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Integrity report for Internal Stresses and Formation of Switchable Nanowires at Thin Silica Film Edge

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1010.0193 · pith:2010:7ORV7PMNTJDVPG3YQXV5J5J7QB

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Paper page arXiv integrity.json bundle.json

Detector runs

Findings

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Signed record

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