiles surface defect.' Please correct the citation or the method name.
  3. [References] References [28] and [101] appear to be duplicate entries for the same ECCV 2024 paper ('A unified anomaly synthesis strategy with gradient ascent for industrial anomaly detection and localization'). Please merge and renumber.
  4. [Section 2.2] The sentence 'More recently, the adoption of multimodal data—including RGB images, point clouds, and infrared imagery [20])—has gained prominence' contains an unbalanced closing parenthesis after '[20]'.
  5. [Section 4.1.2] The sentence 'OctNet [252] and SS-CNs [253] exploits sparsity' should read 'OctNet [252] and SS-CNs [253] exploit sparsity.'
  6. [Section 3.2.3] The statement that 'WinCLIP [80] pioneers zero-shot anomaly detection' is internally inconsistent with the earlier 'Vanilla Zero-shot Anomaly Detection' paragraph, which already describes zero-shot methods such as Aota et al. [185]. Please rephrase to 'pioneers VLM-based zero-shot anomaly detection.'

Circularity Check

0 steps flagged · score 0.0 of 10

No circularity: the survey's synthesis is independent of its self-citations; the novelty claim is a factual assertion, not a derivation.

full rationale

This is a survey, not a derivation chain, so most circularity patterns do not apply. The paper's taxonomy (closed-set vs. open-set, 2D vs. 3D) is an organizing scheme applied to independently published methods; it does not fit any parameter to data and then rename the fit as a prediction. Equation (1) states the standard ICP registration objective and cites Besl & McKay [256], an appropriate external source; no result is derived from the equation. The 'first survey' claim is a novelty assertion supported by the paper's characterization of prior reviews [9,10,11,1,12,2]; even if that characterization is contestable (e.g., ref. [10] covers RGB/3D/multimodal unsupervised anomaly detection), a disputed novelty claim is a factual correctness issue, not circularity. The authors' self-citations (e.g., [3,7,13,79,81,117,129,191,209,220,285,287,291]) point to specific methods and datasets, but none is the sole justification for the survey's organizing claims, and the surveyed methods are also independently published and externally described. The absence of documented literature-search criteria weakens the comprehensiveness claim as a transparency matter, but it is not a circular reduction. No load-bearing step reduces by construction to its own input, and no fitted parameter is renamed as a prediction.

Assumptions & free parameters 0 free parameters · 2 assumptions · 0 invented entities

As a literature review, the survey introduces no free parameters or invented entities. It depends on two domain assumptions: the choice of organizing axes and the representativeness/accuracy of the selected literature.

assumptions (2)
  • domain assumption The closed-set vs open-set axis and the 2D vs 3D modality split are the organizing principles for defect detection.
    The entire survey structure and the claimed synthesis rest on this categorization. If another axis, such as supervision level or task granularity, were primary, the survey would be organized differently. This is stated in the abstract and Section 1.
  • domain assumption The cited papers are accurately characterized and the selection of papers is representative of the field.
    The survey provides no explicit inclusion/exclusion criteria or systematic search protocol, so the comprehensiveness claim relies on the authors' choices. This is a load-bearing assumption for a survey claiming to be comprehensive.

how reviews work

0 comments
Cite this review

Pith. "Pith review of A Comprehensive Survey for Real-World Industrial Defect Detection: Challenges, Approaches, and Prospects." pith.science (2026). https://pith.science/paper/IHQHSXOV

@misc{pith2026250713378,
  author       = {Pith},
  title        = {Pith review of: A Comprehensive Survey for Real-World Industrial Defect Detection: Challenges, Approaches, and Prospects},
  year         = {2026},
  howpublished = {\url{https://pith.science/paper/IHQHSXOV}},
  note         = {Machine review of arXiv:2507.13378}
}
read the original abstract

Industrial defect detection is vital for upholding product quality across contemporary manufacturing systems. As the expectations for precision, automation, and scalability intensify, conventional inspection approaches are increasingly found wanting in addressing real-world demands. Notable progress in computer vision and deep learning has substantially bolstered defect detection capabilities across both 2D and 3D modalities. A significant development has been the pivot from closed-set to open-set defect detection frameworks, which diminishes the necessity for extensive defect annotations and facilitates the recognition of novel anomalies. Despite such strides, a cohesive and contemporary understanding of industrial defect detection remains elusive. Consequently, this survey delivers an in-depth analysis of both closed-set and open-set defect detection strategies within 2D and 3D modalities, charting their evolution in recent years and underscoring the rising prominence of open-set techniques. We distill critical challenges inherent in practical detection environments and illuminate emerging trends, thereby providing a current and comprehensive vista of this swiftly progressing field.

Figures

Figures reproduced from arXiv: 2507.13378 by the authors.

Figure 1
Figure 1. Illustration of 2D and 3D defect detection paradigms. Left: 2D detection operates on RGB images to localize surface defects, exemplified using samples from 𝑀2AD [7]. Right: 3D detection leverages geometric representations such as point clouds, with data from MiniShift [13]. Both approaches aim for precise defect localization, as visualized in the bottom row. modalities. We pledge to periodically update this work to … view at source ↗
Figure 2
Figure 2. Organization of this survey. 2.2. Defect Detection Datasets Public datasets have emerged as vital tools for vali￾dating and refining algorithmic performance, significantly expediting the evolution of defect detection models [PITH_FULL_IMAGE:figures/full_fig_p003_2.png] view at source ↗
Figure 3
Figure 3. Overview of a typical industrial defect detection system. The system consists of three main components: (1) Detection Equipment, including mobile platforms (e.g., conveyor belts, robotic arms), light sources (e.g., ring and bar lights), and various sensors (e.g., RGB cameras, depth sensors, laser scanners); (2) Data Processing and Analysis System, where multi-view data are collected to construct multi￾modal datasets… view at source ↗
Figures from the paper (4 more)
Figure 4
Figure 4. Figure 4: Schematic of close-set and open-set DD paradigms. (a) Close-set detection, assuming all defect types are known at training. (b) Unsupervised open-set detection, trained solely on normal samples. (c) Semi-supervised open-set detection, leveraging a limited number of ano…
Figure 5
Figure 5. Figure 5: Timeline of representative methodologies in 2D DD. In recent years, there has been a growing interest in open-set DD, accompanied by the emergence of various subtasks such as semi-supervised DD and zero-/few-shot DD. superior generalization and scalability across diver…
Figure 6
Figure 6. Figure 6: Timeline of representative methodologies in 3D DD. previous 2D defect detection methods. The representative methods are shown in [PITH_FULL_IMAGE:figures/full_fig_p013_6.png]
Figure 7
Figure 7. Figure 7: Representative schemes for 3D open-set DD. (a) Reference-based anomaly detection leverages comparisons with CAD models; (b) Point cloud-based anomaly detection operates directly on 3D geometry to identify irregularities; (c) Multi-modal-based anomaly detection integrat…

Discussion (0). Sign in to comment.

Forward citations

Cited by 1 Pith paper

Reviewed papers in the Pith corpus that reference this work. Sorted by Pith novelty score.

  1. Multi-View Reconstruction with Global Context for 3D Anomaly Detection

    cs.CV 2025-07 conditional novelty 5.0 of 10

    MVR projects high-resolution point clouds into multi-view depth images and reconstructs them with a pre-trained vision transformer, achieving state-of-the-art anomaly detection scores on Real3D-AD.

Reference graph

Works this paper leans on

300 extracted references · 53 canonical work pages · cited by 1 Pith paper

  1. [10]

    Y. Lin, Y. Chang, X. Tong, J. Yu, A. Liotta, G. Huang, W. Song, D.Zeng,Z.Wu,Y.Wang,etal.,Asurveyonrgb,3d,andmultimodal approaches for unsupervised industrial image anomaly detection, Information Fusion (2025) 103139

  2. [3]

    Y. Cao, X. Xu, J. Zhang, Y. Cheng, X. Huang, G. Pang, W. Shen, A survey on visual anomaly detection: Challenge, approach, and prospect, arXiv preprint arXiv:2401.16402 (2024)

  3. [222]

    C. R. Qi, H. Su, K. Mo, L. J. Guibas, Pointnet: Deep learning on point sets for 3d classification and segmentation, in: Proceedings of the IEEE conference on computer vision and pattern recognition, 2017, pp. 652–660

  4. [223]

    C. R. Qi, L. Yi, H. Su, L. J. Guibas, Pointnet++: Deep hierarchical feature learning on point sets in a metric space, Advances in neural information processing systems 30 (2017)

  5. [224]

    Q. Hu, B. Yang, L. Xie, S. Rosa, Y. Guo, Z. Wang, N. Trigoni, A. Markham, Randla-net: Efficient semantic segmentation of large- scale point clouds, in: 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), 2020, pp. 11105–11114

  6. [233]

    Y. Wang, Y. Sun, Z. Liu, S. E. Sarma, M. M. Bronstein, J. M. Solomon, Dynamic graph cnn for learning on point clouds 38 (5) (Oct. 2019)

  7. [237]

    H. Zhao, L. Jiang, J. Jia, P. Torr, V. Koltun, Point transformer, in: 2021 IEEE/CVF International Conference on Computer Vision (ICCV), 2021, pp. 16239–16248. Y. Cheng et al. :Preprint submitted to Elsevier Page 24 of 27 A Comprehensive Survey for Real-World Industrial Defect Detection: Challenge, Approach, and Prospect

  8. [1]

    G. Xie, J. Wang, J. Liu, J. Lyu, Y. Liu, C. Wang, F. Zheng, Y. Jin, Im-iad: Industrial image anomaly detection benchmark in manufac- turing, IEEE Transactions on Cybernetics (2024)

Show all 300 references
  1. [2]

    Y. Gao, X. Li, X. V. Wang, L. Wang, L. Gao, A review on recent advancesinvision-baseddefectrecognitiontowardsindustrialintel- ligence, Journal of Manufacturing Systems 62 (2022) 753–766

  2. [4]

    X. Tao, D. Zhang, W. Ma, Z. Hou, Z. Lu, C. Adak, Unsupervised Anomaly Detection for Surface Defects With Dual-Siamese Net- work, IEEE Transactions on Industrial Informatics 18 (11) (2022) 7707–7717

  3. [5]

    Bergmann, K

    P. Bergmann, K. Batzner, M. Fauser, D. Sattlegger, C. Steger, The MVTec anomaly detection dataset: A comprehensive real-world datasetforunsupervisedanomalydetection,InternationalJournalof Computer Vision 129 (4) (2021) 1038–1059

  4. [6]

    C. Wang, W. Zhu, B.-B. Gao, Z. Gan, J. Zhang, Z. Gu, S. Qian, M. Chen, L. Ma, Real-iad: A real-world multi-view dataset for benchmarking versatile industrial anomaly detection, in: Proceed- ings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2024, pp. 2...

