Pith sign in

REVIEW

Not yet reviewed by Pith; the record is open.

This paper has not been read by Pith yet. Machine review is queued; the pith claim, tier, and objections will appear here once it completes.

SPECIMEN: schema-true, not a live event

T0 review · schema-true

One-sentence machine reading of the paper's core claim.

pith:XXXXXXXX · record.json · timestamp

arxiv physics/0606096 v2 pith:GVWORCK6 submitted 2006-06-11 physics.optics

Negative refraction and sub-wavelength imaging using transparent metal-dielectric stacks

classification physics.optics
keywords negativerefractionmaterialsstructuresindexknownsuperresolutionthey
verification ladder T0 review T1 audit T2 compute T3 formal T4 reserved
0 comments
read the original abstract

Negative refraction is known to occur in materials that simultaneously possess a negative electric permittivity and magnetic permeability; hence they are termed negative index materials. However, there are no known natural materials that exhibit a negative index of refraction. In large part, interest in these materials is due to speculation that they could be used as perfect lenses with superresolution. We propose a new way of achieving negative refraction with currently available technology, based on transparent, metallo-dielectric multilayer structures. The advantage of these structures is that both tunability and transmission (well above 50%) can be achieved in the visible wavelength regime. We demonstrate both negative refraction and superresolution in these structures. Our findings point to a simpler way to fabricate a material that exhibits negative refraction. This opens up an entirely new path not only for negative refraction, but also to expand the exploration of wave propagation effects in metals.

discussion (0)

Sign in with ORCID, Apple, or X to comment. Anyone can read and Pith papers without signing in.