Paper Citation Record · LEDGER

Large-scale characterization of Single-Hole Transistors in 22-nm FDSOI CMOS Technology

As of 7 August 2026, this Paper Citation Record lists 18 of 18 outbound references and 1 inbound Pith citation observation for arXiv:2507.21306.

A citation records a reference. It does not transfer a finding from one paper to another.

pith.paper-citation-record.v1
2507.21306 v1

Coverage vector

measured 18 of 18 reference resolution

Typed states for the displayed outbound observations.

Source: paper_references, paper_reference_links, observed 2026-08-06T12:59:24.778729Z

measured 19 of 19 standing notices

One-hop event checks from named stored sources.

Source: scholarly_work_events, retraction_status_cache, observed 2026-08-07T06:34:17.273281+00:00

measured 1 of 1 inbound itemization

Pith citing papers itemized under the disclosed page cap.

Source: paper_references, paper_reference_links, observed 2026-06-29T11:36:07.793957Z

measured 0 of 1 external citation measurements

A source-named dated measurement, never combined with another source.

Source: arxiv_reference, observed 2026-06-29T12:13:27.426869Z

Reference resolution

18 of 18 outbound references displayed

verified exact5
verified fuzzy9
unresolved3
parse uncertain0
malformed identifier0
metadata mismatch1

External citation measurements

No source-named external measurement is stored.

Outbound references

Observation 16df3c6e-c5a1-46d3-bb46-d279d938bd4a · outbound

This paper cites Quantum logic with spin qubits crossing the surface code threshold,.

Large-scale characterization of Single-Hole Transistors in 22-nm FDSOI CMOS Technology Quantum logic with spin qubits crossing the surface code threshold,

Reference 1

Resolution: verified fuzzy; raw_fallback, observed 2026-08-06T12:59:27.872874Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 17a04940-8bce-4d4a-aaa7-e27895c84776 · outbound

This paper cites Rent’s rule and extensibility in quantum computing,.

Large-scale characterization of Single-Hole Transistors in 22-nm FDSOI CMOS Technology Rent’s rule and extensibility in quantum computing,

Reference 2

Resolution: verified fuzzy; raw_fallback, observed 2026-08-06T12:59:27.691436Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 6402c667-7d16-46c9-b52b-bac18e8835aa · outbound

This paper cites Challenges in Scaling-up the Control Interface of a Quantum Computer,.

Large-scale characterization of Single-Hole Transistors in 22-nm FDSOI CMOS Technology Challenges in Scaling-up the Control Interface of a Quantum Computer,

Reference 3

Resolution: verified fuzzy; raw_fallback, observed 2026-08-06T12:59:27.527007Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 56735fcc-aac8-4540-9ad2-8bc46037ae2b · outbound

This paper cites Probing single electrons across 300-mm spin qubit wafers,.

Large-scale characterization of Single-Hole Transistors in 22-nm FDSOI CMOS Technology Probing single electrons across 300-mm spin qubit wafers,

Reference 4

Resolution: verified fuzzy; raw_fallback, observed 2026-08-06T12:59:27.314773Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 333accf5-2eaf-4273-a149-d2bccd455155 · outbound

This paper cites Multiplexing Superconducting Qubit Circuit for Single Microwave Photon Generation,.

Large-scale characterization of Single-Hole Transistors in 22-nm FDSOI CMOS Technology Multiplexing Superconducting Qubit Circuit for Single Microwave Photon Generation,

Reference 5

Resolution: verified exact; doi, observed 2026-08-06T12:59:25.119289Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation cf6f5726-ff8e-4533-971f-c277c1251f84 · outbound

This paper cites A quantum dot crossbar with sublinear scaling of interconnects at cryogenic temperature,.

Large-scale characterization of Single-Hole Transistors in 22-nm FDSOI CMOS Technology A quantum dot crossbar with sublinear scaling of interconnects at cryogenic temperature,

Reference 6

Resolution: verified fuzzy; raw_fallback, observed 2026-08-06T12:59:27.124925Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation dcf7ba0b-f423-4779-8fb4-9baa7df7b992 · outbound

This paper cites Scaling silicon-based quantum computing using CMOS technology: State-of-the-art, Challenges and Perspectives,.

Large-scale characterization of Single-Hole Transistors in 22-nm FDSOI CMOS Technology Scaling silicon-based quantum computing using CMOS technology: State-of-the-art, Challenges and Perspectives,

Reference 7

Resolution: verified fuzzy; raw_fallback, observed 2026-08-06T12:59:26.983680Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 7059b74b-a184-4615-9e8e-53cade9968ae · outbound

This paper cites Multiplexed quantum transport using commercial off- the-shelf cmos at sub-kelvin temperatures,.

Large-scale characterization of Single-Hole Transistors in 22-nm FDSOI CMOS Technology Multiplexed quantum transport using commercial off- the-shelf cmos at sub-kelvin temperatures,

Reference 8

Resolution: verified exact; doi, observed 2026-08-06T12:59:24.938189Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation ae440535-1961-4564-ae02-b50510ce9ab2 · outbound

This paper cites Qarpet: A crossbar chip for benchmarking semiconductor spin qubits,.

