Pith. sign in

Paper Citation Record · LEDGER

Photon drag at the junction between metal and 2d semiconductor

As of 14 August 2026, this Paper Citation Record lists 17 of 17 outbound references and 0 inbound Pith citation observations for arXiv:2411.14075.

A citation records a reference. It does not transfer a finding from one paper to another.

pith.paper-citation-record.v1
2411.14075 v1

Coverage vector

measured 17 of 17 reference resolution

Typed states for the displayed outbound observations.

Source: paper_references, paper_reference_links, observed 2026-08-12T15:41:39.047148Z

measured 17 of 17 standing notices

One-hop event checks from named stored sources.

Source: scholarly_work_events, retraction_status_cache, observed 2026-08-13T06:32:02.005865+00:00

measured 0 of 0 inbound itemization

Pith citing papers itemized under the disclosed page cap.

Source: paper_references, paper_reference_links

measured 0 of 1 external citation measurements

A source-named dated measurement, never combined with another source.

Source: cited_works

Reference resolution

17 of 17 outbound references displayed

  • verified exact1
  • verified fuzzy13
  • unresolved3
  • parse uncertain0
  • malformed identifier0
  • metadata mismatch0

External citation measurements

No source-named external measurement is stored.

Outbound references

Observation 1f6fee18-04fc-476c-ae6b-a02aaa89c5f7 · outbound

This paper cites 1 (A)], electromagnetic diffraction gives rise to the local z-component of electric field.

Photon drag at the junction between metal and 2d semiconductor 1 (A)], electromagnetic diffraction gives rise to the local z-component of electric field

Reference 1

Resolution
verified fuzzy
raw_fallback, observed 2026-08-12T15:41:39.499128Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.

source=pdf_text observed=2026-08-12T15:41:38.909361Z digest=sha256:18e873985c6e0a56eaba4768c72f82ee6df561b26731921dfdbdc549343a9b15

Observation 861ab0e0-ef67-41dc-9c3c-a0c24698d401 · outbound

This paper cites We consider the most practical case of monochromatic waves, E(t) = Eω e−iωt + h .c., and similarly for other time-dependent quantities.

Photon drag at the junction between metal and 2d semiconductor We consider the most practical case of monochromatic waves, E(t) = Eω e−iωt + h .c., and similarly for other time-dependent quantities

Reference 4

Resolution
verified fuzzy
raw_fallback, observed 2026-08-12T15:41:39.459324Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.

source=pdf_text observed=2026-08-12T15:41:38.925060Z digest=sha256:f0d1bf267ad943eba48163228a6c039e526524f76ed1b842d37b29aa9cf511ec

Observation 3c44c8c1-a72b-44ea-9b71-a3771773584f · outbound

This paper cites (3) The superscript ‖ implies taking only the x and y com- ponents of the respective vector, it stems from the two- dimensional character of the current density.

Photon drag at the junction between metal and 2d semiconductor (3) The superscript ‖ implies taking only the x and y com- ponents of the respective vector, it stems from the two- dimensional character of the current density

Reference 5

Resolution
verified fuzzy
raw_fallback, observed 2026-08-12T15:41:39.433635Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.

source=pdf_text observed=2026-08-12T15:41:38.933617Z digest=sha256:1d8454f91fa7cf5ac65ee9b5aa3f267d6ba0345c86d84a2b2a9d4186b5cef2d3

Observation e9973c4a-44f7-4748-8e1d-0a7919fc0ac2 · outbound

This paper cites an unresolved cited work.

Photon drag at the junction between metal and 2d semiconductor Unresolved cited work

Reference 6

Resolution
unresolved
raw_fallback, observed 2026-08-12T15:41:39.537439Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.

source=pdf_text observed=2026-08-12T15:41:38.892880Z digest=sha256:3864dc7c1be7df2a0741d53c300ef5750a64d3c668b4fc061dd29cdb7f12752a

Observation 69933a8d-ea0b-4ff9-ba92-794918efdf7d · outbound

This paper cites Such photocurrent is often marked as ’plasmon drag’10, though the underlying electromagnetic forces are the same as in photon drag.

