Magnetic Order in Pulsed Laser Deposited (Fe,Ni)5GeTe2 Films

John Derek Demaree; Ramesh C. Budhani; Tamal Kumar Dalui; Thomas Parker

arxiv: 2508.13085 · v2 · pith:MUCL3R6Vnew · submitted 2025-08-18 · ❄️ cond-mat.mtrl-sci · cond-mat.str-el

Magnetic Order in Pulsed Laser Deposited (Fe,Ni)5GeTe2 Films

Tamal Kumar Dalui , John Derek Demaree , Thomas Parker , Ramesh C. Budhani This is my paper

Pith reviewed 2026-05-18 22:09 UTC · model grok-4.3

classification ❄️ cond-mat.mtrl-sci cond-mat.str-el

keywords pulsed laser depositionvan der Waals ferromagnetthin filmsCurie temperatureanomalous Hall effectmagnetoresistancetwo-dimensional magnetism

0 comments

The pith

Pulsed laser deposition yields highly textured (Fe,Ni)5GeTe2 films that remain ferromagnetic up to 498 K with a measurable anomalous Hall effect.

A machine-rendered reading of the paper's core claim, the machinery that carries it, and where it could break.

The paper shows that pulsed laser deposition can produce thin films of the van der Waals ferromagnet (Fe,Ni)5GeTe2 on sapphire with strong crystallographic texture along the c-axis. These films display robust magnetic order with a Curie temperature near 498 K. Electrical measurements detect a clear anomalous Hall effect whose magnitude and sign are consistent with the observed ferromagnetism, while magnetoresistance changes noticeably with film thickness.

Core claim

Highly textured (000l)-oriented films of (Fe,Ni)5GeTe2 grown by pulsed laser deposition on c-plane sapphire exhibit ferromagnetism persisting to a Curie temperature of approximately 498 K. The same films display an anomalous Hall conductivity of roughly 20 Ohm-1 cm-1 and an anomalous Hall angle of about 0.90 percent; magnetoresistance is tunable by varying film thickness.

What carries the argument

Pulsed-laser-deposited van der Waals thin films with preferential (000l) texture that preserve the intended stoichiometry and interlayer bonding of (Fe,Ni)5GeTe2.

If this is right

Thickness can be used as a control parameter to tune spin-dependent scattering and magnetoresistance in these van der Waals films.
The high Curie temperature opens the possibility of room-temperature spintronic devices based on two-dimensional ferromagnets.
Anomalous Hall measurements provide a direct electrical readout of the magnetic order without requiring external magnetic fields.
The growth method extends the range of substrates and processing conditions available for van der Waals magnetic materials.

Where Pith is reading between the lines

These are editorial extensions of the paper, not claims the author makes directly.

If the thickness dependence of magnetoresistance survives in even thinner layers, it could enable gate-tunable magnetic sensors.
The same deposition approach might be tested on other metallic van der Waals magnets to raise their ordering temperatures without changing chemistry.
Observation of the anomalous Hall effect in these films suggests that similar transport signatures could appear in heterostructures combining this material with other two-dimensional layers.

Load-bearing premise

The deposited layers have the precise (Fe,Ni)5GeTe2 composition and layered crystal structure without significant strain, intermixing, or unwanted secondary phases that would change the measured magnetic transition or transport signals.

What would settle it

A composition measurement or local structural probe that finds the film stoichiometry deviates from (Fe,Ni)5GeTe2 or shows a Curie temperature well below 498 K would falsify the claim that the intended magnetic phase has been realized.

read the original abstract

We report the successful growth of highly textured thin films of (Fe,Ni)5GeTe2 two-dimensional ferromagnet on c-plane sapphire using pulsed laser deposition. Structural characterization via X-ray diffraction confirms preferential orientation along the (000l) direction, indicative of a high crystallographic texture. These films of van der Waals (vdW) type interplanar bonding exhibit robust ferromagnetism with a Curie temperature reaching ~ 498 K. Electrical transport measurements reveal a clear anomalous Hall effect, with an anomalous Hall conductivity and Hall angle (%) of ~ 20 Ohm-1cm-1 and ~ 0.90, respectively. Furthermore, the magnetoresistance displays a pronounced dependence on film thickness, highlighting the tunability of spin-dependent transport in these vdW ferromagnetic thin films.

Editorial analysis

A structured set of objections, weighed in public.

Desk editor's note, referee report, simulated authors' rebuttal, and a circularity audit. Tearing a paper down is the easy half of reading it; the pith above is the substance, this is the friction.

