Typed states for the displayed outbound observations.
Source: paper_references, paper_reference_links, observed 2026-08-12T15:41:39.047148Z
Paper Citation Record · LEDGER
Photon drag at the junction between metal and 2d semiconductor
As of 13 August 2026, this Paper Citation Record lists 17 of 17 outbound references and 0 inbound Pith citation observations for arXiv:2411.14075.
A citation records a reference. It does not transfer a finding from one paper to another.
Coverage vector
One-hop event checks from named stored sources.
Source: scholarly_work_events, retraction_status_cache, observed 2026-08-12T06:34:41.77262+00:00
Pith citing papers itemized under the disclosed page cap.
Source: paper_references, paper_reference_links
A source-named dated measurement, never combined with another source.
Source: cited_works
Reference resolution
17 of 17 outbound references displayed
- verified exact1
- verified fuzzy13
- unresolved3
- parse uncertain0
- malformed identifier0
- metadata mismatch0
External citation measurements
No source-named external measurement is stored.
Outbound references
Observation 1f6fee18-04fc-476c-ae6b-a02aaa89c5f7 · outbound
This paper cites 1 (A)], electromagnetic diffraction gives rise to the local z-component of electric field.
Photon drag at the junction between metal and 2d semiconductor 1 (A)], electromagnetic diffraction gives rise to the local z-component of electric field
Reference 1
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T15:41:39.499128Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.
Observation 861ab0e0-ef67-41dc-9c3c-a0c24698d401 · outbound
This paper cites We consider the most practical case of monochromatic waves, E(t) = Eω e−iωt + h .c., and similarly for other time-dependent quantities.
Photon drag at the junction between metal and 2d semiconductor We consider the most practical case of monochromatic waves, E(t) = Eω e−iωt + h .c., and similarly for other time-dependent quantities
Reference 4
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T15:41:39.459324Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.
Observation 3c44c8c1-a72b-44ea-9b71-a3771773584f · outbound
This paper cites (3) The superscript ‖ implies taking only the x and y com- ponents of the respective vector, it stems from the two- dimensional character of the current density.
Photon drag at the junction between metal and 2d semiconductor (3) The superscript ‖ implies taking only the x and y com- ponents of the respective vector, it stems from the two- dimensional character of the current density
Reference 5
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T15:41:39.433635Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.
Observation e9973c4a-44f7-4748-8e1d-0a7919fc0ac2 · outbound
This paper cites an unresolved cited work.
Photon drag at the junction between metal and 2d semiconductor Unresolved cited work
Reference 6
- Resolution
- unresolved
- raw_fallback, observed 2026-08-12T15:41:39.537439Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.
Observation 69933a8d-ea0b-4ff9-ba92-794918efdf7d · outbound
This paper cites Such photocurrent is often marked as ’plasmon drag’10, though the underlying electromagnetic forces are the same as in photon drag.
Photon drag at the junction between metal and 2d semiconductor Such photocurrent is often marked as ’plasmon drag’10, though the underlying electromagnetic forces are the same as in photon drag
Reference 7
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T15:41:39.519384Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.
Observation 215efda9-163b-4143-8a35-70e1b11496ae · outbound
This paper cites At this stage, we assume that all angular harmonics of the second-order dc distribution function, except for the zeroth and the first ones, are damped.
Photon drag at the junction between metal and 2d semiconductor At this stage, we assume that all angular harmonics of the second-order dc distribution function, except for the zeroth and the first ones, are damped
Reference 8
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T15:41:39.406648Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.
Observation a40859df-6d4b-4fdd-bf63-7c9405bf3d95 · outbound
This paper cites (27) We observe that ’ordinary’ photon drag differs from the ’junction drag’ by factors of η′ (absorbance factor) and kxLsd (light momentum factor).
Photon drag at the junction between metal and 2d semiconductor (27) We observe that ’ordinary’ photon drag differs from the ’junction drag’ by factors of η′ (absorbance factor) and kxLsd (light momentum factor)
Reference 11
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T15:41:39.169229Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.
Observation a96fc9ca-d2d3-4edb-8eec-a6cf00f7db47 · outbound
This paper cites an unresolved cited work.
