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All-in-One Analog AI Hardware: On-Chip Training and Inference with Conductive-Metal-Oxide/HfOx ReRAM Devices

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arxiv 2502.04524 v4 pith:2WRRCVEI submitted 2025-02-06 cs.ET cs.AR

classification cs.ETcs.AR
keywords analoginferencetrainingarrayhfoxreramtechnologyall-in-one
verification ladder T0 review T1 audit T2 compute T3 formal
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Analog in-memory computing is an emerging paradigm designed to efficiently accelerate deep neural network workloads. Recent advancements have focused on either inference or training acceleration. However, a unified analog in-memory technology platform-capable of on-chip training, weight retention, and long-term inference acceleration-has yet to be reported. This work presents an all-in-one analog AI accelerator, combining these capabilities to enable energy-efficient, continuously adaptable AI systems. The platform leverages an array of analog filamentary conductive-metal-oxide (CMO)/HfOx resistive switching memory cells (ReRAM) integrated into the back-end-of-line (BEOL). The array demonstrates reliable resistive switching with voltage amplitudes below 1.5V, compatible with advanced technology nodes. The array multi-bit capability (over 32 stable states) and low programming noise (down to 10nS) enable a nearly ideal weight transfer process, more than an order of magnitude better than other memristive technologies. Inference performance is validated through matrix-vector multiplication simulations on a 64x64 array, achieving a root-mean-square error improvement by a factor of 20 at 1 second and 3 at 10 years after programming, compared to state-of-the-art. Training accuracy closely matching the software equivalent is achieved across different datasets. The CMO/HfOx ReRAM technology lays the foundation for efficient analog systems accelerating both inference and training in deep neural networks.

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Cited by 2 Pith papers

Reviewed papers in the Pith corpus that reference this work. Sorted by Pith novelty score. Full citation record

  1. Decoupling Electric Field and Temperature-Driven Atomistic Forming Mechanisms in TaOx/HfO2-Based ReRAMs using Reactive Molecular Dynamics Simulations

    cond-mat.mtrl-sci 2025-05 conditional novelty 6.0 of 10

    Reactive MD simulations of bilayer TaOx/HfO2 ReRAMs show forming begins with electric-field-driven Ta/Hf cation migration and anodic Ta depletion, while Joule heating accelerates filament growth through thermally acti...

  2. Memristor-Based Neural Network Accelerators for Space Applications: Enhancing Performance with Temporal Averaging and SIRENs

    eess.SY 2025-09 conditional novelty 5.0 of 10

    Simulated memristor-based SIREN networks with bit-slicing and temporal averaging reach test losses 0.010 and 0.007 on spacecraft guidance and asteroid geodesy, near digital baselines.

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