Paper Citation Record · LEDGER

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection

As of 5 August 2026, this Paper Citation Record lists 47 of 47 outbound references and 0 inbound Pith citation observations for arXiv:2607.17401.

A citation records a reference. It does not transfer a finding from one paper to another.

pith.paper-citation-record.v1
2607.17401 v1

Coverage vector

measured 47 of 47 reference resolution

Typed states for the displayed outbound observations.

Source: paper_references, paper_reference_links, observed 2026-08-01T18:09:04.249758Z

measured 47 of 47 standing notices

One-hop event checks from named stored sources.

Source: scholarly_work_events, retraction_status_cache, observed 2026-08-04T06:34:03.388597+00:00

measured 0 of 0 inbound itemization

Pith citing papers itemized under the disclosed page cap.

Source: paper_references, paper_reference_links

measured 0 of 1 external citation measurements

A source-named dated measurement, never combined with another source.

Source: cited_works

Reference resolution

47 of 47 outbound references displayed

verified exact0
verified fuzzy0
unresolved47
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malformed identifier0
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External citation measurements

No source-named external measurement is stored.

Outbound references

Observation 005853d0-6da5-49df-96b7-ea73aebc0155 · outbound

This paper cites an unresolved cited work.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection Unresolved cited work

Reference 1

Resolution: unresolved; no resolver link, observed 2026-08-01T18:08:58.084868Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation dcdcf3b3-bf78-4fa9-9381-5460e57fd4aa · outbound

This paper cites an unresolved cited work.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection Unresolved cited work

Reference 2

Resolution: unresolved; no resolver link, observed 2026-08-01T18:08:58.151972Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 54a5f902-da90-4f66-8476-884a11f356cf · outbound

This paper cites Evaluation and development of deep neural networks for image super-resolution in optical microscopy.Nature Methods, 18(2):194–202, 2021.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection Evaluation and development of deep neural networks for image super-resolution in optical microscopy.Nature Methods, 18(2):194–202, 2021

Reference 3

Resolution: unresolved; no resolver link, observed 2026-08-01T18:08:58.293877Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 079c5a53-784e-47df-9e68-b14edb66efbc · outbound

This paper cites Automated Semiconductor Defect Inspection in Scanning Electron Microscope Images: a Systematic Review.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection Automated Semiconductor Defect Inspection in Scanning Electron Microscope Images: a Systematic Review

Reference 4

Resolution: unresolved; no resolver link, observed 2026-08-01T18:08:58.417993Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 7c6be0a9-6085-4759-bacd-cc825a353eec · outbound

This paper cites A multiscale attention mechanism super-resolution confocal microscopy for wafer defect detection.IEEE Transactions on Automation Science and Engineering, 22:1016–1027, 2025.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection A multiscale attention mechanism super-resolution confocal microscopy for wafer defect detection.IEEE Transactions on Automation Science and Engineering, 22:1016–1027, 2025

Reference 5

Resolution: unresolved; no resolver link, observed 2026-08-01T18:08:58.493519Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 528f2a97-b181-42fe-aa03-937252b5bb26 · outbound

This paper cites AI image enhancement for failure analysis in 3D quantum information technology.Scientific Reports, 15:24078, 2025.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection AI image enhancement for failure analysis in 3D quantum information technology.Scientific Reports, 15:24078, 2025

Reference 6

Resolution: unresolved; no resolver link, observed 2026-08-01T18:08:58.663652Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 403a0096-f010-470b-9339-704c9cec5758 · outbound

This paper cites an unresolved cited work.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection Unresolved cited work

Reference 7

Resolution: unresolved; no resolver link, observed 2026-08-01T18:08:58.822478Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 8b5edb52-cde9-4b8f-a690-1bdcec518d46 · outbound

This paper cites Super-resolution approach tailored for wafer transmission electron microscopy images.Scientific Reports, 16(1):10662, 2026.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection Super-resolution approach tailored for wafer transmission electron microscopy images.Scientific Reports, 16(1):10662, 2026

Reference 8

Resolution: unresolved; no resolver link, observed 2026-08-01T18:08:58.923759Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 803796e8-012c-45ce-b806-716e8be92614 · outbound

