Paper Citation Record · LEDGER

Mortality of ultra-thin LGADs and PiN diodes from high energy deposition

As of 24 July 2026, this Paper Citation Record lists 24 of 24 outbound references and 1 inbound Pith citation observation for arXiv:2604.11571.

A citation records a reference. It does not transfer a finding from one paper to another.

pith.paper-citation-record.v1
2604.11571 v2

Coverage vector

measured 24 of 24 reference resolution

Typed states for the displayed outbound observations.

Source: paper_references, paper_reference_links, observed 2026-05-10T14:55:33.008785Z

measured 25 of 25 standing notices

One-hop event checks from named stored sources.

Source: scholarly_work_events, retraction_status_cache, observed 2026-07-24T06:31:00.690269+00:00

measured 1 of 1 inbound itemization

Pith citing papers itemized under the disclosed page cap.

Source: paper_references, paper_reference_links, observed 2026-05-07T17:36:17.598196Z

measured 0 of 1 external citation measurements

A source-named dated measurement, never combined with another source.

Source: pith, observed 2026-05-11T23:16:37.117650Z

Reference resolution

24 of 24 outbound references displayed

verified exact0
verified fuzzy24
unresolved0
parse uncertain0
malformed identifier0
metadata mismatch0

External citation measurements

No source-named external measurement is stored.

Outbound references

Observation ce34cf3a-0fbe-4893-bd1b-92bcf9a3cc2c · outbound

This paper cites Pellegrini, P.

Mortality of ultra-thin LGADs and PiN diodes from high energy deposition Pellegrini, P

Reference 1

Resolution: verified fuzzy; raw_fallback, observed 2026-05-18T11:02:35.746931Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-07-24T06:31:00.690269+00:00.

Observation ed1583b2-dc47-4969-ab5c-40ade91f090a · outbound

This paper cites Cartiglia, R.

Mortality of ultra-thin LGADs and PiN diodes from high energy deposition Cartiglia, R

Reference 2

Resolution: verified fuzzy; raw_fallback, observed 2026-05-18T11:02:35.768264Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-07-24T06:31:00.690269+00:00.

Observation b7c712cb-d852-4b8d-9d84-6702eb912bc2 · outbound

This paper cites Technical report, CERN, Geneva.

Mortality of ultra-thin LGADs and PiN diodes from high energy deposition Technical report, CERN, Geneva

Reference 3

Resolution: verified fuzzy; raw_fallback, observed 2026-05-18T11:02:35.772475Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-07-24T06:31:00.690269+00:00.

Observation ca2a985c-222c-4d5c-b342-260b72be4aa6 · outbound

This paper cites A MIP Timing Detector for the CMS Phase-2 Upgrade.

Mortality of ultra-thin LGADs and PiN diodes from high energy deposition A MIP Timing Detector for the CMS Phase-2 Upgrade

Reference 4

Resolution: verified fuzzy; raw_fallback, observed 2026-05-18T11:02:35.754932Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-07-24T06:31:00.690269+00:00.

Observation f2847c58-945c-45e9-a1ca-ecf62e96896a · outbound

This paper cites The IDEA detector concept for FCC-ee.

Mortality of ultra-thin LGADs and PiN diodes from high energy deposition The IDEA detector concept for FCC-ee

Reference 5

Resolution: verified fuzzy; raw_fallback, observed 2026-05-18T11:02:35.757577Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-07-24T06:31:00.690269+00:00.

Observation b397286c-df7a-416e-a562-9534b2f3f596 · outbound

This paper cites Holmes, Sergo Jindariani, Kiley E.

Mortality of ultra-thin LGADs and PiN diodes from high energy deposition Holmes, Sergo Jindariani, Kiley E

Reference 6

Resolution: verified fuzzy; raw_fallback, observed 2026-05-18T11:02:35.701839Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-07-24T06:31:00.690269+00:00.

Observation 5d463102-bc8f-4755-851e-0a8d5a3ec00f · outbound

This paper cites an unresolved cited work.