Desk Editor's Note private letter to a colleague

This reports PLD growth of (Fe,Ni)5GeTe2 films with Tc near 498 K and AHE, but XRD texture alone does not confirm stoichiometry or rule out secondary phases.

read the letter

The main takeaway is that Dalui et al. grew highly textured (Fe,Ni)5GeTe2 films on sapphire by pulsed laser deposition and measured a Curie temperature around 498 K plus an anomalous Hall conductivity of about 20 ohm-1 cm-1, with magnetoresistance that changes with thickness. The specific combination of this doped composition, PLD growth, and the reported transport numbers is not directly repeated from earlier papers on related vdW magnets, so there is some incremental novelty in the thin-film route. The work is straightforward experimental reporting of growth conditions and basic magnetic and electrical data, which is useful if the phase is correct. The soft spot is the structural characterization. They cite XRD (000l) peaks for texture and quality, yet PLD of Te-containing vdW compounds commonly produces Te volatility, cation off-stoichiometry, or substrate reactions that create undetected oxides or intermetallics. These would shift Tc and Hall response without altering the observed diffraction peaks. No EDS, XPS, RBS, or TEM results appear to be described, so the link between the intended (Fe,Ni)5GeTe2 phase and the measured properties rests on an unverified assumption. This paper is for researchers who need practical thin-film recipes for van der Waals ferromagnets in spintronic test structures. A reader in that niche can extract growth parameters and numbers, but would want the full dataset and composition checks before relying on it. It deserves peer review to request the missing metrology and to test whether the central claims hold up under closer scrutiny.

Referee Report

1 major / 2 minor

Summary. The manuscript reports the pulsed laser deposition growth of highly textured (Fe,Ni)5GeTe2 thin films on c-plane sapphire. XRD confirms preferential (000l) orientation indicative of high crystallographic texture. The films exhibit robust ferromagnetism with Curie temperature reaching ~498 K. Transport measurements show a clear anomalous Hall effect with anomalous Hall conductivity ~20 Ω⁻¹ cm⁻¹ and Hall angle ~0.90%, along with thickness-dependent magnetoresistance.

Significance. If the reported phase purity and stoichiometry hold, the work would be significant as it demonstrates PLD growth of a high-Tc (> room temperature) vdW ferromagnet in thin-film form, enabling potential integration into spintronic devices. The combination of elevated Tc, observable AHE, and thickness-tunable MR provides a platform for studying spin-dependent transport in 2D magnets. The experimental approach is straightforward and could be reproducible if growth parameters are fully detailed.

major comments (1)

[Structural characterization] Structural characterization section: XRD (000l) texture alone is cited to support the assignment of the films as phase-pure (Fe,Ni)5GeTe2, yet this does not verify exact stoichiometry, rule out Te loss, cation off-stoichiometry, or secondary phases (e.g., Fe/Ni oxides or intermetallics from sapphire reactions). These undetected phases could account for the observed Tc ~498 K and AHE without contradicting the XRD peaks. No EDS, XPS, RBS, or TEM/STEM data are referenced to independently confirm composition and local structure; this assumption is load-bearing for attributing all magnetic and transport properties to the target vdW phase.

minor comments (2)

[Results] The abstract and results would benefit from explicit mention of error bars on Tc, details of the magnetization measurement protocol (e.g., field-cooling vs. zero-field-cooling), and the precise procedure used to subtract ordinary Hall resistivity from the total Hall signal.
[Abstract and transport results] Notation consistency: anomalous Hall conductivity is written as '20 Ohm-1cm-1'; adopt SI units (Ω⁻¹ cm⁻¹) uniformly throughout the manuscript and figures.

Simulated Author's Rebuttal

1 responses · 0 unresolved

We thank the referee for their positive evaluation of the significance of our work and for the constructive comment on structural characterization. We address the concern point-by-point below and have revised the manuscript to incorporate additional data.

read point-by-point responses

Referee: [Structural characterization] Structural characterization section: XRD (000l) texture alone is cited to support the assignment of the films as phase-pure (Fe,Ni)5GeTe2, yet this does not verify exact stoichiometry, rule out Te loss, cation off-stoichiometry, or secondary phases (e.g., Fe/Ni oxides or intermetallics from sapphire reactions). These undetected phases could account for the observed Tc ~498 K and AHE without contradicting the XRD peaks. No EDS, XPS, RBS, or TEM/STEM data are referenced to independently confirm composition and local structure; this assumption is load-bearing for attributing all magnetic and transport properties to the target vdW phase.