  5. [7]

    Y. Cao, Y. Cheng, X. Xu, Y. Zhang, Y. Sun, Y. Tan, Y. Zhang, X. Huang, W. Shen, Visual anomaly detection under com- plex view-illumination interplay: A large-scale benchmark, in: https://arxiv.org/abs/2505.10996, 2025

  6. [8]

    Y. Zou, J. Jeong, L. Pemula, D. Zhang, O. Dabeer, Spot-the- difference self-supervised pre-training for anomaly detection and segmentation, in: European Conference on Computer Vision, Springer, 2022, pp. 392–408

  7. [9]

    X. Tao, X. Gong, X. Zhang, S. Yan, C. Adak, Deep learning for unsupervised anomaly localization in industrial images: A survey, IEEE Transactions on Instrumentation and Measurement 71 (2022) 1–21

  8. [11]

    Y. Liu, J. Liu, C. Li, R. Xi, W. Li, L. Cao, J. Wang, L. T. Yang, J. Yuan, W. Zhou, Anomaly detection and generation with diffusion models: A survey, arXiv preprint arXiv:2506.09368 (2025)

  9. [12]

    Diers, C

    J. Diers, C. Pigorsch, A survey of methods for automated quality control based on images, International Journal of Computer Vision 131 (10) (2023) 2553–2581

  10. [13]

    Cheng, Y

    Y. Cheng, Y. Sun, H. Zhang, W. Shen, Y. Cao, Towards high- resolution 3d anomaly detection: A scalable dataset and real- time framework for subtle industrial defects, arXiv preprint arXiv:2507.07435 (2025)

  11. [14]

    Dagm 2007, https://hci.iwr.uni-heidelberg.de/node/3616 (2017)

  12. [15]

    Bergmann, X

    P. Bergmann, X. Jin, D. Sattlegger, C. Steger, The mvtec 3d-ad dataset for unsupervised 3d anomaly detection and localization, in: Proceedingsofthe17thInternationalJointConferenceonComputer Vision, Imaging and Computer Graphics Theory and Applications, SCITEPRESS-Science and T...

  13. [16]

    W. Zhu, L. Wang, Z. Zhou, C. Wang, Y. Pan, R. Zhang, Z. Chen, L. Cheng, B.-B. Gao, J. Zhang, et al., Real-iad d3: A real-world 2d/pseudo-3d/3d dataset for industrial anomaly detection, Proceed- ings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (2025)

  14. [17]

    Mishra, R

    P. Mishra, R. Verk, D. Fornasier, C. Piciarelli, G. L. Foresti, Vt- adl: A vision transformer network for image anomaly detection and localization, in: 2021 IEEE 30th International Symposium on Industrial Electronics (ISIE), IEEE, 2021, pp. 01–06

  15. [18]

    J. Liu, G. Xie, X. Li, J. Wang, Y. Liu, C. Wang, F. Zheng, et al., Real3d-ad: A dataset of point cloud anomaly detection, in: Thirty- seventh Conference on Neural Information Processing Systems Datasets and Benchmarks Track, Vol. 36, 2024. Y. Cheng et al. :Preprint submitted t...

  16. [19]

    W. Li, X. Xu, Towards scalable 3d anomaly detection and localiza- tion: A benchmark via 3d anomaly synthesis and a self-supervised learningnetwork,2024IEEE/CVFConferenceonComputerVision and Pattern Recognition (CVPR) (2024)

  17. [20]

    W. Li, B. Zheng, X. Xu, J. Gan, F. Lu, X. Li, N. Ni, Z. Tian, X. Huang, S. Gao, et al., Multi-sensor object anomaly detection: Unifyingappearance,geometry,andinternalproperties,Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (2025)

  18. [21]

    K. Zhou, Y. Cao, T. Kim, H. Zhao, H. Dong, K. M. Ting, Y. Zhu, Rad: A dataset and benchmark for real-life anomaly detection with robotic observations, arXiv preprint arXiv:2410.00713 (2024)

  19. [22]

    Bonfiglioli, M

    L. Bonfiglioli, M. Toschi, D. Silvestri, N. Fioraio, D. De Gregorio, The eyecandies dataset for unsupervised multimodal anomaly de- tectionandlocalization,in:ProceedingsoftheAsianConferenceon Computer Vision, 2022, pp. 3586–3602

  20. [23]

    S.Jezek,M.Jonak,R.Burget,P.Dvorak,M.Skotak,Deeplearning- based defect detection of metal parts: evaluating current methods in complex conditions, in: 2021 13th International congress on ultra modern telecommunications and control systems and workshops (ICUMT), IEEE, 2021, pp. 66–71

  21. [24]

    Bergmann, K

    P. Bergmann, K. Batzner, M. Fauser, D. Sattlegger, C. Steger, Beyond dents and scratches: Logical constraints in unsupervised anomaly detection and localization, International Journal of Com- puter Vision 130 (4) (2022) 947–969

  22. [25]

    Q. Zhou, W. Li, L. Jiang, G. Wang, G. Zhou, S. Zhang, H. Zhao, Pad: A dataset andbenchmark for pose-agnostic anomaly detection, Advances in Neural Information Processing Systems 36 (2023) 44558–44571

  23. [26]

    Q.Zhao,Y.Wang,B.Wang,J.Lin,S.Yan,W.Song,A.Liotta,J.Yu, S. Gao, W. Zhang, Msc-ad: A multiscene unsupervised anomaly detection dataset for small defect detection of casting surface, IEEE Transactions on Industrial Informatics 20 (4) (2023) 6041–6052

  24. [27]

    H. Bai, S. Mou, T. Likhomanenko, R. G. Cinbis, O. Tuzel, P. Huang, J. Shan, J. Shi, M. Cao, Vision datasets: A benchmark for vision-basedindustrialinspection,arXivpreprintarXiv:2306.07890 (2023)

  25. [28]

    Q. Chen, H. Luo, C. Lv, Z. Zhang, A unified anomaly synthesis strategywithgradientascentforindustrialanomalydetectionandlo- calization, in: European Conference on Computer Vision, Springer, 2024, pp. 37–54

  26. [29]

    17754–17762

    A.Baitieva,D.Hurych,V.Besnier,O.Bernard,Supervisedanomaly detection for complex industrial images, in: Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recogni- tion, 2024, pp. 17754–17762

  27. [30]

    E. Yang, P. Xing, H. Sun, W. Guo, Y. Ma, Z. Li, D. Zeng, 3cad: A large-scale real-world 3c product dataset for unsupervised anomaly detection, in: Proceedings of the AAAI Conference on Artificial Intelligence, Vol. 39, 2025, pp. 9175–9183

  28. [31]

    Heckler-Kram, J.-H

    L. Heckler-Kram, J.-H. Neudeck, U. Scheler, R. König, C. Ste- ger, The mvtec ad 2 dataset: Advanced scenarios for unsupervised anomaly detection, arXiv preprint arXiv:2503.21622 (2025)

  29. [32]

    L.Fan,D.Fan,Z.Hu,Y.Ding,D.Di,K.Yi,M.Pagnucco,Y.Song, Manta: A large-scale multi-view and visual-text anomaly detection dataset for tiny objects, Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (2025)

  30. [33]

    Ameri, C.-C

    R. Ameri, C.-C. Hsu, S. S. Band, A systematic review of deep learningapproachesforsurfacedefectdetectioninindustrialapplica- tions,EngineeringApplicationsofArtificialIntelligence130(2024) 107717

  31. [34]

    Krizhevsky, I

    A. Krizhevsky, I. Sutskever, G. E. Hinton, Imagenet classification with deep convolutional neural networks, Communications of the ACM 60 (6) (2017) 84âĂŞ90

  32. [35]

    Girshick, Fast r-cnn, in: Proceedings of the IEEE international conference on computer vision, 2015, pp

    R. Girshick, Fast r-cnn, in: Proceedings of the IEEE international conference on computer vision, 2015, pp. 1440–1448

  33. [36]

    S. Ren, K. He, R. Girshick, J. Sun, Faster r-cnn: Towards real- time object detection with region proposal networks, IEEE Trans- actions on Pattern Analysis and Machine Intelligence 39 (6) (2017) 1137âĂŞ1149

  34. [37]

    779âĂŞ788

    J.Redmon,S.Divvala,R.Girshick,A.Farhadi,Youonlylookonce: Unified, real-time object detection, in: 2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), IEEE, 2016, p. 779âĂŞ788

  35. [38]

    A. Wang, H. Chen, L. Liu, K. Chen, Z. Lin, J. Han, et al., Yolov10: Real-timeend-to-endobjectdetection,AdvancesinNeuralInforma- tion Processing Systems 37 (2024) 107984–108011

  36. [39]

    Dosovitskiy, L

    A. Dosovitskiy, L. Beyer, A. Kolesnikov, D. Weissenborn, X. Zhai, T. Unterthiner, M. Dehghani, M. Minderer, G. Heigold, S. Gelly, J. Uszkoreit, N. Houlsby, An image is worth 16x16 words: Trans- formers for image recognition at scale, in: 9th International Con- ference on Learn...

  37. [40]

    M.Oquab,T.Darcet,T.Moutakanni,H.Vo,M.Szafraniec,V.Khali- dov,P.Fernandez,D.Haziza,F.Massa,A.El-Nouby,etal.,Dinov2: Learning robust visual features without supervision, arXiv preprint arXiv:2304.07193 (2023)

  38. [41]

    L. Gao, J. Zhang, C. Yang, Y. Zhou, Cas-vswin transformer: A variant swin transformer for surface-defect detection, Computers in Industry 140 (2022) 103689

  39. [42]

    J. Liu, H. Zhao, Z. Chen, Q. Wang, X. Shen, H. Zhang, A dynamic weights-based wavelet attention neural network for defect detec- tion, IEEE Transactions on Neural Networks and Learning Systems 35 (11) (2024) 16211âĂŞ16221

  40. [43]

    J. Yi, J. Mao, H. Zhang, Z. Tao, J. Yu, W. Peng, K. Zeng, Y. Wang, A novel transmission line inspection method based on the shape- aware features refinement network, IEEE/ASME Transactions on Mechatronics (2025) 1–12

  41. [44]

    J. Tang, Z. Wang, H. Zhang, H. Li, P. Wu, N. Zeng, A lightweight surface defect detection framework combined with dual-domain attentionmechanism,ExpertSystemswithApplications238(2024) 121726

  42. [45]

    M. Yuan, Y. Zhou, X. Ren, H. Zhi, J. Zhang, H. Chen, Yolo-hmc: An improved method for pcb surface defect detection, IEEE Trans- actions on Instrumentation and Measurement 73 (2024) 1âĂŞ11

  43. [46]

    B. Su, H. Chen, Z. Zhou, Baf-detector: An efficient cnn-based detectorforphotovoltaiccelldefectdetection,IEEETransactionson Industrial Electronics 69 (3) (2022) 3161âĂŞ3171

  44. [47]

    T. Sui, J. Wang, Dmpdd-net: An effective defect detection method for aluminum profiles surface defect, IEEE Transactions on Instru- mentation and Measurement 74 (2025) 1âĂŞ13

  45. [48]

    L. Shao, E. Zhang, Q. Ma, M. Li, Pixel-wise semisupervised fabric defect detection method combined with multitask mean teacher, IEEE Transactions on Instrumentation and Measurement 71 (2022) 1âĂŞ11

  46. [49]

    Huang, A

    L. Huang, A. Gong, Surface defect detection for no-service rails with skeleton-aware accurate and fast network, IEEE Transactions on Industrial Informatics 20 (3) (2024) 4571âĂŞ4581

  47. [50]

    Y.He,K.Song,Q.Meng,Y.Yan,Anend-to-endsteelsurfacedefect detection approach via fusing multiple hierarchical features, IEEE Transactions on Instrumentation and Measurement 69 (4) (2020) 1493âĂŞ1504

  48. [51]

    Zhang, J

    L. Zhang, J. Chen, J. Chen, Z. Wen, X. Zhou, Ldd-net: Lightweight printed circuit board defect detection network fusing multi-scale features, Engineering Applications of Artificial Intelligence 129 (2024) 107628

  49. [52]

    R. Liu, M. Huang, Z. Gao, Z. Cao, P. Cao, Msc-dnet: An efficient detector with multi-scale context for defect detection on strip steel surface, Measurement 209 (2023) 112467

  50. [53]

    J. Zhu, G. He, P. Zhou, Mfnet: A novel multilevel feature fusion network with multibranch structure for surface defect detection, IEEE Transactions on Instrumentation and Measurement 72 (2023) 1âĂŞ11

  51. [54]

    Y. Peng, F. Xia, C. Zhang, J. Mao, Deformation feature extraction and double attention feature pyramid network for bearing surface defectsdetection,IEEETransactionsonIndustrialInformatics20(6) (2024) 9048âĂŞ9058. Y. Cheng et al. :Preprint submitted to Elsevier Page 19 of 27 A ...

