pith. sign in

arxiv: 2509.07288 · v1 · pith:GVE2QJLOnew · submitted 2025-09-08 · 🪐 quant-ph

Compressing Syndrome Measurement Sequences

classification 🪐 quant-ph
keywords measurementscodestabilizerdistancegeneratorsmeasurementnumberschedules
0
0 comments X
read the original abstract

In this work, we analyze a framework for constructing fault-tolerant measurement schedules of varying lengths by combining stabilizer generators, and prove results about the distance of such schedules by combining according to classical codes. Using this framework, we produce explicit measurement schedules sufficient for fault-tolerant error correction of quantum codes of distance $d$ with $r$ independent stabilizer generators using only $O(d \log{r})$ measurements if the code is LDPC, and $O(d \log d \log r)$ measurements if the code is produced via concatenating a smaller code with itself $O(\log d)$ times. In both of these cases the number of measurements can be asymptotically fewer than the number of stabilizer generators which define the code. Although optimizing our construction to use the fewest measurements produces high-weight stabilizers, we also show that we can reduce the number of measurements used for specific examples while maintaining low-weight stabilizer measurements. We numerically examine the performance of our construction on the surface code under several noise models and demonstrate the exponential error suppression with increasing distance which is characteristic of weak fault tolerance.

This paper has not been read by Pith yet.

discussion (0)

Sign in with ORCID, Apple, or X to comment. Anyone can read and Pith papers without signing in.

Forward citations

Cited by 1 Pith paper

Reviewed papers in the Pith corpus that reference this work. Sorted by Pith novelty score.

  1. When to Skip Syndrome Extraction in Surface-GKP Codes

    quant-ph 2026-06 unverdicted novelty 6.0

    Adaptive skipping of surface-code stabilizer measurements in surface-GKP codes, guided by GKP analog data, reduces measurement count while preserving or improving logical error rates in circuit-level simulations under...