Large-scale characterization of Single-Hole Transistors in 22-nm FDSOI CMOS Technology Qarpet: A crossbar chip for benchmarking semiconductor spin qubits,

Reference 9

Resolution: unresolved; no resolver link, observed 2026-08-06T12:59:24.049536Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation bca2b160-2922-41cc-bb3b-e466c155db3e · outbound

This paper cites Rapid cryogenic characterisation of 1024 integrated silicon quantum dots.

Large-scale characterization of Single-Hole Transistors in 22-nm FDSOI CMOS Technology Rapid cryogenic characterisation of 1024 integrated silicon quantum dots

Reference 10

Resolution: unresolved; no resolver link, observed 2026-08-06T12:59:24.146737Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation ef2514e4-111c-4a9e-ba44-beda2f17e75e · outbound

This paper cites CMOS on-chip thermometry at deep cryogenic temperatures,.

Large-scale characterization of Single-Hole Transistors in 22-nm FDSOI CMOS Technology CMOS on-chip thermometry at deep cryogenic temperatures,

Reference 11

Resolution: verified fuzzy; raw_fallback, observed 2026-08-06T12:59:26.801462Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 6b1301d1-530a-4622-a2d9-e026445f5509 · outbound

This paper cites Single dopant impact on electrical characteristics of SOI NMOSFETs with effective length down to 10nm,.

Large-scale characterization of Single-Hole Transistors in 22-nm FDSOI CMOS Technology Single dopant impact on electrical characteristics of SOI NMOSFETs with effective length down to 10nm,

Reference 12

Resolution: verified fuzzy; raw_fallback, observed 2026-08-06T12:59:26.620096Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation b6f6eb7b-ff09-48ca-9802-46d94151a0e3 · outbound

This paper cites Subthreshold channels at the edges of nanoscale triple-gate silicon transistors,.

Large-scale characterization of Single-Hole Transistors in 22-nm FDSOI CMOS Technology Subthreshold channels at the edges of nanoscale triple-gate silicon transistors,

Reference 13

Resolution: verified fuzzy; raw_fallback, observed 2026-08-06T12:59:26.481234Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 1aa1a425-8880-4a52-8476-5af0f622ed13 · outbound

This paper cites Quantum Transport in 40-nm MOSFETs at Deep- Cryogenic Temperatures,.

Large-scale characterization of Single-Hole Transistors in 22-nm FDSOI CMOS Technology Quantum Transport in 40-nm MOSFETs at Deep- Cryogenic Temperatures,

Reference 14

Resolution: verified exact; raw_fallback, observed 2026-08-06T12:59:25.625226Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 4199e337-577c-4c1b-8b5b-a7fa5fd13aef · outbound

This paper cites an unresolved cited work.

Large-scale characterization of Single-Hole Transistors in 22-nm FDSOI CMOS Technology Unresolved cited work

Reference 15

Resolution: unresolved; raw_fallback, observed 2026-08-06T12:59:26.304719Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation a7a92b59-e2da-461a-a9eb-7c16cc289c12 · outbound

This paper cites The use of fast Fourier transform for the estimation of power spectra: A method based on time averaging over short, modified periodograms,.

Large-scale characterization of Single-Hole Transistors in 22-nm FDSOI CMOS Technology The use of fast Fourier transform for the estimation of power spectra: A method based on time averaging over short, modified periodograms,

Reference 16

Resolution: verified exact; raw_fallback, observed 2026-08-06T12:59:25.385524Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 3087943c-27f0-48f7-814d-e1522a6fb8b0 · outbound

This paper cites Available: http://ieeexplore.ieee.org/document/5556224/.

Large-scale characterization of Single-Hole Transistors in 22-nm FDSOI CMOS Technology Available: http://ieeexplore.ieee.org/document/5556224/

Reference 194

Resolution: verified exact; raw_fallback, observed 2026-08-06T12:59:25.838898Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation f920d274-99f9-457e-9ea1-5a50a6b718ca · outbound

This paper cites Scaling silicon-based quantum computing using CMOS technology: State-of-the-art, Challenges and Perspectives.

Large-scale characterization of Single-Hole Transistors in 22-nm FDSOI CMOS Technology Scaling silicon-based quantum computing using CMOS technology: State-of-the-art, Challenges and Perspectives

Reference 2020

Resolution: metadata mismatch; local_arxiv, observed 2026-08-06T12:59:26.119841Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Pith citing papers

Observation 27e3b5e7-1ec8-4766-b10f-c3d26d81cd87 · inbound

Hardware-Tailored Resource Estimation for Magic-State Distillation on Silicon Spin Qubits cites this paper.

Hardware-Tailored Resource Estimation for Magic-State Distillation on Silicon Spin Qubits Large-scale characterization of Single-Hole Transistors in 22-nm FDSOI CMOS Technology

Reference 85

Resolution: verified exact; arxiv_id, observed 2026-06-29T12:13:27.428727Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.