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Characterization of spurious-electron signals in the double-phase argon TPC of the DarkSide-50 experiment
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Characterization of spurious-electron signals in the double-phase argon TPC of the DarkSide-50 experiment
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Spurious-electron signals in dual-phase noble-liquid time projection chambers have been observed in both xenon and argon Time Projection Chambers (TPCs). This paper presents the first comprehensive study of spurious electrons in argon, using data collected by the DarkSide-50 experiment at the INFN Laboratori Nazionali del Gran Sasso (LNGS). Understanding these events is a key factor in improving the sensitivity of low-mass dark matter searches exploiting ionization signals in dual-phase noble liquid TPCs. We find that a significant fraction of spurious-electron events, ranging from 30 to 70% across the experiment's lifetime, are caused by electrons captured from impurities and later released with delays of order 5-50 ms. The rate of spurious-electron events is found to correlate with the operational condition of the purification system and the total event rate in the detector. Finally, we present evidence that multi-electron spurious electron events may originate from photo-ionization of the steel grid used to define the electric fields. These observations indicate the possibility of reduction of the background in future experiments and hint at possible spurious electron production mechanisms.
Forward citations
Cited by 2 Pith papers
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Search for two-neutrino double electron capture in $^{36}$Ar with the DarkSide-50 detector
No excess is seen for 2EC2ν in 36Ar; DarkSide-50 sets T1/2 > 9.2×10^19 yr (90% CL) with ~12 ton-day UAr exposure and 0.007% 36Ar abundance.
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Sensitivity to low-mass WIMPs with an improved liquid argon ionization response model within the DarkSide programme
An updated Thomas-Imel ionization model for liquid argon, constrained by ReD calibration data, produces new world-leading exclusion limits on 1-3 GeV/c² WIMPs.
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