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arxiv: 1010.2059 · v1 · pith:RP2R5FRUnew · submitted 2010-10-11 · 🧮 math-ph · math.MP· physics.optics

Interaction of the Electromagnetic p-Waves with Thin Metal Films

classification 🧮 math-ph math.MPphysics.optics
keywords filmsthicknessreflectionthinabsorbtionallowsanalysisanalytical
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For the first time it is shown that for thin metallic films thickness of which not exceed thickness of skin-layer, the problem allows analytical solution for arbitrary boundary value problems. The analysis of dependence of coefficients of transmission, reflection and absorbtion on angle incidence, thickness of films and coefficient of specular reflection is carried out.

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