Verifying entanglement in the Hong-Ou-Mandel dip

The Hong-Ou-Mandel interference dip is caused by an entangled state, a delocalized bi-photon state. We propose a method of detecting this entanglement by utilizing inverse Hong-Ou-Mandel interference, while taking into account vacuum and multi-photon contaminations, phase noise, and other imperfections. The method uses just linear optics and photodetectors, and for single-mode photodetectors we find a lower bound on the amount of entanglement.