  52. [55]

    Wang, C.-Z

    G.-Q. Wang, C.-Z. Zhang, M.-S. Chen, Y. Lin, X.-H. Tan, Y.- X. Kang, Q. Wang, W.-D. Zeng, W.-W. Zhao, A high-accuracy and lightweight detector based on a graph convolution network for stripsurfacedefectdetection,AdvancedEngineeringInformatics59 (2024) 102280

  53. [56]

    Y. Cao, D. Pang, Q. Zhao, Y. Yan, Y. Jiang, C. Tian, F. Wang, J. Li, Improved yolov8-gd deep learning model for defect detection inelectroluminescenceimagesofsolarphotovoltaicmodules,Engi- neering Applications of Artificial Intelligence 131 (2024) 107866

  54. [57]

    A. G. Howard, M. Zhu, B. Chen, D. Kalenichenko, W. Wang, T. Weyand, M. Andreetto, H. Adam, Mobilenets: Efficient convolu- tionalneuralnetworksformobilevisionapplications,arXivpreprint arXiv:1704.04861 (2017)

  55. [58]

    W.Zhou,J.Hong,X.Ran,W.Yan,Q.Jiang,Dsanet-kd:Dualseman- ticapproximationnetworkviaknowledgedistillationforrailsurface defect detection, IEEE Transactions on Intelligent Transportation Systems 25 (10) (2024) 13849âĂŞ13862

  56. [59]

    H.Dong,K.Song,Y.He,J.Xu,Y.Yan,Q.Meng,Pga-net:Pyramid feature fusion and global context attention network for automated surface defect detection, IEEE Transactions on Industrial Informat- ics 16 (12) (2020) 7448âĂŞ7458

  57. [60]

    BoÅ¿iÄŊ, D

    J. BoÅ¿iÄŊ, D. Tabernik, D. SkoÄŊaj, Mixed supervision for surface-defect detection: From weakly to fully supervised learning, Computers in Industry 129 (2021) 103459

  58. [61]

    Zhang, L

    H. Zhang, L. Jiang, C. Li, Cs-resnet: Cost-sensitive residual con- volutional neural network for pcb cosmetic defect detection, Expert Systems with Applications 185 (2021) 115673

  59. [62]

    Q. Wan, L. Gao, X. Li, Logit inducing with abnormality capturing forsemi-supervisedimageanomalydetection,IEEETransactionson Instrumentation and Measurement 71 (2022) 1âĂŞ12

  60. [63]

    Q. Wan, Y. Cao, L. Gao, X. Li, Y. Gao, Deep feature contrasting for industrial image anomaly segmentation, IEEE Transactions on Instrumentation and Measurement 73 (2024) 1âĂŞ11

  61. [64]

    S.Ma,K.Song,M.Niu,H.Tian,Y.Wang,Y.Yan,Shape-consistent one-shot unsupervised domain adaptation for rail surface defect segmentation, IEEE Transactions on Industrial Informatics 19 (9) (2023) 9667âĂŞ9679

  62. [65]

    C.Sun,L.Gao,X.Li,P.Zheng,Y.Gao,Anincrementalknowledge learning framework for continuous defect detection, IEEE Transac- tions on Instrumentation and Measurement 73 (2024) 1âĂŞ11

  63. [66]

    Z. Zhao, J. Wang, Q. Tao, A. Li, Y. Chen, An unknown wafer surface defect detection approach based on incremental learning for reliability analysis, Reliability Engineering & System Safety 244 (2024) 109966

  64. [67]

    J. Liu, C. Wang, H. Su, B. Du, D. Tao, Multistage gan for fabric defect detection, IEEE Transactions on Image Processing 29 (2020) 3388âĂŞ3400

  65. [68]

    Y.Duan,Y.Hong,L.Niu,L.Zhang,Few-shotdefectimagegenera- tionviadefect-awarefeaturemanipulation,ProceedingsoftheAAAI Conference on Artificial Intelligence 37 (1) (2023) 571âĂŞ578

  66. [69]

    T. Hu, J. Zhang, R. Yi, Y. Du, X. Chen, L. Liu, Y. Wang, C. Wang, Anomalydiffusion: Few-shot anomaly image generation with dif- fusion model, Proceedings of the AAAI Conference on Artificial Intelligence 38 (8) (2024) 8526âĂŞ8534

  67. [70]

    S.Yang,Z.Chen,P.Chen,X.Fang,Y.Liang,S.Liu,Y.Chen,Defect Spectrum: A Granular Look of Large-Scale Defect Datasets with RichSemantics,SpringerNatureSwitzerland,2024,p.187âĂŞ203

  68. [71]

    Gui, B.-B

    G. Gui, B.-B. Gao, J. Liu, C. Wang, Y. Wu, Few-Shot Anomaly- Driven Generation for Anomaly Classification and Segmentation, Springer Nature Switzerland, 2024, p. 210âĂŞ226

  69. [72]

    Y. Jin, J. Peng, Q. He, T. Hu, H. Chen, J. Wu, W. Zhu, M. Chi, J. Liu, Y. Wang, et al., Dualanodiff: Dual-interrelated diffusion model for few-shot anomaly image generation, arXiv preprint arXiv:2408.13509 (2024)

  70. [73]

    J.Song,D.Park,K.Baek,S.Lee,J.Choi,E.Kim,S.Yoon,Defect- fill: Realistic defect generation with inpainting diffusion model for visual inspection, arXiv preprint arXiv:2503.13985 (2025)

  71. [74]

    X. Xu, Y. Wang, Y. Huang, J. Liu, X. Lei, G. Xie, G. Jiang, Z. Lu, A survey on industrial anomalies synthesis, arXiv preprint arXiv:2502.16412 (2025)

  72. [75]

    Y.-G.Yoon,S.-L.Lee,C.-W.Chung,S.-H.Kim,Aneffectivedefect inspection system for polarized film images using image segmen- tation and template matching techniques, Computers & Industrial Engineering 55 (3) (2008) 567–583

  73. [76]

    Zhang, Y

    H. Zhang, Y. Chen, B. Liu, X. Guan, X. Le, Soft matching network with application to defect inspection, Knowledge-Based Systems 225 (2021) 107045

  74. [77]

    Bergmann, M

    P. Bergmann, M. Fauser, D. Sattlegger, C. Steger, Uninformed Students: Student-Teacher Anomaly Detection With Discriminative Latent Embeddings, IEEE, Seattle, WA, USA, June 13-19, 2020, 2020, pp. 4182–4191

  75. [78]

    24490–24499

    X.Yao,R.Li,J.Zhang,J.Sun,C.Zhang,ExplicitBoundaryGuided Semi-Push-Pull Contrastive Learning for Supervised Anomaly De- tection,IEEE,Vancouver,BC,Canada,June17-24,2023,2023,pp. 24490–24499

  76. [79]

    Y.Cao,X.Xu,C.Sun,L.Gao,W.Shen,BiaS:IncorporatingBiased Knowledge to Boost Unsupervised Image Anomaly Localization, IEEE Transactions on Systems, Man, and Cybernetics: Systems 54 (4) (2024) 2342–2353

  77. [80]

    Jeong, Y

    J. Jeong, Y. Zou, T. Kim, D. Zhang, A. Ravichandran, O. Dabeer, WinCLIP: Zero-/Few-Shot Anomaly Classification and Segmenta- tion, IEEE, Vancouver, BC, Canada, June 17-24, 2023, 2023, pp. 19606–19616

  78. [81]

    Y. Cao, J. Zhang, L. Frittoli, Y. Cheng, W. Shen, G. Boracchi, Adaclip: Adapting clip with hybrid learnable prompts for zero-shot anomaly detection, in: European Conference on Computer Vision, Springer, 2024, pp. 55–72

  79. [82]

    Q. Zhou, G. Pang, Y. Tian, S. He, J. Chen, AnomalyCLIP: Object- agnostic Prompt Learning for Zero-shot Anomaly Detection, in: International Conference on Learning Representations, 2023

  80. [83]

    X. Xie, M. Mirmehdi, TEXEMS: Texture Exemplars for Defect Detection on Random Textured Surfaces, IEEE Transactions on PatternAnalysisandMachineIntelligence29(8)(2007)1454–1464

  81. [84]

    C.-L. Li, K. Sohn, J. Yoon, T. Pfister, CutPaste: Self-Supervised Learning for Anomaly Detection and Localization, IEEE, Virtual Event, June 19-25, 2021, 2021, pp. 9659–9669

  82. [85]

    H. M. SchlÃijter, J. Tan, B. Hou, B. Kainz, Natural synthetic anomalies for self-supervised anomaly detection and localization, in: European Conference on Computer Vision, Springer, Tel Aviv, Israel, October 23-27, 2022, 2022, pp. 474–489

  83. [86]

    K. He, X. Zhang, S. Ren, J. Sun, Deep residual learning for image recognition, in: 2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), IEEE, 2016

  84. [87]

    J.Guo,S.Lu,W.Zhang,H.Li,Dinomaly:TheLessIsMorePhiloso- phyinMulti-ClassUnsupervisedAnomalyDetection,in:IEEE/CVF Conference on Computer Vision and Pattern Recognition, arXiv, 2025, arXiv:2405.14325 [cs]

  85. [88]

    Batzner, L

    K. Batzner, L. Heckler, R. KÃűnig, EfficientAD: Accurate Vi- sual Anomaly Detection at Millisecond-Level Latencies, in: 2024 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV), IEEE, Waikoloa, HI, USA, 2024, pp. 127–137

  86. [89]

    S. Lee, S. Lee, B. C. Song, CFA: Coupled-Hypersphere-Based Fea- ture Adaptation for Target-Oriented Anomaly Localization, IEEE Access 10 (2022) 78446–78454

  87. [90]

    S.Lyu,D.Mo,W.K.Wong,REB:Reducingbiasesinrepresentation for industrial anomaly detection, Knowledge-Based Systems 290 (2024) 111563

  88. [91]

    J.Guo,S.Lu,L.Jia,W.Zhang,H.Li,ReContrast:Domain-Specific AnomalyDetectionviaContrastiveReconstruction,in:Advancesin Neural Information Processing Systems 36: Annual Conference on Neural Information Processing Systems 2023, NeurIPS 2023, New Orleans, LA, USA, December 10 - 16, ...

  89. [92]

    S. Wei, J. Jiang, X. Xu, UniNet: A Contrastive Learning-guided Unified Framework with Feature Selection for Anomaly Detection, Y. Cheng et al. :Preprint submitted to Elsevier Page 20 of 27 A Comprehensive Survey for Real-World Industrial Defect Detection: Challenge, Approach, ...

