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Analysis of the 3D distribution of self-assembled stacked quantum dots by electron tomography

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arxiv 1209.0892 v4 pith:6VZPIL4J submitted 2012-09-05 cond-mat.mtrl-sci

Jesús Hernández-Saz , Miriam Herrera , Diego Alonso-Álvarez , Sergio I. Molina This is my paper · ORCID
classification cond-mat.mtrl-sci
keywords distributionanalysisdotselectronquantumself-assembledstackedtomography
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This paper has been withdrawn by the authors. The 3D distribution of self-assembled stacked quantum dots (QDs) is a key parameter to obtain the highest performance in a variety of optoelectronic devices. In this work, we have measured this distribution in 3D using a combined procedure of needle-shape specimen preparation and electron tomography. We show that conventional 2D measurements of the distribution of QDs are not reliable, and only a 3D analysis allows an accurate correlation between the growth design and the structural characteristics.

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