Photon drag at the junction between metal and 2d semiconductor Such photocurrent is often marked as ’plasmon drag’10, though the underlying electromagnetic forces are the same as in photon drag

Reference 7

Resolution
verified fuzzy
raw_fallback, observed 2026-08-12T15:41:39.519384Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.

source=pdf_text observed=2026-08-12T15:41:38.899797Z digest=sha256:98e9dc34c50d88b1879152d475d1c915e74642dc7309f61be910af5dbd0aeb3f

Observation 215efda9-163b-4143-8a35-70e1b11496ae · outbound

This paper cites At this stage, we assume that all angular harmonics of the second-order dc distribution function, except for the zeroth and the first ones, are damped.

Photon drag at the junction between metal and 2d semiconductor At this stage, we assume that all angular harmonics of the second-order dc distribution function, except for the zeroth and the first ones, are damped

Reference 8

Resolution
verified fuzzy
raw_fallback, observed 2026-08-12T15:41:39.406648Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.

source=pdf_text observed=2026-08-12T15:41:38.947311Z digest=sha256:a583693aa0981f39e89125a94a208a56469f22a46e6ee1a7b1be72d4df43204a

Observation a40859df-6d4b-4fdd-bf63-7c9405bf3d95 · outbound

This paper cites (27) We observe that ’ordinary’ photon drag differs from the ’junction drag’ by factors of η′ (absorbance factor) and kxLsd (light momentum factor).

Photon drag at the junction between metal and 2d semiconductor (27) We observe that ’ordinary’ photon drag differs from the ’junction drag’ by factors of η′ (absorbance factor) and kxLsd (light momentum factor)

Reference 11

Resolution
verified fuzzy
raw_fallback, observed 2026-08-12T15:41:39.169229Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.

source=pdf_text observed=2026-08-12T15:41:39.028268Z digest=sha256:8aae156e0f9fac7e7e981ced0a1eff141bd41fc06750a4e7b16eb870f510666e

Observation a96fc9ca-d2d3-4edb-8eec-a6cf00f7db47 · outbound

This paper cites an unresolved cited work.

Photon drag at the junction between metal and 2d semiconductor Unresolved cited work

Reference 13

Resolution
unresolved
raw_fallback, observed 2026-08-12T15:41:39.382930Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.

source=pdf_text observed=2026-08-12T15:41:38.955482Z digest=sha256:cc036511be7fa7ecfec6aad8a9e42e49b878313db28dcca73a634186a24cb0f2

Observation e5d0adb2-21d8-490a-be7e-ec6b49977871 · outbound

This paper cites 7 All our consideration was based on assumption that the photovoltage at an individual metal contact (say, source) can be isolated from the photovoltage at the drain.

Photon drag at the junction between metal and 2d semiconductor 7 All our consideration was based on assumption that the photovoltage at an individual metal contact (say, source) can be isolated from the photovoltage at the drain

Reference 14

Resolution
verified fuzzy
raw_fallback, observed 2026-08-12T15:41:39.195024Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.

source=pdf_text observed=2026-08-12T15:41:39.018176Z digest=sha256:9af77b624b17a9fa76e90117c1230b8c4025bc27903c5471ea96fcd84cb3e6b0

Observation 178002fd-5195-403a-9fba-9c0bd522dbe0 · outbound

This paper cites We attempted to formulate the theory in terms of high- frequency 2d conductivity σω , independent of its micro- scopic nature.

Photon drag at the junction between metal and 2d semiconductor We attempted to formulate the theory in terms of high- frequency 2d conductivity σω , independent of its micro- scopic nature

Reference 16

Resolution
verified fuzzy
raw_fallback, observed 2026-08-12T15:41:39.134955Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.

source=pdf_text observed=2026-08-12T15:41:39.034391Z digest=sha256:07b6e94733f72512f1756ea46d635117e9252d5618a95d06143b615f764b037f

Observation 6c2b63b8-979f-45d8-ba20-4fe719a32e77 · outbound

This paper cites Terahertz ratchet effects in graphene with a lateral superlattice.

Photon drag at the junction between metal and 2d semiconductor Terahertz ratchet effects in graphene with a lateral superlattice

Reference 17

Resolution
verified exact
local_arxiv, observed 2026-08-12T15:41:39.114645Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.

source=pdf_text observed=2026-08-12T15:41:39.047148Z digest=sha256:96a9cd6d702668d6b115f22a3f7eb34c4642eff877b0e0831266c3ea5756db4d

Observation 79f14547-42bd-44e7-9df8-a1cf92c44722 · outbound

This paper cites This results in αx = |Epl|2 |E0|2 { Reη × Qpl − Imη 2 } , (23) where Qpl = Reqp pl/Imqp pl is the quality factor of 2D plas- mons.

