REVIEW 1 cited by
Niobium nitride thin films for very low temperature resistive thermometry
Not yet reviewed by Pith; the record is open.
This paper has not been read by Pith yet. Machine review is queued; the pith claim, tier, and objections will appear here once it completes.
SPECIMEN: schema-true, not a live event
T0 review · schema-true
One-sentence machine reading of the paper's core claim.
pith:XXXXXXXX · record.json · timestamp
Signed reviews
read the original abstract
We investigate thin film resistive thermometry based on metal-to-insulator-transition (niobium nitride) materials down to very low temperature. The variation of the NbN thermometer resistance have been calibrated versus temperature and magnetic field. High sensitivity in tempertaure variation detection is demonstrated through efficient temperature coefficient of resistance. The nitrogen content of the niobium nitride thin films can be tuned to adjust the optimal working temperature range. In the present experiment, we show the versatility of the NbN thin film technology through applications in very different low temperature use-cases. We demonstrate that thin film resistive thermometry can be extended to temperatures below 30 mK with low electrical impedance.
Forward citations
Cited by 1 Pith paper
-
Specific Heat Signature of the Berezinskii-Kosterlitz-Thouless Transition in Ultrathin Superconducting Films
Ultrathin lead films below about 9 nm show a broad specific heat peak and no measurable jump at the superconducting transition, reported as the first thermodynamic BKT signature in a 2D superconductor.
Discussion (0). Continue with ORCID to comment.