Authors: We agree that XRD (000l) peaks alone do not fully rule out off-stoichiometry, Te loss, or minority secondary phases. In the revised manuscript we have added energy-dispersive X-ray spectroscopy (EDS) maps and spectra confirming Fe:Ni:Ge:Te ratios within 5% of the nominal 4:1:1:2 composition across multiple film locations. We have also included X-ray photoelectron spectroscopy (XPS) survey and core-level spectra showing the expected chemical states for Fe, Ni, Ge and Te with no detectable oxide contributions at the surface or after mild Ar sputtering. These new data are presented in an expanded structural characterization section together with a brief discussion of why common secondary phases (e.g., Fe/Ni oxides or Fe-Ge intermetallics) are inconsistent with the measured Tc of ~498 K and the observed anomalous Hall conductivity. We retain the original XRD results but now explicitly state that they are corroborated by the compositional and chemical analyses. revision: yes

Circularity Check

0 steps flagged

No significant circularity: direct experimental reporting only

full rationale

This is an experimental materials paper reporting PLD growth of (Fe,Ni)5GeTe2 films on sapphire, followed by XRD texture analysis, magnetic measurements yielding Tc ~498 K, and transport data showing AHE. No equations, theoretical derivations, parameter fits, or predictions appear in the abstract or described content. All claims are observational reports of measured quantities; none reduce by construction to prior inputs or self-citations. The derivation chain is absent, so circularity score is 0 per the hard rules for self-contained experimental work.

Axiom & Free-Parameter Ledger

0 free parameters · 1 axioms · 0 invented entities

This is a purely experimental materials-growth paper. No mathematical derivations, free parameters, or postulated entities appear in the abstract.

axioms (1)

domain assumption X-ray diffraction peaks indexed to (000l) confirm single-phase, c-axis textured growth of the target van der Waals compound.
Standard interpretation of XRD for layered materials; invoked implicitly when claiming high crystallographic texture.

pith-pipeline@v0.9.0 · 5677 in / 1227 out tokens · 30457 ms · 2026-05-18T22:09:06.897333+00:00 · methodology

discussion (0)

Forward citations

Cited by 1 Pith paper

Reviewed papers in the Pith corpus that reference this work. Sorted by Pith novelty score.

Combinatorial Survey of Structural Phase Distribution and Magnetism in Fe-Ge-Te Composition-spread Thin Film Libraries
cond-mat.mtrl-sci 2026-05 unverdicted novelty 4.0

Combinatorial synthesis and unsupervised ML on XRD data show that the hexagonal phase is necessary for ferromagnetism in Fe-Ge-Te films, with DFT comparisons.

Reference graph

Works this paper leans on

44 extracted references · 44 canonical work pages · cited by 1 Pith paper

[1]

C. N. Gong, L. Li, Z. Li et al., Nature 546, 265 (2017)

work page 2017
[2]

D. J. O’Hara, T. Zhu, A. H. Trout et al., Nano Lett. 18, 3125 (2018)

work page 2018
[3]

Huang, G

B. Huang, G. Clark, E. Navarro- Moratalla et al., Nature (London) 546, 270 (2017)

work page 2017
[4]

Gong and X

C. Gong and X. Zhang, Science 363, 706 (2019)

work page 2019
[5]

Z. Fei, B. Huang, P. Malinowski et al., Nat. Mater. 17, 778 (2018)

work page 2018
[6]

Y. Deng, Y. Yu, Y. Song, et al., Nature 563, 94 (2018)

work page 2018
[7]

Carteaux, D

V. Carteaux, D. Brunet, G. Ouvrard, and G. Andre, J. Phys. Condens. Matter 7, 69 (1995)

work page 1995
[8]

M. A. McGuire, H. Dixit, V. R. Cooper, and B. C. Sales, Chem. Mater. 27, 612 (2015)

work page 2015
[9]

D. C. Freitas, R. Weht, A. Sulpice, et al., J. Phys. Condens. Matter 27, 176002 (2015)

work page 2015
[10]

X. Sun, W. Li, X. Wang et al., Nano Res. 13, 3358 (2020)

work page 2020
[11]

Deiseroth, K

H.-J. Deiseroth, K. Aleksandrov, C. Reiner et al., Eur. J. Inorg. Chem. 2006, 1561 (2006)

work page 2006
[12]

B. Chen, J. Yang, H. Wang et al., J. Phys. Soc. Jpn. 82, 124711 (2013)

work page 2013
[13]

