Absence of magnetic-proximity effect at the interface of Bi$_2$Se$_3$ and (Bi,Sb)$_2$Te$_3$ with EuS

A. I. Figueroa; A. Mugarza; F. Bonell; G. van der Laan; M. G. Cuxart; M. Valvidares; P. Gargiani; S. O. Valenzuela

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Absence of magnetic-proximity effect at the interface of Bi$_2$Se$_3$ and (Bi,Sb)$_2$Te$_3$ with EuS

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arxiv 2011.13323 v1 pith:DS2JCVDY submitted 2020-11-26 cond-mat.mes-hall

A. I. Figueroa , F. Bonell , M. G. Cuxart , M. Valvidares , P. Gargiani , G. van der Laan , A. Mugarza , S. O. Valenzuela This is my paper · ORCID

classification cond-mat.mes-hall

keywords magneticinterfacemeasurementsxmcdinducedabsenceallowanalysis

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abstract

We performed x-ray magnetic circular dichroism (XMCD) measurements on heterostructures comprising topological insulators (TIs) of the (Bi,Sb)$_2$(Se,Te)$_3$ family and the magnetic insulator EuS. XMCD measurements allow us to investigate element-selective magnetic proximity effects at the very TI/EuS interface. A systematic analysis reveals that there is neither significant induced magnetism within the TI nor an enhancement of the Eu magnetic moment at such interface. The induced magnetic moments in Bi, Sb, Te, and Se sites are lower than the estimated detection limit of the XMCD measurements of $\sim\!10^{-3}$ $\mu_\mathrm{B}$/at.

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