Photon drag at the junction between metal and 2d semiconductor Unresolved cited work
Reference 13
- Resolution
- unresolved
- raw_fallback, observed 2026-08-12T15:41:39.382930Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.
Observation e5d0adb2-21d8-490a-be7e-ec6b49977871 · outbound
This paper cites 7 All our consideration was based on assumption that the photovoltage at an individual metal contact (say, source) can be isolated from the photovoltage at the drain.
Photon drag at the junction between metal and 2d semiconductor 7 All our consideration was based on assumption that the photovoltage at an individual metal contact (say, source) can be isolated from the photovoltage at the drain
Reference 14
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T15:41:39.195024Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.
Observation 178002fd-5195-403a-9fba-9c0bd522dbe0 · outbound
This paper cites We attempted to formulate the theory in terms of high- frequency 2d conductivity σω , independent of its micro- scopic nature.
Photon drag at the junction between metal and 2d semiconductor We attempted to formulate the theory in terms of high- frequency 2d conductivity σω , independent of its micro- scopic nature
Reference 16
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T15:41:39.134955Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.
Observation 6c2b63b8-979f-45d8-ba20-4fe719a32e77 · outbound
This paper cites Terahertz ratchet effects in graphene with a lateral superlattice.
Photon drag at the junction between metal and 2d semiconductor Terahertz ratchet effects in graphene with a lateral superlattice
Reference 17
- Resolution
- verified exact
- local_arxiv, observed 2026-08-12T15:41:39.114645Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.
Observation 79f14547-42bd-44e7-9df8-a1cf92c44722 · outbound
This paper cites This results in αx = |Epl|2 |E0|2 { Reη × Qpl − Imη 2 } , (23) where Qpl = Reqp pl/Imqp pl is the quality factor of 2D plas- mons.
Photon drag at the junction between metal and 2d semiconductor This results in αx = |Epl|2 |E0|2 { Reη × Qpl − Imη 2 } , (23) where Qpl = Reqp pl/Imqp pl is the quality factor of 2D plas- mons
Reference 19
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T15:41:39.340128Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.
Observation 76eefdd7-e4a8-4710-9e09-bcac931c5a61 · outbound
This paper cites (25) As the momentum transfer coefficient αx ∼ 1, we observe that the only parameter governing the ratio of PTE and PD photovoltages is ωτε.
Photon drag at the junction between metal and 2d semiconductor (25) As the momentum transfer coefficient αx ∼ 1, we observe that the only parameter governing the ratio of PTE and PD photovoltages is ωτε
Reference 21
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T15:41:39.304539Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.
Observation 5d3ad9fe-f143-4926-9c91-c6e1b1613dc8 · outbound
This paper cites The difference in effective dielectric functions in s- and p- polarizations results in different plasmon dispersion laws.
Photon drag at the junction between metal and 2d semiconductor The difference in effective dielectric functions in s- and p- polarizations results in different plasmon dispersion laws
Reference 33
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T15:41:39.363624Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.
Observation 4342fada-ac87-4b57-9490-608b58767cda · outbound
This paper cites In the far infrared range ( λ0 = 10 µm), we estimate ωτε ≫ 1 even for the shortest energy relaxation time τε = 0.1 ps.
Photon drag at the junction between metal and 2d semiconductor In the far infrared range ( λ0 = 10 µm), we estimate ωτε ≫ 1 even for the shortest energy relaxation time τε = 0.1 ps
Reference 42
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T15:41:39.280996Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.
Observation dcebf262-8300-4b55-bd5f-a3e593e78285 · outbound
This paper cites Relative polarity of carriers in the screening layer and in the 2DES bulk affects the photo- electric effects.
Photon drag at the junction between metal and 2d semiconductor Relative polarity of carriers in the screening layer and in the 2DES bulk affects the photo- electric effects
Reference 43
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T15:41:39.240280Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.
Observation 419cb681-c2d9-4112-950f-f26152aee2d0 · outbound
This paper cites an unresolved cited work.
Photon drag at the junction between metal and 2d semiconductor Unresolved cited work
Reference 44
- Resolution
- unresolved
- raw_fallback, observed 2026-08-12T15:41:39.216734Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.
Pith citing papers
No inbound Pith citation observations are available.