pith. sign in

arxiv: 1003.1979 · v2 · pith:4BZSNRD5new · submitted 2010-03-09 · ❄️ cond-mat.supr-con · cond-mat.str-el

Stability of exfoliated Bi₂Sr₂Dy_xCa_(1-x)Cu₂O_(8+δ) studied by Raman microscopy

classification ❄️ cond-mat.supr-con cond-mat.str-el
keywords exfoliatedcrystalsramanappealingatomicbi2sr2cacu2o8bulkcarrier
0
0 comments X
read the original abstract

Nanometer thick cuprates are an appealing platform for devices as well as exploring the roles of dimensionality, disorder, and free carrier density in these compounds. To this end we have produced exfoliated crystals of Bi2Sr2CaCu2O8 on oxidized silicon substrates. The exfoliated crystals were characterized via Atomic Force and polarized Raman microscopies. Proper procedures for production, handling and monitoring of these thin oxides are described. Subtle differences between the exfoliated and bulk crystals are also discussed.

This paper has not been read by Pith yet.

discussion (0)

Sign in with ORCID, Apple, or X to comment. Anyone can read and Pith papers without signing in.