Paper Citation Record · LEDGER

Practical Evaluation of FFT-Based Thickness Extraction for Thick-Film Reflectometry

As of 14 August 2026, this Paper Citation Record lists 10 of 10 outbound references and 0 inbound Pith citation observations for arXiv:2608.10146.

A citation records a reference. It does not transfer a finding from one paper to another.

pith.paper-citation-record.v1
2608.10146 v1

Coverage vector

measured 10 of 10 reference resolution

Typed states for the displayed outbound observations.

Source: paper_references, paper_reference_links, observed 2026-08-14T04:15:56.673884Z

measured 10 of 10 standing notices

One-hop event checks from named stored sources.

Source: scholarly_work_events, retraction_status_cache, observed 2026-08-14T06:32:32.682623+00:00

measured 0 of 0 inbound itemization

Pith citing papers itemized under the disclosed page cap.

Source: paper_references, paper_reference_links

measured 0 of 1 external citation measurements

A source-named dated measurement, never combined with another source.

Source: cited_works

Reference resolution

10 of 10 outbound references displayed

verified exact2
verified fuzzy2
unresolved6
parse uncertain0
malformed identifier0
metadata mismatch0

External citation measurements

No source-named external measurement is stored.

Outbound references

Observation fef7c61c-9dc9-410e-8ad1-8876a1ac547e · outbound

This paper cites an unresolved cited work.

Practical Evaluation of FFT-Based Thickness Extraction for Thick-Film Reflectometry Unresolved cited work

Reference 1

Resolution: unresolved; raw_fallback, observed 2026-08-14T04:15:56.831365Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.

Observation 9674cb33-2650-4ba9-ba58-383ed832ab23 · outbound

This paper cites an unresolved cited work.

Practical Evaluation of FFT-Based Thickness Extraction for Thick-Film Reflectometry Unresolved cited work

Reference 2

Resolution: unresolved; raw_fallback, observed 2026-08-14T04:15:56.817977Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.

Observation aeb3de6a-97cf-40de-8b29-5425f2fc51bf · outbound

This paper cites Quinten, SN Appl.

Practical Evaluation of FFT-Based Thickness Extraction for Thick-Film Reflectometry Quinten, SN Appl

Reference 3

Resolution: verified exact; doi, observed 2026-08-14T04:15:56.724762Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.

Observation d815b604-baac-41a6-9bf0-1660488e6f9c · outbound

This paper cites an unresolved cited work.

Practical Evaluation of FFT-Based Thickness Extraction for Thick-Film Reflectometry Unresolved cited work

Reference 4

Resolution: unresolved; raw_fallback, observed 2026-08-14T04:15:56.806007Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.

Observation 03b92399-e228-46e7-9339-b7988f0001f6 · outbound

This paper cites an unresolved cited work.

Practical Evaluation of FFT-Based Thickness Extraction for Thick-Film Reflectometry Unresolved cited work

Reference 5

Resolution: verified exact; doi, observed 2026-08-14T04:15:56.712239Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.

Observation cc586877-7b2a-427a-8c14-fab45edcb884 · outbound

This paper cites an unresolved cited work.

Practical Evaluation of FFT-Based Thickness Extraction for Thick-Film Reflectometry Unresolved cited work

Reference 6

Resolution: unresolved; raw_fallback, observed 2026-08-14T04:15:56.789266Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.

Observation e18b465d-5186-4d82-82c2-54d5b1aab8ab · outbound

This paper cites an unresolved cited work.

Practical Evaluation of FFT-Based Thickness Extraction for Thick-Film Reflectometry Unresolved cited work

Reference 7

Resolution: unresolved; raw_fallback, observed 2026-08-14T04:15:56.778776Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.

Observation 50ee82ae-8aab-4121-94d7-b1352a98f8e3 · outbound

This paper cites Huang, C.

Practical Evaluation of FFT-Based Thickness Extraction for Thick-Film Reflectometry Huang, C

Reference 8

Resolution: verified fuzzy; raw_fallback, observed 2026-08-14T04:15:56.768242Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.

Observation 6de75659-7014-4793-93f3-d63b4064480a · outbound

This paper cites Angus Macleod, Thin-Film Optical Filters, Fifth Edition (CRC Press, 2017).

Practical Evaluation of FFT-Based Thickness Extraction for Thick-Film Reflectometry Angus Macleod, Thin-Film Optical Filters, Fifth Edition (CRC Press, 2017)

Reference 9

Resolution: verified fuzzy; raw_fallback, observed 2026-08-14T04:15:56.757264Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.

Observation 5d5d3712-4758-4347-baf9-24fcdb9d446d · outbound

This paper cites an unresolved cited work.

Practical Evaluation of FFT-Based Thickness Extraction for Thick-Film Reflectometry Unresolved cited work

Reference 10

Resolution: unresolved; raw_fallback, observed 2026-08-14T04:15:56.744597Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.

Pith citing papers

No inbound Pith citation observations are available.