Typed states for the displayed outbound observations.
Source: paper_references, paper_reference_links, observed 2026-06-30T15:26:11.510992Z
Paper Citation Record · LEDGER
Impact of Surface Treatment on Noise in PL-Measurements of Silicon Vacancies in 4H-SiC Lateral pin-Diodes
As of 23 August 2026, this Paper Citation Record lists 6 of 6 outbound references and 0 inbound Pith citation observations for arXiv:2605.24157.
A citation records a reference. It does not transfer a finding from one paper to another.
Coverage vector
One-hop event checks from named stored sources.
Source: scholarly_work_events, retraction_status_cache, observed 2026-08-23T06:30:58.430688+00:00
Pith citing papers itemized under the disclosed page cap.
Source: paper_references, paper_reference_links
A source-named dated measurement, never combined with another source.
Source: cited_works
Reference resolution
6 of 6 outbound references displayed
- verified exact2
- verified fuzzy2
- unresolved0
- parse uncertain0
- malformed identifier0
- metadata mismatch2
External citation measurements
No source-named external measurement is stored.
Outbound references
Observation df092abb-5cc0-4b42-b6ff-ada3f89f3ae8 · outbound
This paper cites F.; Lanni, F.
Impact of Surface Treatment on Noise in PL-Measurements of Silicon Vacancies in 4H-SiC Lateral pin-Diodes F.; Lanni, F
Reference 1
- Resolution
- verified exact
- doi, observed 2026-06-30T15:34:47.688408Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation 7f910678-5ad8-432e-9562-2bec37f5ae28 · outbound
This paper cites (4 6 ) Riou, M.; Araujo, F.
Impact of Surface Treatment on Noise in PL-Measurements of Silicon Vacancies in 4H-SiC Lateral pin-Diodes (4 6 ) Riou, M.; Araujo, F
Reference 2
- Resolution
- verified exact
- doi, observed 2026-06-30T15:34:47.690045Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation c5687921-0bb2-42f6-b0df-f015ad575619 · outbound
This paper cites Doping-Related Photoluminescence Spectroscopy in 4H -SiC: 13th European Conference on Silicon Carbide and Related Materials, 2020.
Impact of Surface Treatment on Noise in PL-Measurements of Silicon Vacancies in 4H-SiC Lateral pin-Diodes Doping-Related Photoluminescence Spectroscopy in 4H -SiC: 13th European Conference on Silicon Carbide and Related Materials, 2020
Reference 3
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-07-08T17:35:10.287116Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation f7abaa77-c4d0-4800-b44f-6962f52ba5db · outbound
This paper cites Microchemicals - Application Notes.
Impact of Surface Treatment on Noise in PL-Measurements of Silicon Vacancies in 4H-SiC Lateral pin-Diodes Microchemicals - Application Notes
Reference 4
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-07-08T17:35:10.288848Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation 063d2d32-b305-4c11-bccd-bf2e06b7884f · outbound
This paper cites In: 2024 47th MIPRO ICT and Electronics Convention (MIPRO) (May 2024).
Impact of Surface Treatment on Noise in PL-Measurements of Silicon Vacancies in 4H-SiC Lateral pin-Diodes In: 2024 47th MIPRO ICT and Electronics Convention (MIPRO) (May 2024)
Reference 5
- Resolution
- metadata mismatch
- arxiv_id, observed 2026-06-30T15:34:47.686778Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation f6e3579c-5a70-4fa1-a81f-7bd816699d8d · outbound
This paper cites 2024 , volume =.
Impact of Surface Treatment on Noise in PL-Measurements of Silicon Vacancies in 4H-SiC Lateral pin-Diodes 2024 , volume =
Reference 6
- Resolution
- metadata mismatch
- arxiv_id, observed 2026-06-30T15:34:47.684064Z
Source-reported events for the cited work
correction dated 2025-04-24. Source: crossref record 10.1080/13183222.2025.2483622->10.1080/13183222.2024.2383905:correction, observed 2026-07-11T02:58:26.869733+00:00. This notice travels one citation hop only.
Pith citing papers
No inbound Pith citation observations are available.