Impurity-assisted tunneling magnetoresistance under weak magnetic field

Injection of spins into semiconductors is essential for the integration of the spin functionality into conventional electronics. Insulating layers are often inserted between ferromagnetic metals and semiconductors for obtaining an efficient spin injection, and it is therefore crucial to distinguish between signatures of electrical spin injection and impurity-driven effects in the tunnel barrier. Here we demonstrate an impurity-assisted tunneling magnetoresistance effect in nonmagnetic-insulator-nonmagnetic and ferromagnetic-insulator-nonmagnetic tunnel barriers. In both cases, the effect reflects on/off switching of the tunneling current through impurity channels by the external magnetic field. The reported effect, which is universal for any impurity-assisted tunneling process, finally clarifies the controversy of a widely used technique that employs the same ferromagnetic electrode to inject and detect spin accumulation.