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Analysis of high quality superconducting resonators: consequences for TLS properties in amorphous oxides

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arxiv 1512.02553 v1 pith:5E2FLD2W submitted 2015-12-08 cond-mat.mes-hall

classification cond-mat.mes-hall
keywords resonatorssuperconductingamorphousnoiseoxidespropertiesanalysiscapping
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abstract

$1/f$ noise caused by microscopic Two-Level Systems (TLS) is known to be very detrimental to the performance of superconducting quantum devices but the nature of these TLS is still poorly understood. Recent experiments with superconducting resonators indicates that interaction between TLS in the oxide at the film-substrate interface is not negligible. Here we present data on the loss and $1/f$ frequency noise from two different Nb resonators with and without Pt capping and discuss what conclusions can be drawn regarding the properties of TLS in amorphous oxides. We also estimate the concentration and dipole moment of the TLS.

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Cited by 1 Pith paper

Reviewed papers in the Pith corpus that reference this work. Sorted by Pith novelty score. Full citation record

  1. Material Loss Model Calibration for Tantalum Superconducting Resonators

    cond-mat.supr-con 2025-07 conditional novelty 6.0 of 10

    Fitting a TLS loss model to tantalum resonators from 2.3 to 15.7 GHz yields a TLS loss strength that increases roughly linearly with frequency.

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