  90. [93]

    Y.Cao,Q.Wan,W.Shen,L.Gao,Informativeknowledgedistillation for image anomaly segmentation, Knowledge-Based Systems 248 (2022) 108846

  91. [94]

    H. Deng, X. Li, Anomaly Detection via Reverse Distillation from One-Class Embedding, IEEE, New Orleans, LA, USA, June 18-24, 2022, 2022, pp. 9727–9736

  92. [95]

    K. Roth, L. Pemula, J. Zepeda, B. Scholkopf, T. Brox, P. Gehler, Towards Total Recall in Industrial Anomaly Detection, IEEE, New Orleans, LA, USA, June 18-24, 2022, 2022, pp. 14298–14308

  93. [96]

    Q. Wan, L. Gao, X. Li, L. Wen, Industrial Image Anomaly Local- ization Based on Gaussian Clustering of Pretrained Feature, IEEE Transactions on Industrial Electronics 69 (6) (2022) 6182–6192

  94. [97]

    Gudovskiy, S

    D. Gudovskiy, S. Ishizaka, K. Kozuka, CFLOW-AD: Real-Time UnsupervisedAnomalyDetectionwithLocalizationviaConditional Normalizing Flows, IEEE, Waikoloa, HI, USA, January 3-8, 2022, 2022, pp. 1819–1828

  95. [98]

    Y. Zhou, X. Xu, J. Song, F. Shen, H. T. Shen, MSFlow: Multi- scale Flow-Based Framework for Unsupervised Anomaly Detec- tion, IEEE Transactions on Neural Networks and Learning Systems (2024) 1–14

  96. [99]

    H.Yao,W.Luo,W.Zhang,X.Zhang,Z.Qiang,D.Luo,LocalâĂŞ- global normality learning and discrepancy normalizing flow for unsupervisedimageanomalydetection,EngineeringApplicationsof Artificial Intelligence 137 (2024) 109235

  97. [100]

    20402–20411

    Z.Liu,Y.Zhou,Y.Xu,Z.Wang,SimpleNet:ASimpleNetworkfor Image Anomaly Detection and Localization, IEEE, Vancouver, BC, Canada, June 17-24, 2023, 2023, pp. 20402–20411

  98. [101]

    Q. Chen, H. Luo, C. Lv, Z. Zhang, A unified anomaly synthesis strategy with gradient ascent for industrial anomaly detection and localization, Springer, Milan, Italy, September 29-October 4, 2024, 2025, pp. 37–54

  99. [102]

    G. Wang, S. Han, E. Ding, D. Huang, Student-Teacher Feature PyramidMatchingforAnomalyDetection,in:32ndBritishMachine Vision Conference 2021, BMVC 2021, Online, November 22-25, 2021, BMVA Press, 2021, p. 306

  100. [103]

    Salehi, N

    M. Salehi, N. Sadjadi, S. Baselizadeh, M. H. Rohban, H. R. Rabiee, Multiresolution Knowledge Distillation for Anomaly Detection, IEEE, Virtual Event, June 19-25, 2021, 2021, pp. 14897–14907

  101. [104]

    Q. Wan, L. Gao, X. Li, L. Wen, Unsupervised Image Anomaly Detection and Segmentation Based on Pretrained Feature Mapping, IEEE Transactions on Industrial Informatics 19 (3) (2023) 2330– 2339

  102. [105]

    Q. Wan, Y. Cao, L. Gao, W. Shen, X. Li, Position Encoding En- hanced Feature Mapping for Image Anomaly Detection, in: 2022 IEEE 18th International Conference on Automation Science and Engineering (CASE), IEEE, Mexico City, Mexico, 2022, pp. 876– 881

  103. [106]

    Y.Shi,J.Yang,Z.Qi,Unsupervisedanomalysegmentationviadeep feature reconstruction, Neurocomputing 424 (2021) 9–22

  104. [107]

    Rudolph, T

    M. Rudolph, T. Wehrbein, B. Rosenhahn, B. Wandt, Asymmetric student-teacher networks for industrial anomaly detection, in: Pro- ceedings of the IEEE/CVF winter conference on applications of computer vision, 2023, pp. 2592–2602

  105. [108]

    L.Chen,Z.You,N.Zhang,J.Xi,X.Le,UTRAD:Anomalydetection and localization with U-Transformer, Neural Networks 147 (2022) 53–62

  106. [109]

    Z. You, L. Cui, Y. Shen, K. Yang, X. Lu, Y. Zheng, X. Le, A UnifiedModelforMulti-classAnomalyDetection,Vol.35,NeurIPS Foundation, New Orleans, LA, USA, November 28-December 9, 2022, 2022, pp. 4571–4584

  107. [110]

    H. He, J. Zhang, H. Chen, X. Chen, Z. Li, X. Chen, Y. Wang, C. Wang, L. Xie, A Diffusion-Based Framework for Multi-Class Anomaly Detection, Proceedings of the AAAI Conference on Ar- tificial Intelligence 38 (8) (2024) 8472–8480

  108. [111]

    X. Wang, W. Li, X. He, MTDiff: Visual anomaly detection with multi-scalediffusionmodels,Knowledge-BasedSystems302(2024) 112364

  109. [112]

    Beizaee, G

    F. Beizaee, G. A. Lodygensky, C. Desrosiers, J. Dolz, Correcting Deviations from Normality: A Reformulated Diffusion Model for Multi-Class Unsupervised Anomaly Detection, in: IEEE/CVF Con- ference on Computer Vision and Pattern Recognition, arXiv, 2025, arXiv:2503.19357 [cs]

  110. [113]

    H. He, Y. Bai, J. Zhang, Q. He, H. Chen, Z. Gan, C. Wang, X. Li, G. Tian, L. Xie, MambaAD: Exploring State Space Models for Multi-class Unsupervised Anomaly Detection, in: Advances in Neural Information Processing Systems, 2024

  111. [114]

    Y. Yan, D. Wang, G. Zhou, Q. Chen, Unsupervised Anomaly Segmentation Via Multilevel Image Reconstruction and Adaptive Attention-Level Transition, IEEE Transactions on Instrumentation and Measurement 70 (2021) 1–12

  112. [115]

    Y.Liang,J.Zhang,S.Zhao,R.Wu,Y.Liu,S.Pan,Omni-Frequency Channel-Selection Representations for Unsupervised Anomaly De- tection, IEEE Transactions on Image Processing 32 (2023) 4327– 4340

  113. [116]

    H. Xu, Y. Zhang, X. Chen, C. Jing, L. Sun, Y. Huang, X. Ding, AFSC: Adaptive Fourier Space Compression for Anomaly Detec- tion, IEEE Transactions on Industrial Informatics (2024) 1–11

  114. [117]

    Y. Cao, X. Xu, Z. Liu, W. Shen, Collaborative Discrepancy Opti- mization for Reliable Image Anomaly Localization, IEEE Transac- tions on Industrial Informatics 19 (11) (2023) 10674–10683

  115. [118]

    D. Gong, L. Liu, V. Le, B. Saha, M. R. Mansour, S. Venkatesh, A. Van Den Hengel, Memorizing Normality to Detect Anomaly: Memory-AugmentedDeepAutoencoderforUnsupervisedAnomaly Detection, IEEE, Seoul, Korea, October 27-November 2, 2019, 2019, pp. 1705–1714

  116. [119]

    W. Liu, H. Chang, B. Ma, S. Shan, X. Chen, Diversity-Measurable Anomaly Detection, in: 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), IEEE, Vancouver, BC, Canada, 2023, pp. 12147–12156

  117. [120]

    P. Xing, Z. Li, Visual Anomaly Detection via Partition Memory Bank Module and Error Estimation, IEEE Transactions on Circuits and Systems for Video Technology 33 (8) (2023) 3596–3607

  118. [121]

    6424–6435

    H.Guo,L.Ren,J.Fu,Y.Wang,Z.Zhang,C.Lan,H.Wang,X.Hou, Template-guidedHierarchicalFeatureRestorationforAnomalyDe- tection, in: 2023 IEEE/CVF International Conference on Computer Vision (ICCV), IEEE, Paris, France, 2023, pp. 6424–6435

  119. [122]

    W.Luo,H.Yao,W.Yu,Template-basedfeatureaggregationnetwork for industrial anomaly detection, Engineering Applications of Arti- ficial Intelligence 131 (2024) 107810

  120. [123]

    36, 2023, pp

    R.Lu,Y.Wu,L.Tian,D.Wang,B.Chen,X.Liu,R.Hu,Hierarchical vector quantized transformer for multi-class unsupervised anomaly detection, in: Advances in Neural Information Processing Systems, Vol. 36, 2023, pp. 8487–8500

  121. [124]

    Z. Gu, L. Liu, X. Chen, R. Yi, J. Zhang, Y. Wang, C. Wang, A.Shu,G.Jiang,L.Ma,RememberingNormality:Memory-guided KnowledgeDistillationforUnsupervisedAnomalyDetection,IEEE, Paris, France, October 1-6, 2023, 2023, pp. 16355–16363

  122. [125]

    W. Luo, H. Yao, W. Yu, Normal Reference Attention and Defective Feature Perception Network for Surface Defect Detection, IEEE Transactions on Instrumentation and Measurement 72 (2023) 1–14

  123. [126]

    X. Yao, R. Li, Z. Qian, Y. Luo, C. Zhang, Focus the Discrepancy: Intra-andInter-CorrelationLearningforImageAnomalyDetection, in: 2023 IEEE/CVF International Conference on Computer Vision (ICCV), IEEE, Paris, France, 2023, pp. 6780–6790

  124. [127]

    H.Yao,Y.Cao,W.Luo,W.Zhang,W.Yu,W.Shen,Priornormality prompt transformer for multiclass industrial image anomaly detec- tion, IEEE Transactions on Industrial InformaticsPublisher: IEEE (2024)

  125. [128]

    L. He, Z. Jiang, J. Peng, W. Zhu, L. Liu, Q. Du, X. Hu, M. Chi, Y. Wang, C. Wang, Learning Unified Reference Representation for UnsupervisedMulti-classAnomalyDetection,in:EuropeanConfer- ence on Computer Vision, Springer, 2024, pp. 216–232

  126. [129]

    W. Luo, Y. Cao, H. Yao, X. Zhang, J. Lou, Y. Cheng, W. Shen, W. Yu, Exploring Intrinsic Normal Prototypes within a Single Y. Cheng et al. :Preprint submitted to Elsevier Page 21 of 27 A Comprehensive Survey for Real-World Industrial Defect Detection: Challenge, Approach, and P...