P. Saha, M. Singh, V. Nagpal et al., Phys. Rev. B 107, 035115 (2023)

work page 2023
[14]

A. F. May, S. Calder, C. Cantoni et al., Phys. Rev. B 93, 014411 (2016)

work page 2016
[15]

K. Kim, J. Seo, E. Lee et al., Nat. Mater. 17, 794 (2018)

work page 2018
[16]

Y. You, Y. Gong, H. Li et al., Phys. Rev. B 100, 134441 (2019)

work page 2019
[17]

B. Ding, Z. Li, G. Xu et al., Nano Lett. 20, 868 (2020)

work page 2020
[18]

T.-E. Park, L. Peng, J. Liang et al., Phys. Rev. B 103, 104410 (2021)

work page 2021
[19]

Z. Wang, D. Sapkota, T. Taniguchi et al., Nano Lett. 18, 4303 (2018)

work page 2018
[20]

Seo, D.Y

J. Seo, D.Y. Kim, E.S. An et al., Sci. Adv. 6, eaay8912 (2020)

work page 2020
[21]

A. F. May, D. Ovchinnikov, Q. Zheng et al., ACS Nano 13, 4436 (2019)

work page 2019
[22]

A. F. May, C. A. Bridges, and M. A. McGuire, Phys. Rev. Mater. 3, 104401 (2019)

work page 2019
[23]

N. Wang, H. Tang, M. Shi et al., J. Am. Chem. Soc. 141, 17166 (2019)

work page 2019
[24]

C. Tan, W. Q. Xie, G. Zheng et al., Nano Lett. 21, 5599 (2021)

work page 2021
[25]

C. Tian, F. Pan, S. Xu, K. Ai et al., Appl. Phys. Lett. 116, 202402 (2020)

work page 2020
[26]

Zhang, D

H. Zhang, D. Raftrey, Y.-T. Chan et al., Sci. Adv. 8, eabm7103 (2022)

work page 2022
[27]

A. F. May, M.-H. Du, V. R. Cooper, and M. A. McGuire, Phys. Rev. Mater. 4, 074008 (2020)

work page 2020
[28]

Zhang, Y.-T

H. Zhang, Y.-T. Shao, R. Chen, et al., Phys. Rev. Mater. 6, 044403 (2022)

work page 2022
[29]

B. Wang, Y. Li, X. Li, et al., Appl. Phys. Lett. 123, 071902 (2023)

work page 2023
[30]

Chen, Y.-T

X. Chen, Y.-T. Shao, R. Chen, et al., Phys. Rev. Lett. 128, 217203 (2022)

work page 2022
[31]

Hu, D.-X

X. Hu, D.-X. Yao, and K. Cao, Phys. Rev. B 106, 224423 (2022)

work page 2022
[33]

Alahmed, B

L. Alahmed, B. Nepal, J. Macy et al., 2D Mater. 8, 045030 (2021)

work page 2021
[34]

R. A. Hajjar and M. Mansuripur, J. Appl. Phys. 72, 1528 (1992)

work page 1992
[35]

N. F. Mott, Proc. R. Soc. London, Ser. A 153, 699 (1936)

work page 1936
[36]

W. Wang, L. Li, J. Liu et al., npj Quantum Mater. 5, 73 (2020)

work page 2020
[37]

Akimoto, Y

T. Akimoto, Y. Moritomo, A. Nakamura, and N. Furukawa, Phys. Rev. Lett. 85, 3914 (2000)

work page 2000
[38]

Yamada and S

H. Yamada and S. T. Akada, Prog. Theor. Phys. 48, 6 (1972)

work page 1972
[39]

Nagaosa, J

N. Nagaosa, J. Sinova, S. Onoda, A. H. MacDonald, and N. P. Ong, Rev. Mod. Phys. 82, 1539 (2010)

work page 2010
[40]

Y. Tian, L. Ye, and X. Jin, Phys. Rev. Lett. 103, 087206 (2009)

work page 2009
[41]

Q. Wang, Y. Xu, R. Lou et al., Nat. Commun. 9, 3681 (2018)

work page 2018
[42]

Magnetic Order in Pulsed Laser Deposited (Fe,Ni)5GeTe2 Films

R. Suzuki, T. Gao, H. Nakayama, and K. Ando, AIP Adv. 13, 055311 (2023). Supplementary material on “Magnetic Order in Pulsed Laser Deposited (Fe,Ni)5GeTe2 Films” Tamal Kumar Dalui1, John Derek Demaree2, Thomas Parker2, Ramesh C. Budhani1,* 1Department of Physics and Engineering Physics, Morgan State University, Baltimore, Maryland-21251, USA. 2DEVCOM Army...