Mortality of ultra-thin LGADs and PiN diodes from high energy deposition Unresolved cited work

Reference 7

Resolution: verified fuzzy; raw_fallback, observed 2026-05-18T11:02:35.665007Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-07-24T06:31:00.690269+00:00.

Observation 60dbf5e4-d460-4b4f-8f29-08e151d2e265 · outbound

This paper cites an unresolved cited work.

Mortality of ultra-thin LGADs and PiN diodes from high energy deposition Unresolved cited work

Reference 8

Resolution: verified fuzzy; raw_fallback, observed 2026-05-18T11:02:35.736417Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-07-24T06:31:00.690269+00:00.

Observation a7fbf5c1-ae3e-4f6f-8198-957988a84be5 · outbound

This paper cites et al Kramberger.

Mortality of ultra-thin LGADs and PiN diodes from high energy deposition et al Kramberger

Reference 9

Resolution: verified fuzzy; raw_fallback, observed 2026-05-18T11:02:35.721258Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-07-24T06:31:00.690269+00:00.

Observation e00bc38a-de71-410f-8ace-5ab9366899a4 · outbound

This paper cites Beresford et al.

Mortality of ultra-thin LGADs and PiN diodes from high energy deposition Beresford et al

Reference 10

Resolution: verified fuzzy; raw_fallback, observed 2026-05-18T11:02:35.724919Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-07-24T06:31:00.690269+00:00.

Observation 68b536cd-3fce-49af-a3ef-969238e6f09f · outbound

This paper cites First study of single-event burnout in very-thin planar silicon sensors.Frontiers in Physics, V olume 13 - 2025.

Mortality of ultra-thin LGADs and PiN diodes from high energy deposition First study of single-event burnout in very-thin planar silicon sensors.Frontiers in Physics, V olume 13 - 2025

Reference 11

Resolution: verified fuzzy; raw_fallback, observed 2026-05-18T11:02:35.728931Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-07-24T06:31:00.690269+00:00.

Observation 5fdc95a6-5a76-41e4-8583-b6e096f878d5 · outbound

This paper cites an unresolved cited work.

Mortality of ultra-thin LGADs and PiN diodes from high energy deposition Unresolved cited work

Reference 12

Resolution: verified fuzzy; raw_fallback, observed 2026-05-18T11:02:35.764264Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-07-24T06:31:00.690269+00:00.

Observation 54aa6ebf-0311-4c53-8284-5a3f7a26c87d · outbound

This paper cites an unresolved cited work.

Mortality of ultra-thin LGADs and PiN diodes from high energy deposition Unresolved cited work

Reference 13

Resolution: verified fuzzy; raw_fallback, observed 2026-05-18T11:02:35.743441Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-07-24T06:31:00.690269+00:00.

Observation 065773b4-dddc-4b62-b501-165ffa6fe9b6 · outbound

This paper cites Dachs and J.

Mortality of ultra-thin LGADs and PiN diodes from high energy deposition Dachs and J

Reference 14

Resolution: verified fuzzy; raw_fallback, observed 2026-05-18T11:02:35.715156Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-07-24T06:31:00.690269+00:00.

Observation aba7b8ac-9cce-44fe-8c94-68a55858d3b6 · outbound

This paper cites Waskiewicz and J.

Mortality of ultra-thin LGADs and PiN diodes from high energy deposition Waskiewicz and J

Reference 15

Resolution: verified fuzzy; raw_fallback, observed 2026-05-18T11:02:35.707173Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-07-24T06:31:00.690269+00:00.

Observation e0a5d5ec-6229-44fd-9357-65ff3925bd6a · outbound

This paper cites https://www.bnl.gov/tandem/.

Mortality of ultra-thin LGADs and PiN diodes from high energy deposition https://www.bnl.gov/tandem/

Reference 16

Resolution: verified fuzzy; raw_fallback, observed 2026-05-18T11:02:35.760170Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-07-24T06:31:00.690269+00:00.

