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Conformal dispersion relations for defects and boundaries
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abstract
We derive a dispersion relation for two-point correlation functions in defect conformal field theories. The correlator is expressed as an integral over a (single) discontinuity that is controlled by the bulk channel operator product expansion (OPE). This very simple relation is particularly useful in perturbative settings where the discontinuity is determined by a subset of bulk operators. In particular, we apply it to holographic correlators of two chiral primary operators in $\mathcal{N}= 4$ Super Yang-Mills theory in the presence of a supersymmetric Wilson line. With a very simple computation, we are able to reproduce and extend existing results. We also propose a second relation, which reconstructs the correlator from a double discontinuity, and is controlled by the defect channel OPE. Finally, for the case of codimension-one defects (boundaries and interfaces) we derive a dispersion relation which receives contributions from both OPE channels and we apply it to the boundary correlator in the $O(N)$ critical model. We reproduce the order $\epsilon^2$ result in the $\epsilon$-expansion using as input a finite number of boundary CFT data.
Forward citations
Cited by 4 Pith papers
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Transdimensional Defects
Defects of continuously adjustable dimension p=2+δ are defined and analyzed in the O(N) model, yielding new interfaces and non-local 3d CFTs.
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The analytic bootstrap at finite temperature
Universal dispersion-based formulae for thermal two-point functions of scalars that satisfy bootstrap axioms except clustering at infinite distance.
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Surprises in the Ordinary: $O(N)$ Invariant Surface Defect in the $\epsilon$-expansion
The authors compute defect CFT data to third order in the epsilon expansion and discover approximate 'shadow' relations between surface and bulk scaling dimensions.
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Chiral algebra correlators of the $6$d, $\mathcal{N}=(2,0)$ theory with a defect
A chiral-algebra bootstrap reproduces the defect two-point correlators of the 6d (2,0) theory using only bulk-channel data and predicts new defect-channel OPE coefficients.
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