Integrity report for Localized Excitonic Emission in Wafer-Scale MOCVD-Grown GaSe 2D Nanosheets for Classical and Non-Classical Light Sources

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:2605.23418 · pith:2026:4N33PXNZFA5SV2QDVSVHVPKS6S

0Critical

0Advisory

6Detectors run

2026-05-28Last checked

Paper page arXiv integrity.json bundle.json

Detector runs

doi_title_agreement completed v1.0.0 · findings 0 · 2026-05-28 04:03:26.877256+00:00

doi_compliance completed v1.0.0 · findings 0 · 2026-05-28 03:54:34.669065+00:00

claim_evidence completed v1.0.0 · findings 0 · 2026-05-27 08:04:23.937762+00:00

citation_quote_validity completed v0.1.0 · findings 0 · 2026-05-25 15:50:15.660976+00:00

cited_work_retraction completed v1.0.0 · findings 0 · 2026-05-25 10:23:29.005741+00:00

ai_meta_artifact skipped v1.0.0 · findings 0 · 2026-05-25 02:35:19.864628+00:00

Findings

No public integrity findings for this paper.

Signed record

The machine-readable record for this paper lives at /pith/4N33PXNZ/integrity.json. Pith Number bundles also include signed pith.integrity.v1 events where a Pith Number exists.