This paper cites Enhanced deep residual networks for single image super-resolution.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection Enhanced deep residual networks for single image super-resolution

Reference 9

Resolution: unresolved; no resolver link, observed 2026-08-01T18:08:59.039556Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 9e14e541-5814-427b-b3c7-72831846653b · outbound

This paper cites Image super-resolution using very deep residual channel attention networks.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection Image super-resolution using very deep residual channel attention networks

Reference 10

Resolution: unresolved; no resolver link, observed 2026-08-01T18:08:59.156765Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 2ae460f5-9854-425d-9df2-d6a2397412bd · outbound

This paper cites Real-ESRGAN: Training real-world blind super-resolution with pure synthetic data.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection Real-ESRGAN: Training real-world blind super-resolution with pure synthetic data

Reference 11

Resolution: unresolved; no resolver link, observed 2026-08-01T18:08:59.274782Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 148aeac3-9375-46c1-b7c7-4c6826835c06 · outbound

This paper cites SwinIR: Image restoration using swin transformer.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection SwinIR: Image restoration using swin transformer

Reference 12

Resolution: unresolved; no resolver link, observed 2026-08-01T18:08:59.427707Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 77be015b-c909-4100-bb14-7737c9349be8 · outbound

This paper cites Activating more pixels in image super-resolution transformer.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection Activating more pixels in image super-resolution transformer

Reference 13

Resolution: unresolved; no resolver link, observed 2026-08-01T18:08:59.572809Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 2cc202a9-4cf5-4046-a8d7-25847378c8be · outbound

This paper cites Simple baselines for image restoration.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection Simple baselines for image restoration

Reference 14

Resolution: unresolved; no resolver link, observed 2026-08-01T18:08:59.725426Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation e25306d9-6073-4ad9-853e-989b6ffbd756 · outbound

This paper cites The relationship between precision-recall and roc curves.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection The relationship between precision-recall and roc curves

Reference 15

Resolution: unresolved; no resolver link, observed 2026-08-01T18:08:59.868204Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 34c91b96-d729-4637-a48d-af5d9e47cdad · outbound

This paper cites Carinthia-S dataset, 2025.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection Carinthia-S dataset, 2025

Reference 16

Resolution: unresolved; no resolver link, observed 2026-08-01T18:09:00.022040Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation c0ca7670-0dc3-4153-b013-4dce26fd047f · outbound

This paper cites Statistical comparisons of classifiers over multiple data sets.Journal of Machine Learning Research, 7:1–30, 2006.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection Statistical comparisons of classifiers over multiple data sets.Journal of Machine Learning Research, 7:1–30, 2006

Reference 17

Resolution: unresolved; no resolver link, observed 2026-08-01T18:09:00.187603Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 6dd7df6f-2ff4-49f5-97bc-9a6b6ee1826b · outbound

This paper cites Learning a deep convolutional network for image super- resolution.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection Learning a deep convolutional network for image super- resolution

Reference 18

Resolution: unresolved; no resolver link, observed 2026-08-01T18:09:00.305326Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 8ffbb5e5-9f41-4f32-abfe-b8582a67e44d · outbound

This paper cites Accurate image super-resolution using very deep convolutional networks.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection Accurate image super-resolution using very deep convolutional networks

Reference 19

Resolution: unresolved; no resolver link, observed 2026-08-01T18:09:00.411239Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation a5ab0391-b844-4056-b035-490f389751e3 · outbound

This paper cites Deep laplacian pyramid networks for fast and accurate super-resolution.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection Deep laplacian pyramid networks for fast and accurate super-resolution

Reference 20

Resolution: unresolved; no resolver link, observed 2026-08-01T18:09:00.562157Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation f9161d2e-ad14-43b4-9d38-a67d72728a82 · outbound

This paper cites Residual dense network for image super-resolution.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection Residual dense network for image super-resolution

Reference 21

Resolution: unresolved; no resolver link, observed 2026-08-01T18:09:00.730737Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 05798f20-6ff3-485a-b007-580c41155908 · outbound

This paper cites Pre-trained image processing transformer.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection Pre-trained image processing transformer

Reference 22

Resolution: unresolved; no resolver link, observed 2026-08-01T18:09:00.848433Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 0e5858dc-4d95-4fa6-ac02-c925a6668e2c · outbound

