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The Entropy Enigma: Success and Failure of Entropy Minimization

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arxiv 2405.05012 v2 pith:6Y2O37GJ submitted 2024-05-08 cs.CV

classification cs.CV
keywords modelaccuracyimagesentropymethodstepstestadapting
verification ladder T0 review T1 audit T2 compute T3 formal
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abstract

Entropy minimization (EM) is frequently used to increase the accuracy of classification models when they're faced with new data at test time. EM is a self-supervised learning method that optimizes classifiers to assign even higher probabilities to their top predicted classes. In this paper, we analyze why EM works when adapting a model for a few steps and why it eventually fails after adapting for many steps. We show that, at first, EM causes the model to embed test images close to training images, thereby increasing model accuracy. After many steps of optimization, EM makes the model embed test images far away from the embeddings of training images, which results in a degradation of accuracy. Building upon our insights, we present a method for solving a practical problem: estimating a model's accuracy on a given arbitrary dataset without having access to its labels. Our method estimates accuracy by looking at how the embeddings of input images change as the model is optimized to minimize entropy. Experiments on 23 challenging datasets show that our method sets the SoTA with a mean absolute error of $5.75\%$, an improvement of $29.62\%$ over the previous SoTA on this task. Our code is available at https://github.com/oripress/EntropyEnigma

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Forward citations

Cited by 2 Pith papers

Reviewed papers in the Pith corpus that reference this work. Sorted by Pith novelty score. Full citation record

  1. From LLMs to Edge: Parameter-Efficient Fine-Tuning on Edge Devices

    cs.LG 2025-07 conditional novelty 6.0 of 10

    On depthwise-separable CNNs, PEFT memory savings drop to about half of LLM levels, though LoRA and DoRA still cut update FLOPs by up to 95%.

  2. Continuous Self-Improvement of Large Language Models by Test-time Training with Verifier-Driven Sample Selection

    cs.CL 2025-05 reject novelty 4.0 of 10

    A test-time training method that fine-tunes LoRA adapters on verifier-selected high-confidence pseudo-labels, reporting large gains on math benchmarks, but evaluated on the same queries it adapts on.

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