X-ray diffraction analysis to support phase identification in FeSe and Fe$_7$Se$_8$ epitaxial thin films

Renato P. Camata; Sumner B. Harris

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X-ray diffraction analysis to support phase identification in FeSe and Fe$_7$Se$_8$ epitaxial thin films

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arxiv 1901.09794 v1 pith:MHX32FSK submitted 2019-01-28 cond-mat.mtrl-sci

Sumner B. Harris , Renato P. Camata This is my paper · ORCID

classification cond-mat.mtrl-sci

keywords fesebetadataepitaxialfilmsorientationsphaseanalysis

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abstract

X-ray diffraction (XRD) data and analysis for epitaxial iron selenide thin films grown by pulsed laser deposition (PLD) are presented. The films contain ${\beta}$-FeSe and Fe$_7$Se$_8$ phases in a double epitaxy configuration with the ${\beta}$-FeSe phase (001) oriented on the (001) MgO growth substrate. Fe$_7$Se$_8$ simultaneously takes on two different epitaxial orientations in certain growth conditions, exhibiting both (101)- and (001)- orientations. Each of these orientations are verified with the presented XRD data. Additionally, XRD data used to determine the PLD target composition as well as mosaic structure of the ${\beta}$-FeSe phase are shown.

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