  127. [130]

    T. D. Tien, A. T. Nguyen, N. H. Tran, T. D. Huy, S. T. Duong, C.D.T.Nguyen,S.Q.H.Truong,RevisitingReverseDistillationfor Anomaly Detection, in: 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), IEEE, Vancouver, BC, Canada, 2023, pp. 24511–24520

  128. [131]

    Y. Zhao, OmniAL: A Unified CNN Framework for Unsupervised Anomaly Localization, in: 2023 IEEE/CVF Conference on Com- puter Vision and Pattern Recognition (CVPR), IEEE, Vancouver, BC, Canada, 2023, pp. 3924–3933

  129. [132]

    Zhang, S

    X. Zhang, S. Li, X. Li, P. Huang, J. Shan, T. Chen, DeSTSeg: Segmentation Guided Denoising Student-Teacher for Anomaly De- tection, in: 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), IEEE, Vancouver, BC, Canada, 2023, pp. 3914–3923

  130. [133]

    Jiang, Y

    Y. Jiang, Y. Cao, W. Shen, A masked reverse knowledge distilla- tion method incorporating global and local information for image anomaly detection, Knowledge-Based Systems 280 (2023) 110982

  131. [134]

    Q. Zhou, S. He, H. Liu, T. Chen, J. Chen, Pull & Push: Leverag- ing Differential Knowledge Distillation for Efficient Unsupervised AnomalyDetectionandLocalization,IEEETransactionsonCircuits and Systems for Video Technology 33 (5) (2023) 2176–2189

  132. [135]

    L.P.StrÃďter,M.Salehi,E.Gavves,C.G.Snoek,Y.M.Asano,Gen- eralad: Anomaly detection across domains by attending to distorted features, in: European Conference on Computer Vision, Springer, 2024, pp. 448–465

  133. [136]

    P. Xing, H. Tang, J. Tang, Z. Li, ADPS: Asymmetric Distillation PostsegmentationforImageAnomalyDetection,IEEETransactions on Neural Networks and Learning Systems (2024) 1–14

  134. [137]

    Zhang, M

    X. Zhang, M. Xu, X. Zhou, RealNet: A Feature Selection Net- work with Realistic Synthetic Anomaly for Anomaly Detection, in: IEEE/CVF Conference on Computer Vision and Pattern Recogni- tion,CVPR2024,Seattle,WA,USA,June16-22,2024,IEEE,2024, pp. 16699–16708

  135. [138]

    Madan, N.-C

    N. Madan, N.-C. Ristea, R. T. Ionescu, K. Nasrollahi, F. S. Khan, T. B. Moeslund, M. Shah, Self-Supervised Masked Convolutional Transformer Block for Anomaly Detection, IEEE Transactions on Pattern Analysis and Machine Intelligence 46 (1) (2024) 525–542

  136. [139]

    Zavrtanik, M

    V. Zavrtanik, M. Kristan, D. SkoÄŊaj, Reconstruction by inpaint- ing for visual anomaly detection, Pattern Recognition 112 (2021) 107706

  137. [140]

    Huang, Q

    C. Huang, Q. Xu, Y. Wang, Y. Wang, Y. Zhang, Self-Supervised Masking for Unsupervised Anomaly Detection and Localization, IEEE Transactions on Multimedia 25 (2023) 4426–4438

  138. [141]

    Jiang, J

    J. Jiang, J. Zhu, M. Bilal, Y. Cui, N. Kumar, R. Dou, F. Su, X. Xu, Masked Swin Transformer Unet for Industrial Anomaly Detection, IEEE Transactions on Industrial Informatics 19 (2) (2023) 2200– 2209

  139. [142]

    B.Kang,Y.Zhong,Z.Sun,L.Deng,M.Wang,J.Zhang,MSTAD:A maskedsubspace-liketransformerformulti-classanomalydetection, Knowledge-Based Systems 283 (2024) 111186

  140. [143]

    Y. Guo, M. Jiang, Q. Huang, Y. Cheng, J. Gong, MLDFR: A MultilevelFeaturesRestorationMethodBasedonDamagedImages for Anomaly Detection and Localization, IEEE Transactions on Industrial Informatics 20 (2) (2024) 2477–2486

  141. [144]

    W. Luo, H. Yao, W. Yu, Z. Li, AMI-Net: Adaptive Mask Inpainting Network for Industrial Anomaly Detection and Localization, IEEE Transactions on Automation Science and Engineering (2024) 1–15

  142. [145]

    X. Yao, C. Zhang, R. Li, J. Sun, Z. Liu, One-for-All: Proposal Masked Cross-Class Anomaly Detection, in: Proceedings of the AAAI Conference on Artificial Intelligence, Vol. 37, 2023, pp. 4792–4800

  143. [146]

    H.Yao,W.Luo,J.Lou,W.Yu,X.Zhang,Z.Qiang,H.Shi,Scalable IndustrialVisualAnomalyDetectionWithPartialSemanticsAggre- gation Vision Transformer, IEEE Transactions on Instrumentation and Measurement 73 (2024) 1–17

  144. [147]

    Cohen, Y

    N. Cohen, Y. Hoshen, Sub-Image Anomaly Detection with Deep PyramidCorrespondences,arXiv:2005.02357[cs](February2021)

  145. [148]

    2041–2050

    J.Hyun,S.Kim,G.Jeon,S.H.Kim,K.Bae,B.J.Kang,ReConPatch :ContrastivePatchRepresentationLearningforIndustrialAnomaly Detection, in: 2024 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV), IEEE, Waikoloa, HI, USA, 2024, pp. 2041–2050

  146. [149]

    Defard, A

    T. Defard, A. Setkov, A. Loesch, R. Audigier, PaDiM: A Patch Distribution Modeling Framework for Anomaly Detection and Lo- calization,in:InternationalConferenceonPatternRecognition,Vol. 12664, 2021, pp. 475–489, series Title: Lecture Notes in Computer Science

  147. [150]

    Bae, J.-H

    J. Bae, J.-H. Lee, S. Kim, PNI: Industrial Anomaly Detection using PositionandNeighborhoodInformation,IEEE,Paris,France,Octo- ber 1-6, 2023, 2023, pp. 6350–6360

  148. [151]

    Z. Fang, X. Wang, H. Li, J. Liu, Q. Hu, J. Xiao, FastRecon: Few- shot Industrial Anomaly Detection via Fast Feature Reconstruction, in: 2023 IEEE/CVF International Conference on Computer Vision (ICCV), IEEE, Paris, France, 2023, pp. 17435–17444

  149. [152]

    Rezende, S

    D. Rezende, S. Mohamed, Variational inference with normalizing flows, in: International conference on machine learning, PMLR, 2015, pp. 1530–1538

  150. [153]

    Rudolph, B

    M. Rudolph, B. Wandt, B. Rosenhahn, Same Same But DifferNet: Semi-Supervised Defect Detection with Normalizing Flows, in: 2021IEEE WinterConference onApplications ofComputer Vision (WACV), IEEE, Waikoloa, HI, USA, 2021, pp. 1906–1915

  151. [154]

    Rudolph, T

    M. Rudolph, T. Wehrbein, B. Rosenhahn, B. Wandt, Fully Convo- lutional Cross-Scale-Flows for Image-based Defect Detection, in: 2022 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV), IEEE, Waikoloa, HI, USA, 2022, pp. 1829–1838

  152. [155]

    B.Liu,T.Guo,B.Luo,Z.Cui,J.Yang,Cross-AttentionRegression Flow for Defect Detection, IEEE Transactions on Image Processing 33 (2024) 5183–5193

  153. [156]

    J. Lei, X. Hu, Y. Wang, D. Liu, PyramidFlow: High-Resolution Defect Contrastive Localization Using Pyramid Normalizing Flow, IEEE,Vancouver,BC,Canada,June17-24,2023,2023,pp.14143– 14152

  154. [157]

    Jiang, S

    J. Jiang, S. Wei, X. Xu, Y. Cui, X. Liu, Unsupervised Anomaly Detection and Localization based on Two-Hierarchy Normalizing Flow, IEEE Transactions on Instrumentation and Measurement (2024) 1–1

  155. [158]

    X. Yao, R. Li, Z. Qian, L. Wang, C. Zhang, Hierarchical gaussian mixture normalizing flow modeling for unified anomaly detection, in: European Conference on Computer Vision, Springer, 2024, pp. 92–108

  156. [159]

    H. Yao, W. Luo, W. Yu, X. Zhang, Z. Qiang, D. Luo, H. Shi, Dual- AttentionTransformerandDiscriminativeFlowforIndustrialVisual AnomalyDetection,IEEETransactionsonAutomationScienceand Engineering (2024) 1–15

  157. [160]

    Q. Chen, H. Luo, H. Gao, C. Lv, Z. Zhang, Progressive Boundary GuidedAnomalySynthesisforIndustrialAnomalyDetection,IEEE Transactions on Circuits and Systems for Video Technology (2024) 1–1

  158. [161]

    Zavrtanik, M

    V. Zavrtanik, M. Kristan, D. Skocaj, DRÃĘM âĂŞ A discrimina- tively trained reconstruction embedding for surface anomaly detec- tion, IEEE, Montreal, QC, Canada, October 10-17, 2021, 2021, pp. 8310–8319

  159. [162]

    S. Wang, Q. Li, H. Luo, C. Lv, Z. Zhang, Produce Once, Utilize Twice for Anomaly Detection, IEEE Transactions on Circuits and Systems for Video Technology (2024) 1–1

  160. [163]

    P.Xing,Y.Sun,D.Zeng,Z.Li,NormalImageGuidedSegmentation Framework for Unsupervised Anomaly Detection, IEEE Transac- tions on Circuits and Systems for Video Technology 34 (6) (2024) 4639–4652

  161. [164]

    Zhang, N

    X. Zhang, N. Li, J. Li, T. Dai, Y. Jiang, S.-T. Xia, Unsupervised Surface Anomaly Detection with Diffusion Probabilistic Model, in: 2023 IEEE/CVF International Conference on Computer Vision (ICCV), IEEE, Paris, France, 2023, pp. 6759–6768. Y. Cheng et al. :Preprint submitted t...

  162. [165]

    C. Ding, G. Pang, C. Shen, Catching Both Gray and Black Swans: Open-set Supervised Anomaly Detection, IEEE, New Orleans, LA, USA, June 18-24, 2022, 2022, pp. 7378–7388

  163. [166]

    G. Pang, C. Ding, C. Shen, A. v. d. Hengel, Explainable Deep Few- shot Anomaly Detection with Deviation Networks, ACM, Singa- pore, Singapore, August 14-18, 2021, 2021, arXiv:2108.00462 [cs]

  164. [167]

    L. Ruff, R. Vandermeulen, N. Goernitz, L. Deecke, S. A. Siddiqui, A. Binder, E. Müller, M. Kloft, Deep one-class classification, in: International conference on machine learning, PMLR, 2018, pp. 4393–4402

  165. [168]

    Baitieva, D

    A. Baitieva, D. Hurych, V. Besnier, O. Bernard, Supervised Anomaly Detection for Complex Industrial Images, in: IEEE/CVF Conference on Computer Vision and Pattern Recognition, IEEE, 2024, pp. 17754–17762

  166. [169]

    15310 of Lecture Notes in Computer Science, Springer, 2024, pp

    B.Rolih,M.Fucka,D.Skocaj,SuperSimpleNet:UnifyingUnsuper- visedandSupervisedLearningforFastandReliableSurfaceDefect Detection, in: Pattern Recognition - 27th International Conference, ICPR 2024, Kolkata, India, December 1-5, 2024, Proceedings, Part X, Vol. 15310 of Lecture Note...

