Nanoscale Texture and Microstructure in NdFeAs(O,F)/IBAD-MgO Superconducting Thin Film with Superior Critical Current Properties

This paper reports the nanoscale texture and microstructure of a high-performance NdFeAs(O,F) superconducting thin film grown by molecular beam epitaxy on a textured MgO/Y$_2$O$_3$/Hastelloy substrate. The NdFeAs(O,F) film forms a highly textured columnar grain structure by epitaxial growth on the MgO template. Although the film contains stacking faults along the $ab$-plane as well as grain boundaries perpendicular to the $ab$-plane, good superconducting properties are measured: a critical temperature, $T _{\rm c}$, of 46 K and a self-field critical current density, $J_{\rm c}$, of $2 \times 10^6 \,{\rm A/cm^2}$ at 4.2 K. Automated crystal orientation mapping by scanning precession electron diffraction in transmission electron microscopy is employed to analyze the misorientation angles between adjacent grains in a large ensemble (247 grains). 99% of the grain boundaries show in-plane misorientation angles ($\Delta \gamma$) less than the critical angle $\theta_{\rm c}$, which satisfies one of the necessary conditions for the high $J_{\rm c}$. Comparing the columnar grain size distribution with the mean distance of the flux line lattice, the triple junctions of low-angle grain boundaries are found to be effective pinning centers, even at high temperatures ($\ge$35 K) and/or low magnetic fields.