Paper Citation Record · LEDGER

Anomalous Platinum and Oxygen Transport during Electroforming of NbOx Memristors

As of 6 August 2026, this Paper Citation Record lists 11 of 11 outbound references and 0 inbound Pith citation observations for arXiv:2604.14680.

A citation records a reference. It does not transfer a finding from one paper to another.

pith.paper-citation-record.v1
2604.14680 v1

Coverage vector

measured 11 of 11 reference resolution

Typed states for the displayed outbound observations.

Source: paper_references, paper_reference_links, observed 2026-05-10T11:39:20.378551Z

measured 11 of 11 standing notices

One-hop event checks from named stored sources.

Source: scholarly_work_events, retraction_status_cache, observed 2026-08-06T06:34:29.942622+00:00

measured 0 of 0 inbound itemization

Pith citing papers itemized under the disclosed page cap.

Source: paper_references, paper_reference_links

measured 0 of 1 external citation measurements

A source-named dated measurement, never combined with another source.

Source: cited_works

Reference resolution

11 of 11 outbound references displayed

verified exact2
verified fuzzy5
unresolved4
parse uncertain0
malformed identifier0
metadata mismatch0

External citation measurements

No source-named external measurement is stored.

Outbound references

Observation bbfd7a3f-98ca-41b8-826d-af2cbbe10775 · outbound

This paper cites When subjected to electrical stress, MOM devices typically exhibit non-volatile, volatile, or combined resistive switching responses.

Anomalous Platinum and Oxygen Transport during Electroforming of NbOx Memristors When subjected to electrical stress, MOM devices typically exhibit non-volatile, volatile, or combined resistive switching responses

Reference 1

Resolution: verified fuzzy; raw_fallback, observed 2026-05-19T13:43:06.016597Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.

Observation a10a75ab-68a7-4500-8e6d-5166e3fd5103 · outbound

This paper cites an unresolved cited work.

Anomalous Platinum and Oxygen Transport during Electroforming of NbOx Memristors Unresolved cited work

Reference 2

Resolution: unresolved; raw_fallback, observed 2026-05-19T13:43:06.012292Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.

Observation 026115d5-45b9-487c-b7e3-37d665a4ee64 · outbound

This paper cites Metal-oxide interface reactions and their effect on integrated resistive/threshold switching in NbOx.

Anomalous Platinum and Oxygen Transport during Electroforming of NbOx Memristors Metal-oxide interface reactions and their effect on integrated resistive/threshold switching in NbOx

Reference 3

Resolution: verified exact; arxiv_id, observed 2026-05-10T11:40:18.905695Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.

Observation 0220e956-e259-4cd6-9c3c-8a6318950aa0 · outbound

This paper cites an unresolved cited work.

Anomalous Platinum and Oxygen Transport during Electroforming of NbOx Memristors Unresolved cited work

Reference 4

Resolution: unresolved; raw_fallback, observed 2026-05-19T13:43:06.018193Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.

Observation ed4b3f84-0abc-48c3-a1e4-cbb3d0dd8ee0 · outbound

This paper cites Figure S3: (a) Electroforming step of a 20 μm device with Pt/Nb/Nb₂O₅/Pt structure under current-controlled testing with a bidirectional current sweep from 0 to 800μA.

Anomalous Platinum and Oxygen Transport during Electroforming of NbOx Memristors Figure S3: (a) Electroforming step of a 20 μm device with Pt/Nb/Nb₂O₅/Pt structure under current-controlled testing with a bidirectional current sweep from 0 to 800μA

Reference 5

Resolution: verified fuzzy; raw_fallback, observed 2026-05-19T13:43:06.008300Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.

Observation 9135bb41-632c-4f3a-af64-491a02739c0e · outbound

This paper cites Figure S4: (a) ToF-SIMS images showing oxygen (O-) distribution in a Pt/Nb/Nb₂O₅/Pt device (maximum current applied through the device = 800 μA).

Anomalous Platinum and Oxygen Transport during Electroforming of NbOx Memristors Figure S4: (a) ToF-SIMS images showing oxygen (O-) distribution in a Pt/Nb/Nb₂O₅/Pt device (maximum current applied through the device = 800 μA)

Reference 6

Resolution: verified fuzzy; raw_fallback, observed 2026-05-19T13:43:06.006503Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.

Observation 02e60045-f191-47a1-9be8-1ce1417dea2e · outbound

This paper cites The finite element simulations employed the electric currents and heat transfer modules in COMSOL to simultaneously solve the coupled electrical and thermal transport equations.

Anomalous Platinum and Oxygen Transport during Electroforming of NbOx Memristors The finite element simulations employed the electric currents and heat transfer modules in COMSOL to simultaneously solve the coupled electrical and thermal transport equations

Reference 7

Resolution: verified fuzzy; raw_fallback, observed 2026-05-19T13:43:06.010436Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.

Observation 295d188a-d7c8-4045-bbb5-857f56ad16a0 · outbound

This paper cites an unresolved cited work.

Anomalous Platinum and Oxygen Transport during Electroforming of NbOx Memristors Unresolved cited work

Reference 8

Resolution: unresolved; raw_fallback, observed 2026-05-19T13:43:06.002302Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.

Observation b0b75129-c67e-4002-a9d4-082137259fdc · outbound

This paper cites an unresolved cited work.

Anomalous Platinum and Oxygen Transport during Electroforming of NbOx Memristors Unresolved cited work

Reference 9

Resolution: unresolved; raw_fallback, observed 2026-05-19T13:43:06.004372Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.

Observation 794bd23b-0634-43c6-88f9-53a41250b2d7 · outbound

This paper cites Figure S7: Electroforming and TEM imaging of the filamentary area in devices with (a) 10 μm Pt/Nb(5 nm)/NbOx/Pt and (b) 10 μm Pt/Nb(10 nm)/NbOx/Pt structures.

Anomalous Platinum and Oxygen Transport during Electroforming of NbOx Memristors Figure S7: Electroforming and TEM imaging of the filamentary area in devices with (a) 10 μm Pt/Nb(5 nm)/NbOx/Pt and (b) 10 μm Pt/Nb(10 nm)/NbOx/Pt structures

Reference 10

Resolution: verified fuzzy; raw_fallback, observed 2026-05-19T13:43:06.014494Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.

Observation b131c08f-e5a4-420b-9b9a-5285088aeeb0 · outbound

This paper cites (c) Cycle- to-cycle variability of threshold and hold voltages in a Pt/Nb/Nb2O5/Pt device with a 30 nm Nb electrode.

Anomalous Platinum and Oxygen Transport during Electroforming of NbOx Memristors (c) Cycle- to-cycle variability of threshold and hold voltages in a Pt/Nb/Nb2O5/Pt device with a 30 nm Nb electrode

Reference 11

Resolution: verified exact; doi, observed 2026-05-10T11:40:18.626404Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-06T06:34:29.942622+00:00.

Pith citing papers

No inbound Pith citation observations are available.