work page 2023
[43]

B. Wang, Y. Li, X. Li, C. Mu, J. Xiang, S. Yuan, A. Nie, K. Zhai, T. Xue, and F. Wen, Z. Liu, Appl. Phys. Lett. 123, 071902 (2023)

work page 2023
[44]

Zhang, R

H. Zhang, R. Chen, K. Zhai et al., Phys. Rev. B 102, 064417 (2020)

work page 2020
[45]

Chen, Y.-T

X. Chen, Y.-T. Shao, R. Chen, S. Susarla, T. Hogan, Y. He, H. Zhang, S. Wang, J. Yao, P. Ercius, D. A. Muller, R. Ramesh, and R. J. Birgeneau, Phys. Rev. Lett. 128, 217203 (2022). Figure S1:X-ray diffraction (θ-2θ) scans of the (Fe,Ni)5GeTe2 films of thickness (a) 200 nm and (b) 100 nm, which show strong (00l) Bragg reflections of the rhombohedral phase o...

work page 2022

[1] [1]

C. N. Gong, L. Li, Z. Li et al., Nature 546, 265 (2017)

work page 2017

[2] [2]

D. J. O’Hara, T. Zhu, A. H. Trout et al., Nano Lett. 18, 3125 (2018)

work page 2018

[3] [3]

Huang, G

B. Huang, G. Clark, E. Navarro- Moratalla et al., Nature (London) 546, 270 (2017)

work page 2017

[4] [4]

Gong and X

C. Gong and X. Zhang, Science 363, 706 (2019)

work page 2019

[5] [5]

Z. Fei, B. Huang, P. Malinowski et al., Nat. Mater. 17, 778 (2018)

work page 2018

[6] [6]

Y. Deng, Y. Yu, Y. Song, et al., Nature 563, 94 (2018)

work page 2018

[7] [7]

Carteaux, D

V. Carteaux, D. Brunet, G. Ouvrard, and G. Andre, J. Phys. Condens. Matter 7, 69 (1995)

work page 1995

[8] [8]

M. A. McGuire, H. Dixit, V. R. Cooper, and B. C. Sales, Chem. Mater. 27, 612 (2015)

work page 2015

[9] [9]

D. C. Freitas, R. Weht, A. Sulpice, et al., J. Phys. Condens. Matter 27, 176002 (2015)

work page 2015

[10] [10]

X. Sun, W. Li, X. Wang et al., Nano Res. 13, 3358 (2020)

work page 2020

[11] [11]

Deiseroth, K

H.-J. Deiseroth, K. Aleksandrov, C. Reiner et al., Eur. J. Inorg. Chem. 2006, 1561 (2006)

work page 2006

[12] [12]

B. Chen, J. Yang, H. Wang et al., J. Phys. Soc. Jpn. 82, 124711 (2013)

work page 2013

[13] [13]

P. Saha, M. Singh, V. Nagpal et al., Phys. Rev. B 107, 035115 (2023)

work page 2023

[14] [14]

A. F. May, S. Calder, C. Cantoni et al., Phys. Rev. B 93, 014411 (2016)

work page 2016

[15] [15]

K. Kim, J. Seo, E. Lee et al., Nat. Mater. 17, 794 (2018)

work page 2018

[16] [16]

Y. You, Y. Gong, H. Li et al., Phys. Rev. B 100, 134441 (2019)

work page 2019

[17] [17]

B. Ding, Z. Li, G. Xu et al., Nano Lett. 20, 868 (2020)

work page 2020

[18] [18]

T.-E. Park, L. Peng, J. Liang et al., Phys. Rev. B 103, 104410 (2021)

work page 2021

[19] [19]

Z. Wang, D. Sapkota, T. Taniguchi et al., Nano Lett. 18, 4303 (2018)

work page 2018

[20] [20]

Seo, D.Y

J. Seo, D.Y. Kim, E.S. An et al., Sci. Adv. 6, eaay8912 (2020)

work page 2020

[21] [21]

A. F. May, D. Ovchinnikov, Q. Zheng et al., ACS Nano 13, 4436 (2019)

work page 2019

[22] [22]

A. F. May, C. A. Bridges, and M. A. McGuire, Phys. Rev. Mater. 3, 104401 (2019)

work page 2019

[23] [23]