This paper cites Toward real-world single image super-resolution: A new benchmark and a new model.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection Toward real-world single image super-resolution: A new benchmark and a new model

Reference 23

Resolution: unresolved; no resolver link, observed 2026-08-01T18:09:00.967116Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 4d28638c-0a14-4cce-8fc0-345eddb53afa · outbound

This paper cites Designing a practical degradation model for deep blind image super-resolution.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection Designing a practical degradation model for deep blind image super-resolution

Reference 24

Resolution: unresolved; no resolver link, observed 2026-08-01T18:09:01.084742Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 332995ac-19bf-4eb2-a79a-98f0964510f1 · outbound

This paper cites Photo-realistic single image super-resolution using a generative adversarial network.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection Photo-realistic single image super-resolution using a generative adversarial network

Reference 25

Resolution: unresolved; no resolver link, observed 2026-08-01T18:09:01.229070Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation e1e83d9e-b897-4540-aed8-e33c8dae77e4 · outbound

This paper cites ESRGAN: Enhanced super-resolution generative adversarial networks.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection ESRGAN: Enhanced super-resolution generative adversarial networks

Reference 26

Resolution: unresolved; no resolver link, observed 2026-08-01T18:09:01.343668Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation a75e932c-77fd-42b5-b654-a0dc9ee7a503 · outbound

This paper cites Fleet, and Mohammad Norouzi.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection Fleet, and Mohammad Norouzi

Reference 27

Resolution: unresolved; no resolver link, observed 2026-08-01T18:09:01.470645Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation d13e8c88-6879-44b4-a690-a1d0642b91e6 · outbound

This paper cites Bentolila, Comert Kural, and Aydogan Ozcan.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection Bentolila, Comert Kural, and Aydogan Ozcan

Reference 28

Resolution: unresolved; no resolver link, observed 2026-08-01T18:09:01.638690Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 02286c7a-7ea9-456e-ae2a-d27567216bac · outbound

This paper cites Deep learning for sparse scanning electron microscopy.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection Deep learning for sparse scanning electron microscopy

Reference 29

Resolution: unresolved; no resolver link, observed 2026-08-01T18:09:01.775335Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation e60247b5-0634-4811-9f5e-7c287afcb2c6 · outbound

This paper cites Defect Inspection & Review.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection Defect Inspection & Review

Reference 30

Resolution: unresolved; no resolver link, observed 2026-08-01T18:09:01.907043Z

Source-reported events for the cited work

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Observation 6e0914ec-5143-4f64-9d6e-c8edc8d19adf · outbound

This paper cites KLA BBP 40th Anniversary.https://bbp.kla.com/, 2024.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection KLA BBP 40th Anniversary.https://bbp.kla.com/, 2024

Reference 31

Resolution: unresolved; no resolver link, observed 2026-08-01T18:09:02.083293Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 0c09674d-250e-4407-a445-10fec11ebfad · outbound

This paper cites KLA-Tencor Introduces Comprehensive Wafer Inspection and Review Portfo- lio for Leading IC Technologies.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection KLA-Tencor Introduces Comprehensive Wafer Inspection and Review Portfo- lio for Leading IC Technologies

Reference 32

Resolution: unresolved; no resolver link, observed 2026-08-01T18:09:02.212684Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 1f4e4ee9-c910-44a1-a634-6ab6fc54ed41 · outbound

This paper cites Fully convolutional networks for semantic segmentation.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection Fully convolutional networks for semantic segmentation

Reference 33

Resolution: unresolved; no resolver link, observed 2026-08-01T18:09:02.353607Z

Source-reported events for the cited work

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Observation 7b60b8a5-c1d4-493c-84a4-3d6d2b447619 · outbound

This paper cites U-Net: Convolutional networks for biomedical image segmentation.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection U-Net: Convolutional networks for biomedical image segmentation

Reference 34

Resolution: unresolved; no resolver link, observed 2026-08-01T18:09:02.464398Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 43570b90-25d0-49ed-8fc3-23ddb68b8875 · outbound

This paper cites Rethinking Atrous Convolution for Semantic Image Segmentation.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection Rethinking Atrous Convolution for Semantic Image Segmentation

