Pith. sign in

REVIEW

Realizing a Robust, Reconfigurable Active Quenching Design for Multiple Types of Single-Photon Avalanche Detectors

Not yet reviewed by Pith; the record is open.

This paper has not been read by Pith yet. Machine review is queued; the pith claim, tier, and objections will appear here once it completes.

SPECIMEN: schema-true, not a live event

T0 review · schema-true

One-sentence machine reading of the paper's core claim.

pith:XXXXXXXX · record.json · timestamp

arxiv 2211.11068 v1 pith:T322B4AY submitted 2022-11-20 physics.ins-det

Realizing a Robust, Reconfigurable Active Quenching Design for Multiple Types of Single-Photon Avalanche Detectors

classification physics.ins-det
keywords apdsdesignparametersactiveavalanchechangingcomponentscontrol
verification ladder T0 review T1 audit T2 compute T3 formal T4 reserved
0 comments
Share X Bluesky LinkedIn Reddit HN
read the original abstract

Most active quench circuits used for single-photon avalanche photodetectors (APDs) are designed either with discrete components which lack the flexibility of dynamically changing the control parameters, or with custom ASICs which require a long development time and high cost. As an alternative, we present a reconfigurable and robust hybrid design implemented using a System-on-Chip (SoC), which integrates both an FPGA and a microcontroller. We take advantage of the FPGA's speed and reconfiguration capabilities to vary the quench and reset parameters dynamically over a large range, thus allowing our system to operate a variety of APDs without changing the design. The microcontroller enables the remote adjustment of control parameters and calibration of APDs in the field. The ruggedized design uses components with space heritage, thus making it suitable for space-based applications in the fields of telecommunications and quantum key distribution (QKD). We demonstrate our circuit by operating a commercial APD cooled to -20{\deg}C with a deadtime of 35ns while maintaining the after-pulsing probability at close to 3%. We also showcase its versatility by operating custom-fabricated chip-scale APDs, which paves the way for automated wafer-scale characterization.

discussion (0)

Sign in with ORCID, Apple, or X to comment. Anyone can read and Pith papers without signing in.