  167. [170]

    Zhang, Z

    H. Zhang, Z. Wu, Z. Wang, Z. Chen, Y.-G. Jiang, Prototypical Residual Networks for Anomaly Detection and Localization, IEEE, Vancouver,BC,Canada,June17-24,2023,2023,pp.16281–16291

  168. [171]

    F. Wang, T. Zhang, Y. Wang, Y. Qiu, X. Liu, X. Guo, Z. Cui, Distribution Prototype Diffusion Learning for Open-set Supervised AnomalyDetection,in:IEEE/CVFConferenceonComputerVision and Pattern Recognition, arXiv, 2025, arXiv:2502.20981 [cs]

  169. [172]

    J. Zhu, C. Ding, Y. Tian, G. Pang, Anomaly heterogeneity learning foropen-setsupervisedanomalydetection,IEEE,Seattle,WA,USA, June 16-22, 2024, 2024, pp. 17616–17626

  170. [173]

    T. Zhu, L. Liu, Y. Sun, Z. Lu, Y. Zhang, C. Xu, J. Chen, Semi- supervised noise-resilient anomaly detection with feature autoen- coder, Knowledge-Based Systems 304 (2024) 112445

  171. [174]

    Huang, H

    C. Huang, H. Guan, A. Jiang, Y. Zhang, M. Spratling, Y.-F. Wang, Registrationbasedfew-shotanomalydetection,in:Europeanconfer- ence on computer vision, Springer, 2022, pp. 303–319

  172. [175]

    Huang, H

    C. Huang, H. Guan, A. Jiang, Y. Zhang, M. Spratling, X. Wang, Y. Wang, Few-Shot Anomaly Detection via Category-Agnostic Registration Learning, IEEE Transactions on Neural Networks and Learning SystemsPublisher: IEEE (2024)

  173. [176]

    G. Xie, J. Wang, J. Liu, Y. Jin, F. Zheng, Pushing the Limits of Fewshot Anomaly Detection in Industry Vision: Graphcore, in: The Eleventh International Conference on Learning Representations, ICLR2023,Kigali,Rwanda,May1-5,2023,OpenReview.net,2023

  174. [177]

    Z. Gu, B. Zhu, G. Zhu, Y. Chen, M. Tang, J. Wang, UniVAD: A Training-free Unified Model for Few-shot Visual Anomaly Detec- tion, in: IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2025, arXiv:2412.03342 [cs]

  175. [178]

    Y. Li, S. Zhang, K. Li, Q. Lao, One-to-Normal: Anomaly Person- alization for Few-shot Anomaly Detection, in: Neural Information Processing Systems

  176. [179]

    Y. Bai, J. Zhang, Z. Chen, Y. Dong, Y. Cao, G. Tian, Dual-path fre- quency discriminators for few-shot anomaly detection, Knowledge- Based Systems 302 (2024) 112397, publisher: Elsevier

  177. [180]

    17826–17836

    J.Zhu,G.Pang,Towardgeneralistanomalydetectionviain-context residual learning with few-shot sample prompts, in: Proceedings of the IEEE/CVF conference on computer vision and pattern recogni- tion, 2024, pp. 17826–17836

  178. [181]

    X. Yao, Z. Chen, C. Gao, G. Zhai, C. Zhang, ResAD: A Simple Framework for Class Generalizable Anomaly Detection, in: Ad- vances in Neural Information Processing Systems, Vol. 37, 2024, pp. 125287–125311

  179. [182]

    Jiang, Y

    Y. Jiang, Y. Cao, W. Shen, Prototypical Learning Guided Context- Aware Segmentation Network for Few-Shot Anomaly Detection, IEEE Transactions on Neural Networks and Learning Systems (2024) 1–11

  180. [183]

    Gao, MetaUAS: Universal Anomaly Segmentation with One- PromptMeta-Learning,in:AdvancesinNeuralInformationProcess- ing Systems, Vol

    B.-B. Gao, MetaUAS: Universal Anomaly Segmentation with One- PromptMeta-Learning,in:AdvancesinNeuralInformationProcess- ing Systems, Vol. 37, 2024, pp. 39812–39836

  181. [184]

    M. Lee, J. Choi, Text-guided variational image generation for in- dustrialanomalydetectionandsegmentation,in:Proceedingsofthe IEEE/CVF Conference on Computer Vision and Pattern Recogni- tion, 2024, pp. 26519–26528

  182. [185]

    T. Aota, L. T. T. Tong, T. Okatani, Zero-shot versus Many-shot: Unsupervised Texture Anomaly Detection, IEEE, Waikoloa, HI, USA, January 2-7, 2023, 2023, pp. 5553–5561

  183. [186]

    Ardelean, T

    A.-T. Ardelean, T. Weyrich, High-Fidelity Zero-Shot Texture Anomaly Localization Using Feature Correspondence Analysis, IEEE,Waikoloa,HI,USA,January3-8,2024,2024,pp.1123–1133

  184. [187]

    H. Yao, W. Luo, Y. Cao, Y. Zhang, W. Yu, W. Shen, Global- Regularized Neighborhood Regression for Efficient Zero-Shot Tex- ture Anomaly Detection, arXiv:2406.07333 [cs] (June 2024)

  185. [188]

    X. Li, Z. Huang, F. Xue, Y. Zhou, MuSc: Zero-Shot Industrial Anomaly Classification and Segmentation with Mutual Scoring of the Unlabeled Images, PMLR, Vienna, Austria, May 7-11, 2024, 2024, arXiv:2401.16753 [cs]

  186. [189]

    M.Tamura,RandomWordDataAugmentationwithCLIPforZero- ShotAnomalyDetection,BMVA,Aberdeen,UK,November20-24, 2023, 2023

  187. [190]

    Schwartz, A

    E. Schwartz, A. Arbelle, L. Karlinsky, S. Harary, F. Scheidegger, S. Doveh, R. Giryes, MAEDAY: MAE for few- and zero-shot AnomalY-Detection, Computer Vision and Image Understanding 241 (2024) 103958

  188. [191]

    Y.Cao,X.Xu,Y.Cheng,C.Sun,Z.Du,L.Gao,W.Shen,Personal- izing Vision-Language Models With Hybrid Prompts for Zero-Shot AnomalyDetection,IEEETransactionsonCybernetics(2025)1–13

  189. [192]

    S. Liu, Z. Zeng, T. Ren, F. Li, H. Zhang, J. Yang, Q. Jiang, C. Li, J. Yang, H. Su, others, Grounding dino: Marrying dino with grounded pre-training for open-set object detection, in: European Conference on Computer Vision, Springer, Milan, Italy, September 29-October 4, 2024,...

  190. [193]

    Kirillov, E

    A. Kirillov, E. Mintun, N. Ravi, H. Mao, C. Rolland, L. Gustafson, T. Xiao, S. Whitehead, A. C. Berg, W.-Y. Lo, et al., Segment anything,in:ProceedingsoftheIEEE/CVFinternationalconference on computer vision, 2023, pp. 4015–4026

  191. [194]

    X. Chen, Y. Han, J. Zhang, A zero-/few-shot anomaly classification and segmentation method for cvpr 2023 vand workshop challenge tracks 1&2: 1st place on zero-shot ad and 4th place on few-shot ad, arXiv preprint arXiv:2305.17382 2 (4) (2023)

  192. [195]

    X. Chen, J. Zhang, G. Tian, H. He, W. Zhang, Y. Wang, C. Wang, Y. Liu, Clip-ad: A language-guided staged dual-path model for zero-shot anomaly detection, in: International Joint Conference on Artificial Intelligence, Springer, 2024, pp. 17–33

  193. [196]

    Y. Li, H. Wang, Y. Duan, J. Zhang, X. Li, A closer look at the explainability of contrastive language-image pre-training, Pattern Recognition 162 (2025) 111409

  194. [197]

    Z. Gu, B. Zhu, G. Zhu, Y. Chen, M. Tang, J. Wang, AnomalyGPT: DetectingIndustrialAnomaliesUsingLargeVision-LanguageMod- els, in: Proceedings of the AAAI Conference on Artificial Intelli- gence, Vol. 38, 2024, pp. 1932–1940

  195. [198]

    Huang, A

    C. Huang, A. Jiang, J. Feng, Y. Zhang, X. Wang, Y. Wang, Adapt- ing visual-language models for generalizable anomaly detection in medical images, IEEE, Seattle, WA, USA, June 16-22, 2024, 2024, pp. 11375–11385

  196. [199]

    K. Mao, P. Wei, Y. Lian, Y. Wang, N. Zheng, Beyond single-modal boundary: Cross-modal anomalydetection through visual prototype and harmonization, in: Proceedings of the Computer Vision and Pattern Recognition Conference, 2025, pp. 9964–9973

  197. [200]

    Ho, K.-C

    C.-H. Ho, K.-C. Peng, N. Vasconcelos, Long-Tailed Anomaly De- tection with Learnable Class Names, in: IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2024, Seattle, WA, USA, June 16-22, 2024, IEEE, 2024, pp. 12435–12446

  198. [201]

    Z. Qu, X. Tao, M. Prasad, F. Shen, Z. Zhang, X. Gong, G. Ding, VCP-CLIP: A Visual Context Prompting Model for Zero-Shot Y. Cheng et al. :Preprint submitted to Elsevier Page 23 of 27 A Comprehensive Survey for Real-World Industrial Defect Detection: Challenge, Approach, and Pro...

  199. [202]

    Z. Qu, X. Tao, X. Gong, S. Qu, Q. Chen, Z. Zhang, X. Wang, G. Ding, Bayesian Prompt Flow Learning for Zero-Shot Anomaly Detection, in: IEEE/CVF Conference on Computer Vision and Pat- tern Recognition, 2025, arXiv:2503.10080 [cs]

  200. [203]

    W. Lv, Q. Su, W. Xu, One-for-All Few-Shot Anomaly Detection via Instance-Induced Prompt Learning, in: International Conference on Learning Representations, 2025

  201. [204]

    Tao, G.-S

    F. Tao, G.-S. Xie, F. Zhao, X. Shu, Kernel-Aware Graph Prompt Learning for Few-Shot Anomaly Detection, in: AAAI Conference on Artificial Intelligence, 2024, arXiv:2412.17619 [cs]

  202. [205]

    X. Li, Z. Zhang, X. Tan, C. Chen, Y. Qu, Y. Xie, L. Ma, Promptad: Learning prompts with only normal samples for few-shot anomaly detection, in: Proceedings of the IEEE/CVF Conference on Com- puter Vision and Pattern Recognition, 2024, pp. 16838–16848

  203. [206]

    W. Ma, X. Zhang, Q. Yao, F. Tang, C. Wu, Y. Li, R. Yan, Z. Jiang, S. K. Zhou, AA-CLIP: Enhancing Zero-shot Anomaly Detection via Anomaly-Aware CLIP, in: IEEE/CVF Conference on Computer VisionandPatternRecognition,arXiv,2025,arXiv:2503.06661[cs]

  204. [207]

    Li, Elizaveta Lvanova, Martins Bruveris, FADE: Few-shot/zero- shot Anomaly Detection Engine using Large Vision-Language Model, in: British Machine Vision Conference

    Y. Li, Elizaveta Lvanova, Martins Bruveris, FADE: Few-shot/zero- shot Anomaly Detection Engine using Large Vision-Language Model, in: British Machine Vision Conference

  205. [208]

    Zhang, G

    J. Zhang, G. Wang, Y. Jin, D. Huang, Towards Training-free Anomaly Detection with Vision and Language Foundation Models, in: IEEE/CVF Conference on Computer Vision and Pattern Recog- nition, 2025, arXiv:2503.18325 [cs]

  206. [209]

    Zhang, Y

    Y. Zhang, Y. Cao, X. Xu, W. Shen, LogiCode: An LLM-Driven Framework for Logical Anomaly Detection, IEEE Transactions on Automation Science and Engineering 22 (2025) 7712–7723

  207. [210]

    Z.Gu,B.Zhu,G.Zhu,Y.Chen,H.Li,M.Tang,J.Wang,FiLo:Zero- Shot Anomaly Detection by Fine-Grained Description and High- Quality Localization, ACM, Melbourne, VIC, Australia, October 28-November1,2024,2024,pp.2041–2049,arXiv:2404.13671[cs]