Reference 35

Resolution: unresolved; no resolver link, observed 2026-08-01T18:09:02.625053Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 4e1f0784-d409-499c-9e9e-954d805959dc · outbound

This paper cites MVTec AD: A comprehensive real-world dataset for unsupervised anomaly detection.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection MVTec AD: A comprehensive real-world dataset for unsupervised anomaly detection

Reference 36

Resolution: unresolved; no resolver link, observed 2026-08-01T18:09:02.838331Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 8b5c0409-8788-4efa-8ac1-80b95099103f · outbound

This paper cites The MVTec AD 2 dataset: Advanced scenarios for unsupervised anomaly detection.International Journal of Computer Vision, 134(4):175, 2026.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection The MVTec AD 2 dataset: Advanced scenarios for unsupervised anomaly detection.International Journal of Computer Vision, 134(4):175, 2026

Reference 37

Resolution: unresolved; no resolver link, observed 2026-08-01T18:09:02.981236Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 5d88f04d-cf58-4404-9e8c-999cf341ca0f · outbound

This paper cites PaDiM: A patch distribution modeling framework for anomaly detection and localization.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection PaDiM: A patch distribution modeling framework for anomaly detection and localization

Reference 38

Resolution: unresolved; no resolver link, observed 2026-08-01T18:09:03.093865Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 396e7238-8134-48f5-abd7-945003030a68 · outbound

This paper cites Carinthia dataset, 2024.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection Carinthia dataset, 2024

Reference 39

Resolution: unresolved; no resolver link, observed 2026-08-01T18:09:03.186782Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 5278e01d-9a45-4efc-8494-c03f167c54db · outbound

This paper cites Task-driven super resolution: Object detection in low-resolution images.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection Task-driven super resolution: Object detection in low-resolution images

Reference 40

Resolution: unresolved; no resolver link, observed 2026-08-01T18:09:03.313235Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation feacafbd-88b1-4bd4-8e8e-c5617018cdf2 · outbound

This paper cites Beyond image super-resolution for image recognition with task-driven perceptual loss.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection Beyond image super-resolution for image recognition with task-driven perceptual loss

Reference 41

Resolution: unresolved; no resolver link, observed 2026-08-01T18:09:03.480926Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 228dd8a6-138e-4e07-bffd-b27a6f3fc86b · outbound

This paper cites Beyond Visual Fidelity: Benchmarking Super-Resolution Models for Large-Scale Remote Sensing Imagery via Downstream Task Integration.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection Beyond Visual Fidelity: Benchmarking Super-Resolution Models for Large-Scale Remote Sensing Imagery via Downstream Task Integration

Reference 42

Resolution: unresolved; no resolver link, observed 2026-08-01T18:09:03.641830Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 5fefd199-ec43-46b4-a6d2-2807fe2211fa · outbound

This paper cites Weinberger.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection Weinberger

Reference 43

Resolution: unresolved; no resolver link, observed 2026-08-01T18:09:03.798006Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 2cf4a7d2-ba8f-422d-9db6-477605f83b8e · outbound

This paper cites Cooper, and Milos Hauskrecht.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection Cooper, and Milos Hauskrecht

Reference 44

Resolution: unresolved; no resolver link, observed 2026-08-01T18:09:03.905092Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation d7a985ea-d220-46fe-9c16-3ba27f3a0774 · outbound

This paper cites Goodman.Introduction to Fourier Optics.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection Goodman.Introduction to Fourier Optics

Reference 45

Resolution: unresolved; no resolver link, observed 2026-08-01T18:09:03.995874Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation fa06b684-f1c5-43a9-a609-42749e300f17 · outbound

This paper cites Gonzalez and Richard E.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection Gonzalez and Richard E

Reference 46

Resolution: unresolved; no resolver link, observed 2026-08-01T18:09:04.100771Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation be98eb1e-b591-4490-adfa-c83d383b7903 · outbound

This paper cites Janesick.Scientific Charge-Coupled Devices.

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection Janesick.Scientific Charge-Coupled Devices

Reference 47

Resolution: unresolved; no resolver link, observed 2026-08-01T18:09:04.249758Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Pith citing papers

No inbound Pith citation observations are available.