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Paper Citation Record · LEDGER

Quantum Transport in Semiconductor Nanostructures

As of 21 August 2026, this Paper Citation Record lists 0 of 0 outbound references and 3 inbound Pith citation observations for arXiv:cond-mat/0412664.

A citation records a reference. It does not transfer a finding from one paper to another.

pith.paper-citation-record.v1
cond-mat/0412664 v1

Coverage vector

measured 0 of 0 reference resolution

Typed states for the displayed outbound observations.

Source: paper_references, paper_reference_links

measured 3 of 3 standing notices

One-hop event checks from named stored sources.

Source: scholarly_work_events, retraction_status_cache, observed 2026-08-21T06:32:19.484+00:00

measured 3 of 3 inbound itemization

Pith citing papers itemized under the disclosed page cap.

Source: paper_references, paper_reference_links, observed 2026-06-30T23:57:18.442852Z

measured 0 of 1 external citation measurements

A source-named dated measurement, never combined with another source.

Source: pith, observed 2026-07-01T00:55:12.209746Z

Reference resolution

0 of 0 outbound references displayed

  • verified exact0
  • verified fuzzy0
  • unresolved0
  • parse uncertain0
  • malformed identifier0
  • metadata mismatch0

External citation measurements

No source-named external measurement is stored.

Outbound references

No outbound reference observations are available for this paper version.

Pith citing papers

Observation 6b4fecfd-e32c-4a39-b274-3edeb763ded4 · inbound

Characterizing electronic scattering rates with transport in multiterminal devices cites this paper.

Characterizing electronic scattering rates with transport in multiterminal devices Quantum Transport in Semiconductor Nanostructures

Reference 18

Resolution
verified exact
arxiv_id, observed 2026-05-11T17:26:07.210350Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.

source=pdf_text observed=2026-05-08T17:33:36.343264Z digest=sha256:1801547f07ae104efa6b987349181cd4f863f50286de6a3ad3749f8eb94a60d6

Observation e0927c42-e07a-4746-8fc9-32761504be93 · inbound

Characterizing electronic scattering rates with transport in multiterminal devices cites this paper.

Characterizing electronic scattering rates with transport in multiterminal devices Quantum Transport in Semiconductor Nanostructures

Reference 18

Resolution
verified exact
local_arxiv, observed 2026-05-14T21:43:00.124304Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.

source=pdf_text observed=2026-05-14T21:42:50.363187Z digest=sha256:76e0d8156d26a48fbffe7cbf5d6628d8a0ebf29788be34bf9ca8075cbf31149a

Observation 94e079cf-4b1c-40fe-87e0-b039db521604 · inbound

Characterizing electronic scattering rates with transport in multiterminal devices cites this paper.

Characterizing electronic scattering rates with transport in multiterminal devices Quantum Transport in Semiconductor Nanostructures

Reference 18

Resolution
verified exact
local_arxiv, observed 2026-07-01T00:55:12.211003Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.

source=pdf_text observed=2026-06-30T23:57:18.442852Z digest=sha256:d6f761371ee3a6c4e024a7507707ea048f5bc7198168dc240f65f7926e1283c2