Typed states for the displayed outbound observations.
Source: paper_references, paper_reference_links
Paper Citation Record · LEDGER
A Comprehensive Survey on Machine Learning Driven Material Defect Detection
As of 23 August 2026, this Paper Citation Record lists 0 of 0 outbound references and 3 inbound Pith citation observations for arXiv:2406.07880.
A citation records a reference. It does not transfer a finding from one paper to another.
Coverage vector
One-hop event checks from named stored sources.
Source: scholarly_work_events, retraction_status_cache, observed 2026-08-23T06:30:58.430688+00:00
Pith citing papers itemized under the disclosed page cap.
Source: paper_references, paper_reference_links, observed 2026-08-15T18:07:57.499127Z
A source-named dated measurement, never combined with another source.
Source: arxiv_reference, observed 2026-05-17T00:21:23.691088Z
Reference resolution
0 of 0 outbound references displayed
- verified exact0
- verified fuzzy0
- unresolved0
- parse uncertain0
- malformed identifier0
- metadata mismatch0
External citation measurements
No source-named external measurement is stored.
Outbound references
No outbound reference observations are available for this paper version.
Pith citing papers
Observation 7a73e6dc-6ec3-45e8-9923-65d03388080f · inbound
Anomaly Detection for Industrial Applications, Its Challenges, Solutions, and Future Directions: A Review cites this paper.
Anomaly Detection for Industrial Applications, Its Challenges, Solutions, and Future Directions: A Review A Comprehensive Survey on Machine Learning Driven Material Defect Detection
Reference 2024
- Resolution
- unresolved
- no resolver link, observed 2026-08-10T18:27:38.945598Z
Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation a7dff37b-a814-48a9-abae-f585b1edf44f · inbound
Legal Document Summarization: Enhancing Judicial Efficiency through Automation Detection cites this paper.
Legal Document Summarization: Enhancing Judicial Efficiency through Automation Detection A Comprehensive Survey on Machine Learning Driven Material Defect Detection
Reference 43
- Resolution
- unresolved
- no resolver link, observed 2026-08-15T18:07:57.499127Z
Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 7049008b-f9e1-4782-bbc7-2ef1512f85ed · inbound
Automated Annotation of Shearographic Measurements Enabling Weakly Supervised Defect Detection cites this paper.
Automated Annotation of Shearographic Measurements Enabling Weakly Supervised Defect Detection A Comprehensive Survey on Machine Learning Driven Material Defect Detection
Reference 3
- Resolution
- verified exact
- arxiv_id, observed 2026-05-17T00:21:23.693211Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.