  208. [211]

    J. Zhu, S. Cai, F. Deng, B. C. Ooi, J. Wu, Do LLMs Understand Visual Anomalies? Uncovering LLM’s Capabilities in Zero-shot AnomalyDetection,ACM,Melbourne,VIC,Australia,October28- November 1, 2024, 2024, pp. 48–57

  209. [212]

    X.Jiang,J.Li,H.Deng,Y.Liu,B.-B.Gao,Y.Zhou,J.Li,C.Wang, F. Zheng, MMAD: The First-Ever Comprehensive Benchmark for Multimodal Large Language Models in Industrial Anomaly De- tection, in: International Conference on Learning Representations, arXiv, 2024, arXiv:2410.09453 [cs]

  210. [213]

    X. Xu, Y. Cao, Y. Chen, W. Shen, X. Huang, Customizing visual- languagefoundationmodelsformulti-modalanomalydetectionand reasoning, arXiv preprint arXiv:2403.11083 (2024)

  211. [214]

    Xu, S.-Y

    J. Xu, S.-Y. Lo, B. Safaei, V. M. Patel, I. Dwivedi, Towards Zero- Shot Anomaly Detection and Reasoning with Multimodal Large Language Models, in: IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2025, arXiv:2502.07601 [cs]

  212. [215]

    2871–2880

    W.Li,J.Zhan,J.Wang,B.Xia,B.-B.Gao,J.Liu,C.Wang,F.Zheng, Towards continual adaptation in industrial anomaly detection, in: Proceedings of the 30th ACM International Conference on Multi- media, 2022, pp. 2871–2880

  213. [216]

    J. Liu, K. Wu, Q. Nie, Y. Chen, B.-B. Gao, Y. Liu, J. Wang, C.Wang,F.Zheng,Unsupervisedcontinualanomalydetectionwith contrastively-learned prompt, in: Proceedings of the AAAI confer- ence on artificial intelligence, Vol. 38, 2024, pp. 3639–3647

  214. [217]

    X. Li, X. Tan, Z. Chen, Z. Zhang, R. Zhang, R. Guo, G. Jiang, Y. Chen, Y. Qu, L. Ma, Y. Xie, One-for-More: Continual Diffusion Model for Anomaly Detection, in: IEEE/CVF Conference on Com- puterVisionandPatternRecognition,2025,arXiv:2502.19848[cs]

  215. [218]

    15433–15445

    X.Jiang,J.Liu,J.Wang,Q.Nie,K.Wu,Y.Liu,C.Wang,F.Zheng, Softpatch: Unsupervised anomaly detection with noisy data, in: AdvancesinNeuralInformationProcessingSystems,Vol.35,2022, pp. 15433–15445

  216. [219]

    Y. G. Jung, J. Park, J. Yoon, K.-C. Peng, W. Kim, A. B. J. Teoh, O. Camps, TailedCore: Few-Shot Sampling for Unsuper- vised Long-Tail Noisy Anomaly Detection, in: IEEE/CVF Confer- ence on Computer Vision and Pattern Recognition, arXiv, 2025, arXiv:2504.02775 [cs]

  217. [220]

    H. Sun, Y. Cao, D. Hao, O. Fink, Anomaly Anything: Promptable Unseen Visual Anomaly Generation, in: IEEE/CVF Conference on ComputerVisionandPatternRecognition,2024,arXiv:2406.01078 [cs]

  218. [221]

    Z. Lai, Y. Lu, X. Li, J. Lin, Y. Qu, L. Cao, M. Li, R. Ji, Anoma- lypainter: Vision-language-diffusion synergy for zero-shot realistic and diverse industrial anomaly synthesis (2025)

  219. [225]

    G. Qian, Y. Li, H. Peng, J. Mai, H. Hammoud, M. Elhoseiny, B. Ghanem, Pointnext: Revisiting pointnet++ with improved train- ing and scaling strategies, Advances in neural information process- ing systems 35 (2022) 23192–23204

  220. [226]

    X. Ye, J. Li, H. Huang, L. Du, X. Zhang, 3d recurrent neural networkswithcontextfusionforpointcloudsemanticsegmentation, in: Proceedings of the European conference on computer vision (ECCV), 2018, pp. 403–417

  221. [227]

    H. Ran, J. Liu, C. Wang, Surface representation for point clouds, in: 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), 2022, pp. 18920–18930

  222. [228]

    Huang, W

    Q. Huang, W. Wang, U. Neumann, Recurrent slice networks for 3d segmentation of point clouds, in: 2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2018, pp. 2626–2635

  223. [229]

    B.-S.Hua,M.-K.Tran,S.-K.Yeung,Pointwiseconvolutionalneural networks, in: 2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2018, pp. 984–993

  224. [230]

    S. Wang, S. Suo, W.-C. Ma, A. Pokrovsky, R. Urtasun, Deep parametric continuous convolutional neural networks, in: 2018 IEEE/CVF Conference on Computer Vision and Pattern Recogni- tion, 2018, pp. 2589–2597

  225. [231]

    Y. Li, R. Bu, M. Sun, W. Wu, X. Di, B. Chen, Pointcnn: convo- lution on Îğ-transformed points, in: Neural Information Processing Systems, 2018, p. 828âĂŞ838

  226. [232]

    C. Wang, B. Samari, K. Siddiqi, Local spectral graph convolution for point set feature learning, in: Proceedings of the European Conference on Computer Vision (ECCV), 2018

  227. [234]

    L.Landrieu,M.Simonovsky,Large-scalepointcloudsemanticseg- mentation with superpoint graphs, in: 2018 IEEE/CVF Conference onComputerVisionandPatternRecognition,2018,pp.4558–4567

  228. [235]

    Liang, M

    Z. Liang, M. Yang, L. Deng, C. Wang, B. Wang, Hierarchical depthwise graph convolutional neural network for 3d semantic seg- mentation of point clouds, in: 2019 International Conference on Robotics and Automation (ICRA), 2019, pp. 8152–8158

  229. [236]

    G. Li, M. MÃijller, A. Thabet, B. Ghanem, Deepgcns: Can gcns go as deep as cnns?, in: 2019 IEEE/CVF International Conference on Computer Vision (ICCV), 2019, pp. 9266–9275

  230. [238]

    X. Wu, Y. Lao, L. Jiang, X. Liu, H. Zhao, Point transformer v2: grouped vector attention and partition-based pooling, in: Proceed- ings of the 36th International Conference on Neural Information Processing Systems, NIPS ’22, Curran Associates Inc., Red Hook, NY, USA, 2022

  231. [239]

    Y.He,H.Yu,Z.Yang,X.Liu,W.Sun,A.Mian,Fullpointencoding for local feature aggregation in 3-d point clouds, IEEE Transactions on Neural Networks and Learning Systems (2024) 1–15

  232. [240]

    C. Park, Y. Jeong, M. Cho, J. Park, Fast point transformer, in: 2022 IEEE/CVFConferenceonComputerVisionandPatternRecognition (CVPR), 2022, pp. 16928–16937

  233. [241]

    X. Lai, J. Liu, L. Jiang, L. Wang, H. Zhao, S. Liu, X. Qi, J. Jia, Stratified transformer for 3d point cloud segmentation, in: 2022 IEEE/CVFConferenceonComputerVisionandPatternRecognition (CVPR), 2022, pp. 8490–8499

  234. [242]

    X. Wu, L. Jiang, P.-S. Wang, Z. Liu, X. Liu, Y. Qiao, W. Ouyang, T. He, H. Zhao, Point transformer v3: Simpler, faster, stronger, in: 2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), 2024, pp. 4840–4851

  235. [243]

    Liang, X

    D. Liang, X. Zhou, W. Xu, X. Zhu, Z. Zou, X. Ye, X. Tan, X. Bai, Pointmamba: A simple state space model for point cloud analysis, in: Proceedings of the 38th International Conference on Neural Information Processing Systems, NIPS ’24, 2024

  236. [244]

    H. Su, S. Maji, E. Kalogerakis, E. Learned-Miller, Multi-view con- volutionalneuralnetworksfor3dshaperecognition,in:Proceedings of the IEEE international conference on computer vision, 2015, pp. 945–953

  237. [245]

    B. Wu, A. Wan, X. Yue, K. Keutzer, Squeezeseg: Convolutional neuralnetswithrecurrentcrfforreal-timeroad-objectsegmentation from 3d lidar point cloud, in: 2018 IEEE International Conference on Robotics and Automation (ICRA), 2018, pp. 1887–1893

  238. [246]

    B. Wu, X. Zhou, S. Zhao, X. Yue, K. Keutzer, Squeezesegv2: Improved model structure and unsupervised domain adaptation for road-objectsegmentationfromalidarpointcloud,in:2019Interna- tional Conference on Robotics and Automation (ICRA), 2019, pp. 4376–4382

  239. [247]

    A. Ando, S. Gidaris, A. Bursuc, G. Puy, A. Boulch, R. Marlet, Rangevit:Towardsvisiontransformersfor3dsemanticsegmentation in autonomous driving, in: 2023 IEEE/CVF Conference on Com- puterVisionandPatternRecognition(CVPR),2023,pp.5240–5250

  240. [248]

    Z. Wu, S. Song, A. Khosla, F. Yu, L. Zhang, X. Tang, J. Xiao, 3d shapenets: A deep representation for volumetric shapes, in: 2015 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), 2015, pp. 1912–1920

  241. [249]

    D.Maturana,S.Scherer,Voxnet:A3dconvolutionalneuralnetwork for real-time object recognition, in: 2015 IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS), 2015, pp. 922–928

  242. [250]

    Tchapmi, C

    L. Tchapmi, C. Choy, I. Armeni, J. Gwak, S. Savarese, Segcloud: Semantic segmentation of 3d point clouds, in: 2017 International Conference on 3D Vision (3DV), 2017, pp. 537–547

  243. [251]

    A. Dai, D. Ritchie, M. Bokeloh, S. Reed, J. Sturm, M. Nieçner, Scancomplete:Large-scalescenecompletionandsemanticsegmen- tation for 3d scans, in: 2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2018, pp. 4578–4587

  244. [252]

    Riegler, A

    G. Riegler, A. O. Ulusoy, A. Geiger, Octnet: Learning deep 3d representations at high resolutions, in: 2017 IEEE Conference on ComputerVisionandPatternRecognition(CVPR),2017,pp.6620– 6629

  245. [253]

    Graham, M

    B. Graham, M. Engelcke, L. v. d. Maaten, 3d semantic segmen- tation with submanifold sparse convolutional networks, in: 2018 IEEE/CVF Conference on Computer Vision and Pattern Recogni- tion, 2018, pp. 9224–9232

  246. [254]

    Tatarchenko, J

    M. Tatarchenko, J. Park, V. Koltun, Q.-Y. Zhou, Tangent convo- lutions for dense prediction in 3d, in: Proceedings of the IEEE conference on computer vision and pattern recognition, 2018, pp. 3887–3896

  247. [255]

    H. Su, V. Jampani, D. Sun, S. Maji, E. Kalogerakis, M.-H. Yang, J.Kautz,Splatnet:Sparselatticenetworksforpointcloudprocessing, in: Proceedings of the IEEE conference on computer vision and pattern recognition, 2018, pp. 2530–2539

  248. [256]

