Full spatial characterization of entangled structured photons

Vector beams (VBs) are fully polarized beams with spatially varying polarization distributions, and they have found widespread use in numerous applications such as microscopy, metrology, optical trapping, nano-photonics, and communications. The entanglement of such beams has attracted significant interest, and it has been shown to have tremendous potential in expanding existing applications and enabling new ones. However, due to the complex spatially varying polarization structure of entangled VBs (EVBs), a complete entanglement characterization of these beams remains challenging and time-consuming. Here, we have used a time-tagging event camera to demonstrate the ability to simultaneously characterize approximately $2.6\times10^6$ modes between a bi-partite EVB using only 16 measurements. This achievement is an important milestone in high-dimensional entanglement characterization of structured light, and it could significantly impact the implementation of related quantum technologies. The potential applications of this technique are extensive, and it could pave the way for advancements in quantum communication, quantum imaging, and other areas where structured entangled photons play a crucial role.