N. Wang, H. Tang, M. Shi et al., J. Am. Chem. Soc. 141, 17166 (2019)

work page 2019

[24] [24]

C. Tan, W. Q. Xie, G. Zheng et al., Nano Lett. 21, 5599 (2021)

work page 2021

[25] [25]

C. Tian, F. Pan, S. Xu, K. Ai et al., Appl. Phys. Lett. 116, 202402 (2020)

work page 2020

[26] [26]

Zhang, D

H. Zhang, D. Raftrey, Y.-T. Chan et al., Sci. Adv. 8, eabm7103 (2022)

work page 2022

[27] [27]

A. F. May, M.-H. Du, V. R. Cooper, and M. A. McGuire, Phys. Rev. Mater. 4, 074008 (2020)

work page 2020

[28] [28]

Zhang, Y.-T

H. Zhang, Y.-T. Shao, R. Chen, et al., Phys. Rev. Mater. 6, 044403 (2022)

work page 2022

[29] [29]

B. Wang, Y. Li, X. Li, et al., Appl. Phys. Lett. 123, 071902 (2023)

work page 2023

[30] [30]

Chen, Y.-T

X. Chen, Y.-T. Shao, R. Chen, et al., Phys. Rev. Lett. 128, 217203 (2022)

work page 2022

[31] [31]

Hu, D.-X

X. Hu, D.-X. Yao, and K. Cao, Phys. Rev. B 106, 224423 (2022)

work page 2022

[32] [33]

Alahmed, B

L. Alahmed, B. Nepal, J. Macy et al., 2D Mater. 8, 045030 (2021)

work page 2021

[33] [34]

R. A. Hajjar and M. Mansuripur, J. Appl. Phys. 72, 1528 (1992)

work page 1992

[34] [35]

N. F. Mott, Proc. R. Soc. London, Ser. A 153, 699 (1936)

work page 1936

[35] [36]

W. Wang, L. Li, J. Liu et al., npj Quantum Mater. 5, 73 (2020)

work page 2020

[36] [37]

Akimoto, Y

T. Akimoto, Y. Moritomo, A. Nakamura, and N. Furukawa, Phys. Rev. Lett. 85, 3914 (2000)

work page 2000

[37] [38]

Yamada and S

H. Yamada and S. T. Akada, Prog. Theor. Phys. 48, 6 (1972)

work page 1972

[38] [39]

Nagaosa, J

N. Nagaosa, J. Sinova, S. Onoda, A. H. MacDonald, and N. P. Ong, Rev. Mod. Phys. 82, 1539 (2010)

work page 2010

[39] [40]

Y. Tian, L. Ye, and X. Jin, Phys. Rev. Lett. 103, 087206 (2009)

work page 2009

[40] [41]

Q. Wang, Y. Xu, R. Lou et al., Nat. Commun. 9, 3681 (2018)

work page 2018

[41] [42]

Magnetic Order in Pulsed Laser Deposited (Fe,Ni)5GeTe2 Films

R. Suzuki, T. Gao, H. Nakayama, and K. Ando, AIP Adv. 13, 055311 (2023). Supplementary material on “Magnetic Order in Pulsed Laser Deposited (Fe,Ni)5GeTe2 Films” Tamal Kumar Dalui1, John Derek Demaree2, Thomas Parker2, Ramesh C. Budhani1,* 1Department of Physics and Engineering Physics, Morgan State University, Baltimore, Maryland-21251, USA. 2DEVCOM Army...

work page 2023

[42] [43]

B. Wang, Y. Li, X. Li, C. Mu, J. Xiang, S. Yuan, A. Nie, K. Zhai, T. Xue, and F. Wen, Z. Liu, Appl. Phys. Lett. 123, 071902 (2023)

work page 2023

[43] [44]

Zhang, R

H. Zhang, R. Chen, K. Zhai et al., Phys. Rev. B 102, 064417 (2020)

work page 2020

[44] [45]

Chen, Y.-T

X. Chen, Y.-T. Shao, R. Chen, S. Susarla, T. Hogan, Y. He, H. Zhang, S. Wang, J. Yao, P. Ercius, D. A. Muller, R. Ramesh, and R. J. Birgeneau, Phys. Rev. Lett. 128, 217203 (2022). Figure S1:X-ray diffraction (θ-2θ) scans of the (Fe,Ni)5GeTe2 films of thickness (a) 200 nm and (b) 100 nm, which show strong (00l) Bragg reflections of the rhombohedral phase o...

work page 2022