Photon drag at the junction between metal and 2d semiconductor This results in αx = |Epl|2 |E0|2 { Reη × Qpl − Imη 2 } , (23) where Qpl = Reqp pl/Imqp pl is the quality factor of 2D plas- mons

Reference 19

Resolution
verified fuzzy
raw_fallback, observed 2026-08-12T15:41:39.340128Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.

source=pdf_text observed=2026-08-12T15:41:38.973175Z digest=sha256:722aa5d9621baeadc5ea3aa01d8047beae9da335881fc01c9ed52c39683a36da

Observation 76eefdd7-e4a8-4710-9e09-bcac931c5a61 · outbound

This paper cites (25) As the momentum transfer coefficient αx ∼ 1, we observe that the only parameter governing the ratio of PTE and PD photovoltages is ωτε.

Photon drag at the junction between metal and 2d semiconductor (25) As the momentum transfer coefficient αx ∼ 1, we observe that the only parameter governing the ratio of PTE and PD photovoltages is ωτε

Reference 21

Resolution
verified fuzzy
raw_fallback, observed 2026-08-12T15:41:39.304539Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.

source=pdf_text observed=2026-08-12T15:41:38.985212Z digest=sha256:41256b002555840a6d4d7e599581e9f752bf78b866413c4c5031405601029d11

Observation 5d3ad9fe-f143-4926-9c91-c6e1b1613dc8 · outbound

This paper cites The difference in effective dielectric functions in s- and p- polarizations results in different plasmon dispersion laws.

Photon drag at the junction between metal and 2d semiconductor The difference in effective dielectric functions in s- and p- polarizations results in different plasmon dispersion laws

Reference 33

Resolution
verified fuzzy
raw_fallback, observed 2026-08-12T15:41:39.363624Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.

source=pdf_text observed=2026-08-12T15:41:38.966254Z digest=sha256:dddb0b5a73f4b90758b65c028580bf845669727c05a3919c46d440b97b1c5e24

Observation 4342fada-ac87-4b57-9490-608b58767cda · outbound

This paper cites In the far infrared range ( λ0 = 10 µm), we estimate ωτε ≫ 1 even for the shortest energy relaxation time τε = 0.1 ps.

Photon drag at the junction between metal and 2d semiconductor In the far infrared range ( λ0 = 10 µm), we estimate ωτε ≫ 1 even for the shortest energy relaxation time τε = 0.1 ps

Reference 42

Resolution
verified fuzzy
raw_fallback, observed 2026-08-12T15:41:39.280996Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.

source=pdf_text observed=2026-08-12T15:41:39.000026Z digest=sha256:54a8264b20b1e1a25bc6a099d1c3a11dbc4e4634ce4456f5882875d6f943a0a8

Observation dcebf262-8300-4b55-bd5f-a3e593e78285 · outbound

This paper cites Relative polarity of carriers in the screening layer and in the 2DES bulk affects the photo- electric effects.

Photon drag at the junction between metal and 2d semiconductor Relative polarity of carriers in the screening layer and in the 2DES bulk affects the photo- electric effects

Reference 43

Resolution
verified fuzzy
raw_fallback, observed 2026-08-12T15:41:39.240280Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.

source=pdf_text observed=2026-08-12T15:41:39.006086Z digest=sha256:e7fd8fcbf7004c89fa70c3bab543e46e8164462d7d2057ac0ce63bd9089b03d2

Observation 419cb681-c2d9-4112-950f-f26152aee2d0 · outbound

This paper cites an unresolved cited work.

Photon drag at the junction between metal and 2d semiconductor Unresolved cited work

Reference 44

Resolution
unresolved
raw_fallback, observed 2026-08-12T15:41:39.216734Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.

source=pdf_text observed=2026-08-12T15:41:39.011993Z digest=sha256:5eb700d44fcf17b57639a6a3daceff2f7c90a12e8fe3b47dc655b6ed262f5882

Pith citing papers

No inbound Pith citation observations are available.