    P.Besl,N.D.McKay,Amethodforregistrationof3-dshapes,IEEE Transactions on Pattern Analysis and Machine Intelligence 14 (2) (1992) 239–256

  249. [257]

    K.Khoshelham,Closed-formsolutionsforestimatingarigidmotion from plane correspondences extracted from point clouds, ISPRS JournalofPhotogrammetryandRemoteSensing114(2016)78–91

  250. [258]

    S.Ramalingam,Y.Taguchi,Atheoryofminimal3dpointto3dplane registrationanditsgeneralization,Internationaljournalofcomputer vision 102 (2013) 73–90

  251. [259]

    Brenner, C

    C. Brenner, C. Dold, N. Ripperda, Coarse orientation of terrestrial laser scans in urban environments, ISPRS journal of photogramme- try and remote sensing 63 (1) (2008) 4–18

  252. [260]

    Forstner, K

    W. Forstner, K. Khoshelham, Efficient and accurate registration of point clouds with plane to plane correspondences, in: Proceedings oftheIEEEinternationalconferenceoncomputervisionworkshops, 2017, pp. 2165–2173

  253. [261]

    A.W.Fitzgibbon,Robustregistrationof2dand3dpointsets,Image and Vision Computing 21 (13) (2003) 1145–1153, british Machine Vision Computing 2001

  254. [262]

    Chetverikov, D

    D. Chetverikov, D. Stepanov, P. Krsek, Robust euclidean alignment of3dpointsets:thetrimmediterativeclosestpointalgorithm,Image and Vision Computing 23 (3) (2005) 299–309

  255. [263]

    Cheng, W.-l

    Y.-q. Cheng, W.-l. Li, C. Jiang, D.-f. Wang, H.-w. Xing, W. Xu, Mvgr: Mean-variance minimization global registration method for multi-view point cloud in robot inspection, IEEE Transactions on Instrumentation and Measurement (2024)

  256. [264]

    A.Myronenko,X.Song,Pointsetregistration:Coherentpointdrift, IEEE Transactions on Pattern Analysis and Machine Intelligence 32 (12) (2010) 2262–2275

  257. [265]

    B. Jian, B. C. Vemuri, Robust point set registration using gaussian mixture models, IEEE Transactions on Pattern Analysis and Ma- chine Intelligence 33 (8) (2011) 1633–1645

  258. [266]

    Horaud, F

    R. Horaud, F. Forbes, M. Yguel, G. Dewaele, J. Zhang, Rigid and articulated point registration with expectation conditional max- imization, IEEE Transactions on Pattern Analysis and Machine Intelligence 33 (3) (2011) 587–602

  259. [267]

    G. D. Evangelidis, R. Horaud, Joint alignment of multiple point sets with batch and incremental expectation-maximization, IEEE Transactions on Pattern Analysis and Machine Intelligence 40 (6) (2018) 1397–1410

  260. [268]

    Z. Min, J. Wang, M. Q.-H. Meng, Robust generalized point cloud registration with orientational data based on expectation maximiza- tion, IEEE Transactions on Automation Science and Engineering 17 (1) (2020) 207–221

  261. [269]

    L.-j.Su,W.Xu,Y.-p.Wang,W.-l.Li,Robustpointcloudregistration inroboticinspectionwithlocallyconsistentgaussianmixturemodel, IEEE Transactions on Instrumentation and Measurement (2024)

  262. [270]

    L. Su, W. Xu, S. Zhao, Y. Cheng, W. Li, A robust probability-based joint registration method of multiple point clouds considering local consistency, arXiv preprint arXiv:2409.09682 (2024)

  263. [271]

    H.Li,R.Hartley,The3d-3dregistrationproblemrevisited,in:2007 IEEE 11th International Conference on Computer Vision, 2007, pp. 1–8

  264. [272]

    Li, Consensus set maximization with guaranteed global optimal- ityforrobustgeometryestimation,in:2009IEEE12thInternational Conference on Computer Vision, 2009, pp

    H. Li, Consensus set maximization with guaranteed global optimal- ityforrobustgeometryestimation,in:2009IEEE12thInternational Conference on Computer Vision, 2009, pp. 1074–1080

  265. [273]

    J. Yang, H. Li, D. Campbell, Y. Jia, Go-icp: A globally optimal so- lution to 3d icp point-set registration, IEEE Transactions on Pattern Analysis and Machine Intelligence 38 (11) (2016) 2241–2254

  266. [274]

    5685–5694

    D.Campbell,L.Petersson,Gogma:Globally-optimalgaussianmix- ture alignment, in: 2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), 2016, pp. 5685–5694

  267. [275]

    Ã. J. P. Bustos, T.-J. Chin, D. Suter, Fast rotation search with stere- ographic projections for 3d registration, in: 2014 IEEE Conference Y. Cheng et al. :Preprint submitted to Elsevier Page 25 of 27 A Comprehensive Survey for Real-World Industrial Defect Detection: Challenge...

  268. [276]

    Zhang, L

    X. Zhang, L. Peng, W. Xu, L. Kneip, Accelerating globally optimal consensus maximization in geometric vision, IEEE Trans. Pattern Anal. Mach. Intell. 46 (6) (2024) 4280âĂŞ4297

  269. [277]

    W. Chen, H. Li, Q. Nie, Y.-H. Liu, Deterministic point cloud regis- trationvianoveltransformationdecomposition,in:2022IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), 2022, pp. 6338–6346

  270. [278]

    Huang, L

    T. Huang, L. Peng, R. Vidal, Y.-H. Liu, Scalable 3d registration via truncated entry-wise absolute residuals, in: 2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), 2024, pp. 27467–27477

  271. [279]

    Bergmann, D

    P. Bergmann, D. Sattlegger, Anomaly detection in 3d point clouds usingdeepgeometricdescriptors,in:Proceedings oftheIEEE/CVF Winter Conference on Applications of Computer Vision, 2023, pp. 2613–2623

  272. [280]

    Masuda, R

    M. Masuda, R. Hachiuma, R. Fujii, H. Saito, Y. Sekikawa, Toward unsupervised 3d point cloud anomaly detection using variational autoencoder, in: 2021 IEEE International Conference on Image Processing (ICIP), 2021, pp. 3118–3122

  273. [281]

    Z. Zhou, L. Wang, N. Fang, Z. Wang, L. Qiu, S. Zhang, R3d-ad: Reconstructionviadiffusionfor3danomalydetection,in:European Conference on Computer Vision, Springer, 2024, pp. 91–107

  274. [282]

    J. Liu, S. Mou, N. Gaw, Y. Wang, Uni-3dad: Gan-inversion aided universal 3d anomaly detection on model-free products, Expert Systems with Applications (2025) 126665

  275. [283]

    Cheng, C

    J. Cheng, C. Gao, J. Zhou, J. Wen, T. Dai, J. Wang, Mc3d-ad: A unified geometry-aware reconstruction model for multi-category 3d anomaly detection, arXiv preprint arXiv:2505.01969 (2025)

  276. [284]

    Horwitz, Y

    E. Horwitz, Y. Hoshen, Back to the feature: classical 3d features are (almost) all you need for 3d anomaly detection, in: Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2023, pp. 2967–2976

  277. [285]

    Y.Cao,X.Xu,W.Shen,Complementarypseudomultimodalfeature for point cloud anomaly detection, Pattern Recognition 156 (2024) 110761

  278. [286]

    H. Zhu, G. Xie, C. Hou, T. Dai, C. Gao, J. Wang, L. Shen, Towards high-resolution 3d anomaly detection via group-level feature con- trastive learning, ACM Multimedia (ACM MM) (2024)

  279. [287]

    Cheng, Y

    Y. Cheng, Y. Cao, D. Wang, W. Shen, W. Li, Boosting global-local feature matching via anomaly synthesis for multi-class point cloud anomaly detection, IEEE Transactions on Automation Science and Engineering (2025)

  280. [288]

    Liang, J

    H. Liang, J. Zhou, X. Chen, T. Dai, J. Wang, C. Gao, Fence theorem: Towards dual-objective semantic-structure isolation in preprocessing phase for 3d anomaly detection, arXiv preprint arXiv:2503.01100 (2025)

  281. [289]

    Y. Pang, E. H. F. Tay, L. Yuan, Z. Chen, Masked autoencoders for 3d point cloud self-supervised learning, World Scientific Annual Review of Artificial Intelligence 1 (2023) 2440001

  282. [290]

    39, 2025, pp

    H.Liang,G.Xie,C.Hou,B.Wang,C.Gao,J.Wang,Lookinsidefor more:Internalspatialmodalityperceptionfor3danomalydetection, in: Proceedings of the AAAI Conference on Artificial Intelligence, Vol. 39, 2025, pp. 5146–5154

  283. [291]

    Cheng, Y

    Y. Cheng, Y. Cao, G. Xie, Z. Lu, W. Shen, Towards zero-shot point cloudanomalydetection:Amulti-viewprojectionframework,arXiv (2024)

  284. [292]

    Q.Zhou,J.Yan,S.He,W.Meng,J.Chen,Pointad:Comprehending 3d anomalies from points and pixels for zero-shot 3d anomaly detection, NeurIPS (2024)

  285. [293]

    J. Wang, H. Xu, X. Chen, H. Xu, Y. Huang, X. Ding, X. Tu, Exploitingpoint-languagemodelswithdual-promptsfor3danomaly detection, arXiv preprint arXiv:2502.11307 (2025)

  286. [294]

    J. Ye, W. Zhao, X. Yang, G. Cheng, K. Huang, Po3ad: Predicting point offsets toward better 3d point cloud anomaly detection, arXiv preprint arXiv:2412.12617 (2024)

  287. [295]

    E.T.Lee,Z.Fan,B.Sencer,Anewapproachtodetectsurfacedefects from 3d point cloud data with surface normal gabor filter (sngf), Journal of Manufacturing Processes 92 (2023) 196–205

  288. [296]

    J. Ye, X. Liu, H. Madhusudanan, Y. Wang, J. Zhu, Y. Wang, C. Ru, X.Liu,Y.Sun,Automaticpointcloudclusteringmethodforsurface defect diagnosis, IEEE Transactions on Automation Science and Engineering (2025)

  289. [297]

    Y. Wang, J. Peng, J. Zhang, R. Yi, Y. Wang, C. Wang, Multimodal industrial anomaly detection via hybrid fusion, in: Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recog- nition, 2023, pp. 8032–8041

  290. [298]

    6185–6194

    Y.-M.Chu,C.Liu,T.-I.Hsieh,H.-T.Chen,T.-L.Liu,Shape-guided dual-memory learning for 3d anomaly detection, in: Proceedings of the 40th International Conference on Machine Learning, 2023, pp. 6185–6194

  291. [299]

    7038–7046

    R.Chen,G.Xie,J.Liu,J.Wang,Z.Luo,J.Wang,F.Zheng,Easynet: Aneasynetworkfor3dindustrialanomalydetection,in:Proceedings ofthe31stACMInternationalConferenceonMultimedia,2023,pp. 7038–7046

  292. [300]

    Mai, D.-L

    D.-C.Hoang,P.X.Tan,A.-N.Nguyen,D.-T.Tran,V.-H.Duong,A.- T. Mai, D.-L. Pham, K.-T. Phan, M.-Q. Do, T. H. A. Duong, et al., Unsupervised visual-to-geometric feature reconstruction for vision- based industrial anomaly detection, IEEE Access (2025)

Pith tools

Reviewed August 6, 2026 · model on record in the stance chip above.