Pith. sign in

REVIEW

Possible Indications of Electronic Inhomogeneities in Superconducting Nanowire Detectors

Not yet reviewed by Pith; the record is open.

This paper has not been read by Pith yet. Machine review is queued; the pith claim, tier, and objections will appear here once it completes.

SPECIMEN: schema-true, not a live event

T0 review · schema-true

One-sentence machine reading of the paper's core claim.

pith:XXXXXXXX · record.json · timestamp

arxiv 1212.3984 v2 pith:3UDCD4T2 submitted 2012-12-17 cond-mat.supr-con

classification cond-mat.supr-con
keywords electronicinhomogeneitiessuperconductingdetectorsmaterialpossiblesamplestate
verification ladder T0 review T1 audit T2 compute T3 formal
0 comments
read the original abstract

The voltage-carrying state of superconducting NbTiN nanowires, used for single-photon detectors, is analyzed. Upon lowering the current, the wire returns to the superconducting state in a steplike pattern, which differs from sample to sample. Elimination of geometrical inhomogeneities, such as sharp corners, does not remove these steplike features. They appear to be intrinsic to the material. Since the material is strongly disordered, electronic inhomogeneities are considered as a possible cause. A thermal model, taking into account random variations of the electronic properties along the wire, is used as an interpretative framework.

Discussion (0). Sign in to comment.

Pith tools