Observation 87e0cfee-3252-40c7-9ad0-64a1e85dd640 · outbound

This paper cites Thieberger.

Mortality of ultra-thin LGADs and PiN diodes from high energy deposition Thieberger

Reference 17

Resolution: verified fuzzy; raw_fallback, observed 2026-05-18T11:02:35.770161Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-07-24T06:31:00.690269+00:00.

Observation 3de9ad3d-8fa1-4817-a552-388f3e88377f · outbound

This paper cites an unresolved cited work.

Mortality of ultra-thin LGADs and PiN diodes from high energy deposition Unresolved cited work

Reference 18

Resolution: verified fuzzy; raw_fallback, observed 2026-05-18T11:02:35.752364Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-07-24T06:31:00.690269+00:00.

Observation fb6f0c2a-1144-4690-83e2-b646cd005303 · outbound

This paper cites an unresolved cited work.

Mortality of ultra-thin LGADs and PiN diodes from high energy deposition Unresolved cited work

Reference 19

Resolution: verified fuzzy; raw_fallback, observed 2026-05-18T11:02:35.712376Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-07-24T06:31:00.690269+00:00.

Observation 5ef129af-1c41-4fcb-bfc9-10cfc67d19ca · outbound

This paper cites Development of a technology for the fabrication of Low-Gain Avalanche Diodes at BNL.Nuclear Inst.

Mortality of ultra-thin LGADs and PiN diodes from high energy deposition Development of a technology for the fabrication of Low-Gain Avalanche Diodes at BNL.Nuclear Inst

Reference 20

Resolution: verified fuzzy; raw_fallback, observed 2026-05-18T11:02:35.679263Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-07-24T06:31:00.690269+00:00.

Observation ad9d5916-08d4-4092-80c2-14c1738a67b6 · outbound

This paper cites Rhode Island Nuclear Science Center, n.d.

Mortality of ultra-thin LGADs and PiN diodes from high energy deposition Rhode Island Nuclear Science Center, n.d

Reference 21

Resolution: verified fuzzy; raw_fallback, observed 2026-05-18T11:02:35.740753Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-07-24T06:31:00.690269+00:00.

Observation 78b85ee5-b581-4ede-bae1-c8248bcb9fd2 · outbound

This paper cites Radiation Damage in Silicon Detector Devices.

Mortality of ultra-thin LGADs and PiN diodes from high energy deposition Radiation Damage in Silicon Detector Devices

Reference 22

Resolution: verified fuzzy; raw_fallback, observed 2026-05-18T11:02:35.693214Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-07-24T06:31:00.690269+00:00.

Observation dc42243d-1c84-49da-8efd-f8633022ed57 · outbound

This paper cites History of the seu test facilitiy, n.d.

Mortality of ultra-thin LGADs and PiN diodes from high energy deposition History of the seu test facilitiy, n.d

Reference 23

Resolution: verified fuzzy; raw_fallback, observed 2026-05-18T11:02:35.710360Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-07-24T06:31:00.690269+00:00.

Observation fbd114b1-fd88-42fc-bcb3-cc00255845b0 · outbound

This paper cites LGAD mortality triggered by highly ionizing particles.

Mortality of ultra-thin LGADs and PiN diodes from high energy deposition LGAD mortality triggered by highly ionizing particles

Reference 24

Resolution: verified fuzzy; raw_fallback, observed 2026-05-18T11:02:35.763548Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-07-24T06:31:00.690269+00:00.

Pith citing papers

Observation 2f42fbdb-65b9-4399-be7e-66414bd5b7ef · inbound

Systematic Investigation of Acceptor Removal in HPK LGADs with Modified Gain Layers cites this paper.

Systematic Investigation of Acceptor Removal in HPK LGADs with Modified Gain Layers Mortality of ultra-thin LGADs and PiN diodes from high energy deposition

Reference 11

Resolution: verified exact; local_arxiv, observed 2026-05-11T23:16:37.126357Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-07-24T06:31:00.690269+00:00.