Typed states for the displayed outbound observations.
Source: paper_references, paper_reference_links, observed 2026-08-04T21:37:34.376841Z
Paper Citation Record · LEDGER
Innovative Oxide Transistor Satisfying Performance and Reliability Simultaneously by Understanding of Physics and Materials Properties
As of 11 August 2026, this Paper Citation Record lists 3 of 3 outbound references and 0 inbound Pith citation observations for arXiv:2509.07886.
A citation records a reference. It does not transfer a finding from one paper to another.
Coverage vector
One-hop event checks from named stored sources.
Source: scholarly_work_events, retraction_status_cache, observed 2026-08-11T06:34:44.6726+00:00
Pith citing papers itemized under the disclosed page cap.
Source: paper_references, paper_reference_links
A source-named dated measurement, never combined with another source.
Source: cited_works
Reference resolution
3 of 3 outbound references displayed
- verified exact0
- verified fuzzy3
- unresolved0
- parse uncertain0
- malformed identifier0
- metadata mismatch0
External citation measurements
No source-named external measurement is stored.
Outbound references
Observation d959870b-4cb6-43aa-8a8f-91066cf8ea46 · outbound
This paper cites Colinge,IEEE Trans.
Innovative Oxide Transistor Satisfying Performance and Reliability Simultaneously by Understanding of Physics and Materials Properties Colinge,IEEE Trans
Reference 2
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-04T21:37:35.183399Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-11T06:34:44.6726+00:00.
Observation 7074e5d2-8bf0-4961-bea5-10ef4a8decd8 · outbound
This paper cites [4]W.Fichtner,IEEE Solid State Circuits and Technology Workshop on Scaling and Microlithography,New York, 1980.
Innovative Oxide Transistor Satisfying Performance and Reliability Simultaneously by Understanding of Physics and Materials Properties [4]W.Fichtner,IEEE Solid State Circuits and Technology Workshop on Scaling and Microlithography,New York, 1980
Reference 3
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-04T21:37:34.949241Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-11T06:34:44.6726+00:00.
Observation d2628816-bae6-4d49-8535-1ad7ea51d8ae · outbound
This paper cites Rha, “, IEEE Trans.
Innovative Oxide Transistor Satisfying Performance and Reliability Simultaneously by Understanding of Physics and Materials Properties Rha, “, IEEE Trans
Reference 5
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-04T21:37:34.714931Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-11T06:34:44.6726+00:00.
Pith citing papers
No inbound Pith citation observations are available.